{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,12]],"date-time":"2025-09-12T18:24:18Z","timestamp":1757701458318,"version":"3.37.3"},"reference-count":15,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2019,11,20]],"date-time":"2019-11-20T00:00:00Z","timestamp":1574208000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2019,11,20]],"date-time":"2019-11-20T00:00:00Z","timestamp":1574208000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Hardw Syst Secur"],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.1007\/s41635-019-00083-9","type":"journal-article","created":{"date-parts":[[2019,11,20]],"date-time":"2019-11-20T19:02:46Z","timestamp":1574276566000},"page":"24-33","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout"],"prefix":"10.1007","volume":"4","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8569-2020","authenticated-orcid":false,"given":"Thilo","family":"Krachenfels","sequence":"first","affiliation":[]},{"given":"Heiko","family":"Lohrke","sequence":"additional","affiliation":[]},{"given":"Jean-Pierre","family":"Seifert","sequence":"additional","affiliation":[]},{"given":"Enrico","family":"Dietz","sequence":"additional","affiliation":[]},{"given":"Sven","family":"Frohmann","sequence":"additional","affiliation":[]},{"given":"Heinz-Wilhelm","family":"H\u00fcbers","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,11,20]]},"reference":[{"key":"83_CR1","doi-asserted-by":"crossref","unstructured":"Nedospasov D, Seifert J P, Helfmeier C, Boit C (2013) Invasive PUF analysis. In: 2013 Workshop on fault diagnosis and tolerance in cryptography (FDTC). IEEE, pp 30\u201338","DOI":"10.1109\/FDTC.2013.19"},{"key":"83_CR2","doi-asserted-by":"crossref","unstructured":"Lohrke H, Tajik S, Krachenfels T, Boit C, Seifert J P (2018) Key Extraction Using Thermal Laser Stimulation. IACR Transactions on Cryptographic Hardware and Embedded Systems, pp 573\u2013595","DOI":"10.46586\/tches.v2018.i3.573-595"},{"key":"83_CR3","doi-asserted-by":"crossref","unstructured":"Kiyan T, Lohrke H, Boit C (2018) Comparative Assessment of Optical Techniques for Semi-Invasive SRAM Data Read-out on an MSP430 Microcontroller. In: ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis. ASM International, pp 266\u2013271","DOI":"10.31399\/asm.cp.istfa2018p0266"},{"key":"83_CR4","unstructured":"Beaudoin F, Desplats R, Perdu P, Lewis D (2001) Implementing Thermal Laser Stimulation in a Failure Analysis Laboratory. In: ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis. ASM International, pp 151\u2013160"},{"key":"83_CR5","doi-asserted-by":"crossref","unstructured":"Boit C, Helfmeier C, Nedospasov D, Fox A (2013) Ultra high precision circuit diagnosis through seebeck generation and charge monitoring. In: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, pp 17\u201321","DOI":"10.1109\/IPFA.2013.6599119"},{"issue":"4","key":"83_CR6","doi-asserted-by":"publisher","first-page":"940","DOI":"10.1103\/PhysRev.98.940","volume":"98","author":"TH Geballe","year":"1955","unstructured":"Geballe T H, Hull G W (1955) Seebeck Effect in Silicon. Phys Rev 98(4):940\u2013947","journal-title":"Phys Rev"},{"key":"83_CR7","unstructured":"ALPhANOV (2019) Optical and Laser System for Fault Injection for IC Evaluation S-LMS: Single Laser Microscope Station. http:\/\/www.alphanov.com\/40-optoelectronics-systems-and-microscopy-single-spot-laser-station.html, accessed 15 Apr 2019"},{"key":"83_CR8","unstructured":"Wilkinson K (2018) Using Encryption and Authentication to Secure an UltraScale\/UltraScale+ FPGA Bitstream. https:\/\/www.xilinx.com\/support\/documentation\/application_notes\/xapp1267-encryp-efuse-program.pdf, accessed 02 Apr 2019"},{"key":"83_CR9","unstructured":"Hamamatsu Photonics KK (2015) NanoLens-SHR. https:\/\/www.hamamatsu.com\/resources\/pdf\/sys\/SSMS0053E_Nanolens-SHR.pdf, accessed 18 Apr 2019"},{"key":"83_CR10","unstructured":"Stanford Research Systems (2014) Low-Noise Current Preamplifier. https:\/\/www.thinksrs.com\/downloads\/pdfs\/catalog\/SR570c.pdf, accessed 02 Apr 2019"},{"key":"83_CR11","unstructured":"National Instruments (2019) NI PCI-6259. http:\/\/sine.ni.com\/nips\/cds\/view\/p\/lang\/en\/nid\/14128, accessed 16 Apr 2019"},{"key":"83_CR12","doi-asserted-by":"crossref","unstructured":"Shen H, Asadizanjani N, Forte D, Tehranipoor M (2018) Nanopyramid: An Optical Scrambler Against Backside Probing Attacks. In: ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis. ASM International","DOI":"10.31399\/asm.cp.istfa2018p0280"},{"key":"83_CR13","doi-asserted-by":"crossref","unstructured":"Das D, Maity S, Nasir SB, Ghosh S, Raychowdhury A, Sen S (2017) High Efficiency Power Side-Channel Attack Immunity Using Noise Injection in Attenuated Signature Domain. In: 2017 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), pp 62\u201367","DOI":"10.1109\/HST.2017.7951799"},{"issue":"4","key":"83_CR14","doi-asserted-by":"publisher","first-page":"345","DOI":"10.1007\/s41635-018-0052-3","volume":"2","author":"E Amini","year":"2018","unstructured":"Amini E, Beyreuther A, Herfurth N, Steigert A, Szyszka B, Boit C (2018) Assessment of a Chip Backside Protection. J Hardw Syst Secur 2(4):345\u2013352","journal-title":"J Hardw Syst Secur"},{"key":"83_CR15","doi-asserted-by":"crossref","unstructured":"Tajik S, Fietkau J, Lohrke H, Seifert JP, Boit C (2017) PUFMon: Security Monitoring of FPGAs Using Physically Unclonable Functions. In: 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, pp 186\u2013191","DOI":"10.1109\/IOLTS.2017.8046216"}],"container-title":["Journal of Hardware and Systems Security"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s41635-019-00083-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s41635-019-00083-9\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s41635-019-00083-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,10,6]],"date-time":"2022-10-06T13:34:28Z","timestamp":1665063268000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s41635-019-00083-9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11,20]]},"references-count":15,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2020,3]]}},"alternative-id":["83"],"URL":"https:\/\/doi.org\/10.1007\/s41635-019-00083-9","relation":{},"ISSN":["2509-3428","2509-3436"],"issn-type":[{"type":"print","value":"2509-3428"},{"type":"electronic","value":"2509-3436"}],"subject":[],"published":{"date-parts":[[2019,11,20]]},"assertion":[{"value":"5 June 2019","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"2 October 2019","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"20 November 2019","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}