{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T01:31:22Z","timestamp":1775698282008,"version":"3.50.1"},"reference-count":226,"publisher":"Wiley","issue":"11","license":[{"start":{"date-parts":[[2020,8,2]],"date-time":"2020-08-02T00:00:00Z","timestamp":1596326400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2016M3D1A1027666"],"award-info":[{"award-number":["2016M3D1A1027666"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2018M3D1A1058793"],"award-info":[{"award-number":["2018M3D1A1058793"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["advanced.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Advanced Intelligent Systems"],"published-print":{"date-parts":[[2020,11]]},"abstract":"<jats:sec><jats:label\/><jats:p>In complementary metal\u2013oxide\u2013semiconductor (CMOS)\u2010based von Neumann architectures, the intrinsic power and speed inefficiencies are worsened by the drastic increase in information with big data. With the potential to store numerous values in <jats:italic>I<\/jats:italic>\u2013<jats:italic>V<\/jats:italic> pinched hysteresis, memristors (memory resistors) have emerged as alternatives to existing CMOS\u2010based computing systems. Herein, four types of memristive devices, namely, resistive switching, phase\u2010change, spintronics, and ferroelectric tunnel junction memristors, are explored. The application of these devices to a crossbar array (CBA), which is a novel concept of integrated architecture, is a step toward the realization of ultradense electronics. Exploiting the fascinating capabilities of memristive devices, computing systems can be developed with novel computing paradigms, in which large amounts of data can be stored and processed within CBAs. Looking further ahead, the ways in which memristors could be incorporated in neuromorphic computing systems along with various artificial intelligence algorithms are established. Finally, perspectives and challenges that memristor technology should address to provide excellent alternatives to existing computing systems are discussed. The infinite potential of memristors is the key to unlock new computing paradigms, which pave the way for next\u2010generation computing systems.<\/jats:p><\/jats:sec>","DOI":"10.1002\/aisy.202000105","type":"journal-article","created":{"date-parts":[[2020,8,3]],"date-time":"2020-08-03T01:45:18Z","timestamp":1596419118000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":99,"title":["Memristive Devices for New Computing Paradigms"],"prefix":"10.1002","volume":"2","author":[{"given":"In Hyuk","family":"Im","sequence":"first","affiliation":[{"name":"Department of Materials Science and Engineering Research Institute of Advanced Materials Seoul National University  Seoul 08826 Republic of Korea"}]},{"given":"Seung Ju","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Engineering Research Institute of Advanced Materials Seoul National University  Seoul 08826 Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6952-7359","authenticated-orcid":false,"given":"Ho Won","family":"Jang","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Engineering Research Institute of Advanced Materials Seoul National University  Seoul 08826 Republic of Korea"}]}],"member":"311","published-online":{"date-parts":[[2020,8,2]]},"reference":[{"key":"e_1_2_9_2_1","first-page":"114","volume":"38","author":"Moore G. M.","year":"1965","journal-title":"Electronics"},{"key":"e_1_2_9_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1974.1050511"},{"key":"e_1_2_9_4_1","unstructured":"IRDS International Roadmap for Devices and Systems (IRDS) 2018 Edition 2018 https:\/\/irds.ieee.org\/editions\/2018."},{"key":"e_1_2_9_5_1","doi-asserted-by":"crossref","unstructured":"A. N.Tanaka M.Kido K.Yahashi M.Oomura R.Katsumata M.Kito Y.Fukuzumi M.Sato Y.Nagata Y.Matsuoka Y.Iwata inIEEE Symp. on VLSI Technology IEEE Kyoto2007 pp.14\u201315.","DOI":"10.1109\/VLSIT.2007.4339708"},{"key":"e_1_2_9_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2013.51"},{"key":"e_1_2_9_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1971.1083337"},{"key":"e_1_2_9_8_1","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/29\/10\/104001"},{"key":"e_1_2_9_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/nphys2566"},{"key":"e_1_2_9_10_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"e_1_2_9_11_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-011-6264-9"},{"key":"e_1_2_9_12_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201600859"},{"key":"e_1_2_9_13_1","unstructured":"K. S.Li C.Ho M. T.Lee M. C.Chen C. L.Hsu J. M.Lu C. H.Lin C. C.Chen B. W.Wu Y. F.Hou C. Y.Lin Y. J.Chen T. Y.Lai M. Y.Li I.Yang C. S.Wu F. L.Yang in2014 Symp. on VLSI Technology Digest of Technical Papers IEEE Honolulu HI2014 pp.1\u20132."},{"key":"e_1_2_9_14_1","doi-asserted-by":"crossref","unstructured":"B.Govoreanu G. S.Kar Y. J. Y.Chen V.Paraschiv S.Kubicek A.Fantini I. P.Radu L.Goux S.Clima R.Degraeve N.Jossart O.Richard T.Vandeweyer K.Seo P.Hendrickx G.Pourtois H.Bender L.Altimime D. J.Wouters J. A.Kittl M.Jurczak in2011 Int. Electron Devices Meeting (IEDM) IEEE Washington DC2011 pp.31.6.1\u201331.6.4.","DOI":"10.1109\/IEDM.2011.6131652"},{"key":"e_1_2_9_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2215121"},{"key":"e_1_2_9_16_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.7b08197"},{"key":"e_1_2_9_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2157075"},{"key":"e_1_2_9_18_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1201938"},{"key":"e_1_2_9_19_1","doi-asserted-by":"crossref","unstructured":"T.Ohyanagi N.Takaura M.Tai M.Kitamura M.Kinoshita K.Akita T.Morikawa S.Kato M.Araidai K.Kamiya T.Yamamoto K.Shiraishi in2013 IEEE Int. Electron Devices Meeting IEEE Washington DC2013 pp.30.5.1\u201330.5.4.","DOI":"10.1109\/IEDM.2013.6724725"},{"key":"e_1_2_9_20_1","doi-asserted-by":"crossref","unstructured":"H. Y.Cheng W. C.Chien M.BrightSky Y. H.Ho Y.Zhu A.Ray R.Bruce W.Kim C. W.Yeh H. L.Lung C.Lam in2015 IEEE Int. Electron Devices Meeting (IEDM) IEEE Washington DC2015 pp.3.5.1\u20133.5.4.","DOI":"10.1109\/IEDM.2015.7409620"},{"key":"e_1_2_9_21_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab0de4"},{"key":"e_1_2_9_22_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2804"},{"key":"e_1_2_9_23_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5079917"},{"key":"e_1_2_9_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2896231"},{"key":"e_1_2_9_25_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4756918"},{"key":"e_1_2_9_26_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4864100"},{"key":"e_1_2_9_27_1","doi-asserted-by":"crossref","unstructured":"Z.Wei Y.Kanzawa K.Arita Y.Katoh K.Kawai S.Muraoka S.Mitani S.Fujii K.Katayama M.Iijima T.Mikawa T.Ninomiya R.Miyanaga Y.Kawashima K.Tsuji A.Himeno T.Okada R.Azuma K.Shimakawa H.Sugaya T.Takagi R.Yasuhara K.Horiba H.Kumigashira M.Oshima in2008 IEEE Int. Electron Devices Meeting IEEE San Francisco CA2008 pp.1\u20134.","DOI":"10.1109\/IEDM.2008.4796676"},{"key":"e_1_2_9_28_1","unstructured":"C.Hsu I.Wang C.Lo M.Chiang W.Jang in2013 Symp. VLSI Technology IEEE Kyoto2013 pp.T166\u2013T167."},{"key":"e_1_2_9_29_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl401283q"},{"key":"e_1_2_9_30_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201400064"},{"key":"e_1_2_9_31_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201501167"},{"key":"e_1_2_9_32_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep28525"},{"key":"e_1_2_9_33_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201705783"},{"key":"e_1_2_9_34_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4893277"},{"key":"e_1_2_9_35_1","doi-asserted-by":"publisher","DOI":"10.1039\/C7NR05582J"},{"key":"e_1_2_9_36_1","first-page":"6562","volume":"30","author":"Choi J.","year":"2018","journal-title":"Adv. Mater."},{"key":"e_1_2_9_37_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.8b15769"},{"key":"e_1_2_9_38_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4862755"},{"key":"e_1_2_9_39_1","doi-asserted-by":"publisher","DOI":"10.1002\/smll.201503827"},{"key":"e_1_2_9_40_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms2784"},{"key":"e_1_2_9_41_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201301940"},{"key":"e_1_2_9_42_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201909092"},{"key":"e_1_2_9_43_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b16173"},{"key":"e_1_2_9_44_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201401304"},{"key":"e_1_2_9_45_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201101210"},{"key":"e_1_2_9_46_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms1737"},{"key":"e_1_2_9_47_1","doi-asserted-by":"publisher","DOI":"10.1021\/nn506735m"},{"key":"e_1_2_9_48_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"e_1_2_9_49_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2021001"},{"key":"e_1_2_9_50_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0069-1"},{"key":"e_1_2_9_51_1","unstructured":"Intel Intel Optane Technology: Memory or Storage? Both 2011 https:\/\/www.intel.com\/content\/www\/us\/en\/products\/docs\/memory-storage\/optane-technology\/what-is-optane-technology-brief.html."},{"key":"e_1_2_9_52_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.21.1450"},{"key":"e_1_2_9_53_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.348620"},{"key":"e_1_2_9_54_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.365627"},{"key":"e_1_2_9_55_1","doi-asserted-by":"crossref","unstructured":"D. S.Chao H. H.Hsu M. J.Chen Y. C.Chen F.Chen C. M.Lee P. H.Yen C. W.Chen W. H.Wang W. S.Chen C.Lien M. J.Kao M. J.Tsai inInt. Symp. VLSI Technology Systems and Applications IEEE Hsinchu2007 pp.1\u20132.","DOI":"10.1109\/VTSA.2007.378935"},{"key":"e_1_2_9_56_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpcs.2007.02.027"},{"key":"e_1_2_9_57_1","first-page":"054501","volume":"110","author":"Padilla A.","year":"2010","journal-title":"Int. Electron Devices Meet."},{"key":"e_1_2_9_58_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2359354"},{"key":"e_1_2_9_59_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4749411"},{"key":"e_1_2_9_60_1","doi-asserted-by":"crossref","unstructured":"A.Fantini L.Perniola M.Armand J. F.Nodin V.Sousa A.Persico J.Cluzel C.Jahan S.Maitrejean S.Lhostis A.Roule C.Dressler G.Reimbold B.DeSalvo P.Mazoyer D.Bensahel F.Boulanger in2009 IEEE Int. Memory Workshop IEEE Monterey CA2009 pp.1\u20132.","DOI":"10.1109\/IMW.2009.5090585"},{"key":"e_1_2_9_61_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2931"},{"key":"e_1_2_9_62_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4804983"},{"key":"e_1_2_9_63_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.3301579"},{"key":"e_1_2_9_64_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3456"},{"key":"e_1_2_9_65_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.823243"},{"key":"e_1_2_9_66_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2934"},{"key":"e_1_2_9_67_1","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/43\/17\/175401"},{"key":"e_1_2_9_68_1","doi-asserted-by":"publisher","DOI":"10.1021\/cr900040x"},{"key":"e_1_2_9_69_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.61.2472"},{"key":"e_1_2_9_70_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.43.1297"},{"key":"e_1_2_9_71_1","doi-asserted-by":"publisher","DOI":"10.1016\/0304-8853(96)00062-5"},{"key":"e_1_2_9_72_1","first-page":"33","volume":"18","author":"Huai Y.","year":"2008","journal-title":"AAPPS Bull."},{"key":"e_1_2_9_73_1","doi-asserted-by":"publisher","DOI":"10.1145\/2463585.2463589"},{"key":"e_1_2_9_74_1","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/46\/13\/139601"},{"key":"e_1_2_9_75_1","doi-asserted-by":"crossref","unstructured":"Y.Kim S. K.Gupta S. P.Park G.Panagopoulos K.Roy Proc. of Int. Symp. on Low Power Electronics and Design (ISLPED'12) ACM\/IEEE New York NY2012 pp.3\u20138.","DOI":"10.1145\/2333660.2333664"},{"key":"e_1_2_9_76_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.85.393"},{"key":"e_1_2_9_77_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1218197"},{"key":"e_1_2_9_78_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2014.8"},{"key":"e_1_2_9_79_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0135-8"},{"key":"e_1_2_9_80_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2822841"},{"key":"e_1_2_9_81_1","doi-asserted-by":"crossref","unstructured":"B.Zeinali J. K.Madsen P.Raghavan F.Moradi in2017 IEEE Int. Conf. on Computer Design (ICCD) IEEE Boston MA2017 pp.463\u2013468.","DOI":"10.1109\/ICCD.2017.81"},{"key":"e_1_2_9_82_1","doi-asserted-by":"publisher","DOI":"10.1109\/TMSCS.2015.2509963"},{"key":"e_1_2_9_83_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.246.4936.1400"},{"key":"e_1_2_9_84_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1126230"},{"key":"e_1_2_9_85_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms5289"},{"key":"e_1_2_9_86_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3415"},{"key":"e_1_2_9_87_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201704729"},{"key":"e_1_2_9_88_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms6414"},{"key":"e_1_2_9_89_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature08128"},{"key":"e_1_2_9_90_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201904123"},{"key":"e_1_2_9_91_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201202170"},{"key":"e_1_2_9_92_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl8037689"},{"key":"e_1_2_9_93_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl073224p"},{"key":"e_1_2_9_94_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2012.10.001"},{"key":"e_1_2_9_95_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.8b12385"},{"key":"e_1_2_9_96_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-018-0302-0"},{"key":"e_1_2_9_97_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/18\/3\/035204"},{"key":"e_1_2_9_98_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"e_1_2_9_99_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl203687n"},{"key":"e_1_2_9_100_1","doi-asserted-by":"crossref","unstructured":"A.Chen in11th IEEE International Conference on Nanotechnology IEEE Portland OR2011 pp.1767\u20131771.","DOI":"10.1109\/NANO.2011.6144367"},{"key":"e_1_2_9_101_1","unstructured":"L.Zhao L.Jiang Y.Zhang N.Xiao J.Yang in18th Int. Symp. on Quality Electronic Design IEEE Santa Clara CA2017 pp.58\u201364."},{"key":"e_1_2_9_102_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2231683"},{"key":"e_1_2_9_103_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2327514"},{"key":"e_1_2_9_104_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.02.002"},{"key":"e_1_2_9_105_1","doi-asserted-by":"publisher","DOI":"10.1039\/C7NR01840A"},{"key":"e_1_2_9_106_1","doi-asserted-by":"publisher","DOI":"10.1002\/advs.201900024"},{"key":"e_1_2_9_107_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201804841"},{"key":"e_1_2_9_108_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2011.12.006"},{"key":"e_1_2_9_109_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201700152"},{"key":"e_1_2_9_110_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2757493"},{"key":"e_1_2_9_111_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2015.08.001"},{"key":"e_1_2_9_112_1","doi-asserted-by":"crossref","unstructured":"L.Zhang S.Cosemans D. J.Wouters G.Groeseneken M.Jurczak B.Govoreanu in2014 IEEE 6th Int. Memory Workshop (IMW) IEEE Taipei2014 pp.1\u20134.","DOI":"10.1109\/IMW.2014.6849358"},{"key":"e_1_2_9_113_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2886552"},{"key":"e_1_2_9_114_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201403675"},{"key":"e_1_2_9_115_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-04529-4"},{"key":"e_1_2_9_116_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4994948"},{"key":"e_1_2_9_117_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2433956"},{"key":"e_1_2_9_118_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/16\/10\/047"},{"key":"e_1_2_9_119_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature08940"},{"key":"e_1_2_9_120_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2966547"},{"key":"e_1_2_9_121_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201403295"},{"key":"e_1_2_9_122_1","first-page":"1","volume":"29","author":"Kim S. G.","year":"2019","journal-title":"Adv. Funct. Mater."},{"key":"e_1_2_9_123_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.aao3212"},{"key":"e_1_2_9_124_1","doi-asserted-by":"crossref","unstructured":"G.Hu D.Kim J.Kim C.Kothandaraman G.Lauer H. K.Lee N.Marchack M.Reuter R. P.Robertazzi J. Z.Sun T.Suwannasiri J. J.Nowak P. L.Trouilloud S.Woo D. C.Worledge M. G.Gottwald S. L.Brown B.Doris C. P.D'Emic P.Hashemi D.Houssameddine Q.He in2019 IEEE Int. Electron Devices Meeting (IEDM) IEEE San Francisco CA2019 pp.2.6.1\u20132.6.4.","DOI":"10.1109\/IEDM19573.2019.8993604"},{"key":"e_1_2_9_125_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4939446"},{"key":"e_1_2_9_126_1","doi-asserted-by":"crossref","unstructured":"J. J.Kan C.Park C.Ching J.Ahn L.Xue R.Wang A.Kontos S.Liang M.Bangar H.Chen S.Hassan S.Kim M.Pakala S. H.Kang in2016 IEEE Int. Electron Devices Meeting (IEDM) IEEE San Francisco CA2016 pp.27.4.1\u201327.4.4.","DOI":"10.1109\/IEDM.2016.7838493"},{"key":"e_1_2_9_127_1","unstructured":"J.Liang R. G. D.Jeyasingh H. Y.Chen H. S. P.Wong in2011 Symposium on VLSI Technology-Digest of Technical Papers IEEE Honolulu HI2011 pp.100\u2013101."},{"key":"e_1_2_9_128_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.028"},{"key":"e_1_2_9_129_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2976148"},{"key":"e_1_2_9_130_1","doi-asserted-by":"crossref","unstructured":"S.Sakhare M.Perumkunnil T. H.Bao S.Rao W.Kim D.Crotti F.Yasin S.Couet J.Swerts S.Kundu D.Yakimets R.Baert H.Oh A.Spessot A.Mocuta G. S.Kar A.Furnemont in2018 IEEE Int. Electron Devices Meeting (IEDM) IEEE San Francisco CA2018 pp.18.3.1\u201318.3.4.","DOI":"10.1109\/IEDM.2018.8614637"},{"key":"e_1_2_9_131_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2280296"},{"key":"e_1_2_9_132_1","doi-asserted-by":"crossref","unstructured":"S. W.Chung T.Kishi J. W.Park M.Yoshikawa K. S.Park T.Nagase K.Sunouchi H.Kanaya G. C.Kim K.Noma M. S.Lee A.Yamamoto K. M.Rho K.Tsuchida S. J.Chung J. Y.Yi H. S.Kim Y. S.Chun H.Oyamatsu S. J.Hong in2016 IEEE Int. Electron Devices Meeting (IEDM) IEEE San Francisco CA2016 pp.27.1.1\u201327.1.4.","DOI":"10.1109\/IEDM.2016.7838490"},{"key":"e_1_2_9_133_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2020.145707"},{"key":"e_1_2_9_134_1","doi-asserted-by":"crossref","unstructured":"I. S.Kim S. L.Cho D. H.Im E. H.Cho D. H.Kim G. H.Oh D. H.Ahn S. O.Park S. W.Nam J. T.Moon C. H.Chung in2010 Symp. on VLSI Technology IEEE Honolulu2010 pp.203\u2013204.","DOI":"10.1109\/VLSIT.2010.5556228"},{"key":"e_1_2_9_135_1","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.201409017"},{"key":"e_1_2_9_136_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6528\/aac6b3"},{"key":"e_1_2_9_137_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2095820"},{"key":"e_1_2_9_138_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1201938"},{"key":"e_1_2_9_139_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2011.213"},{"key":"e_1_2_9_140_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201600680"},{"key":"e_1_2_9_141_1","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/45\/2\/025001"},{"key":"e_1_2_9_142_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-15249-1"},{"key":"e_1_2_9_143_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0002-z"},{"key":"e_1_2_9_144_1","unstructured":"N.Papandreou H.Pozidis A.Pantazi A.Sebastian M.Breitwisch C.Lam E.Eleftheriou in2011 IEEE Int. Symp. of Circuits and Systems (ISCAS) IEEE Rio de Janeiro2011 pp.329\u2013332."},{"key":"e_1_2_9_145_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-03140-z"},{"key":"e_1_2_9_146_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201900131"},{"key":"e_1_2_9_147_1","unstructured":"Y. Y.Liauw Z.Zhang W.Kim A.El Gamal S. S.Wong in2012 IEEE Int. Solid-State Circuits Conf. IEEE2012 pp.406\u2013408."},{"key":"e_1_2_9_148_1","doi-asserted-by":"publisher","DOI":"10.3390\/ma12060875"},{"key":"e_1_2_9_149_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl204039q"},{"key":"e_1_2_9_150_1","doi-asserted-by":"publisher","DOI":"10.1143\/APEX.1.091301"},{"key":"e_1_2_9_151_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2017.2691713"},{"key":"e_1_2_9_152_1","first-page":"427","author":"Gaillardon P.","year":"2016","journal-title":"Des. Autom. Test Eur. Conf. Exhib."},{"key":"e_1_2_9_153_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2011.2158253"},{"key":"e_1_2_9_154_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2013.02.017"},{"key":"e_1_2_9_155_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2014.09.012"},{"key":"e_1_2_9_156_1","first-page":"723","volume-title":"2019 26th IEEE Int. Conf. on Electronics, Circuits and Systems (ICECS)","author":"Ali K. A.","year":"2019"},{"key":"e_1_2_9_157_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2926811"},{"key":"e_1_2_9_158_1","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.201800629"},{"key":"e_1_2_9_159_1","volume-title":"Principia Mathematica","author":"Whitehead A. N.","year":"1910"},{"key":"e_1_2_9_160_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2282132"},{"key":"e_1_2_9_161_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2357292"},{"key":"e_1_2_9_162_1","unstructured":"R. B.Hur N.Wald N.Talati S.Kvatinsky in2017 IEEE\/ACM Int. Conf. on Computer-Aided Design (ICCAD) IEEE Irvine CA2017 pp.225\u2013232."},{"key":"e_1_2_9_163_1","volume-title":"Memristor-Based Nanoelectronic Computing Circuits and Architectures","author":"Vourkas I.","year":"2015"},{"key":"e_1_2_9_164_1","doi-asserted-by":"crossref","unstructured":"S.Kvatinsky A.Kolodny U. C.Weiser E. G.Friedman in2011 IEEE 29th Int. Conf. on Computer Design (ICCD) IEEE Amherst MA2011 pp.142\u2013147.","DOI":"10.1109\/ICCD.2011.6081389"},{"key":"e_1_2_9_165_1","unstructured":"S.Kvatinsky N.Wald G.Satat A.Kolodny U. C.Weiser E. G.Friedman in2012 13th Int. Workshop on Cellular Nanoscale Networks and their Applications IEEE Turin2012 pp.1\u20136."},{"key":"e_1_2_9_166_1","doi-asserted-by":"crossref","unstructured":"K. A.Ali M.Rizk A.Baghdadi J. P.Diguet J.Jomaah in2019 26th IEEE Int. Conf. on Electronics Circuits and Systems (ICECS) IEEE Genoa Italy2019 pp.674\u2013677.","DOI":"10.1109\/ICECS46596.2019.8964702"},{"key":"e_1_2_9_167_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2582523"},{"key":"e_1_2_9_168_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2016.2570248"},{"key":"e_1_2_9_169_1","doi-asserted-by":"publisher","DOI":"10.1109\/85.238389"},{"key":"e_1_2_9_170_1","doi-asserted-by":"publisher","DOI":"10.1007\/BF02478259"},{"key":"e_1_2_9_171_1","doi-asserted-by":"publisher","DOI":"10.1037\/h0042519"},{"key":"e_1_2_9_172_1","volume-title":"Image Processing, Analysis, and Machine Vision","author":"Sonka M.","year":"2014"},{"key":"e_1_2_9_173_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0893-6080(98)00082-3"},{"key":"e_1_2_9_174_1","doi-asserted-by":"publisher","DOI":"10.1109\/TASLP.2017.2756440"},{"key":"e_1_2_9_175_1","doi-asserted-by":"publisher","DOI":"10.1109\/TASL.2011.2109382"},{"key":"e_1_2_9_176_1","doi-asserted-by":"publisher","DOI":"10.1109\/MCI.2018.2840738"},{"key":"e_1_2_9_177_1","unstructured":"Y.Taigman M.Yang M.Ranzato L.Wolf IEEE Conf. Computer Vision and Pattern Recognition IEEE Columbus OH2014 pp.1701\u20131708."},{"key":"e_1_2_9_178_1","volume-title":"Delving Deep into Rectifiers: Surpassing Human-Level Performance on Imagenet Classification","author":"He K.","year":"2015"},{"key":"e_1_2_9_179_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.media.2017.07.005"},{"key":"e_1_2_9_180_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2011.12.066"},{"key":"e_1_2_9_181_1","volume-title":"An Overview of Gradient Descent Optimization Algorithms","author":"Ruder S.","year":"2016"},{"key":"e_1_2_9_182_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-75304-1"},{"key":"e_1_2_9_183_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.201900189"},{"key":"e_1_2_9_184_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201600100"},{"key":"e_1_2_9_185_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5124027"},{"key":"e_1_2_9_186_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl904092h"},{"key":"e_1_2_9_187_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2418342"},{"key":"e_1_2_9_188_1","doi-asserted-by":"publisher","DOI":"10.1039\/c3tc30575a"},{"key":"e_1_2_9_189_1","doi-asserted-by":"publisher","DOI":"10.1039\/C7NR03106H"},{"key":"e_1_2_9_190_1","unstructured":"Institute of Electrical and Electronics Engineers presented at Proc. of 2017 Second IEEE Int. Conf. on Electrical Computer and Communication Technologies IEEE Piscataway NJ2017."},{"key":"e_1_2_9_191_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2899262"},{"key":"e_1_2_9_192_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-019-1677-2"},{"key":"e_1_2_9_193_1","doi-asserted-by":"publisher","DOI":"10.2307\/1418888"},{"key":"e_1_2_9_194_1","doi-asserted-by":"publisher","DOI":"10.1038\/78829"},{"key":"e_1_2_9_195_1","doi-asserted-by":"crossref","unstructured":"M.Suri O.Bichler D.Querlioz O.Cueto L.Perniola V.Sousa D.Vuillaume C.Gamrat B.DeSalvo in2011 International Electron Devices Meeting IEEE2011 p.4.","DOI":"10.1109\/IEDM.2011.6131488"},{"key":"e_1_2_9_196_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep04906"},{"key":"e_1_2_9_197_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl201040y"},{"key":"e_1_2_9_198_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201704455"},{"key":"e_1_2_9_199_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.5b00697"},{"key":"e_1_2_9_200_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep29545"},{"key":"e_1_2_9_201_1","first-page":"878","volume":"13","author":"Nau J. Y.","year":"2017","journal-title":"Rev. Med. Suisse"},{"key":"e_1_2_9_202_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201806037"},{"key":"e_1_2_9_203_1","doi-asserted-by":"publisher","DOI":"10.1039\/C8NR04734K"},{"key":"e_1_2_9_204_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2304638"},{"key":"e_1_2_9_205_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2313565"},{"key":"e_1_2_9_206_1","doi-asserted-by":"crossref","unstructured":"P.Merolla J.Arthur F.Akopyan N.Imam R.Manohar D. S.Modha in2011 IEEE Custom Integrated Circuits Conf. (CICC) IEEE San Jose CA2011 pp.1\u20134.","DOI":"10.1109\/CICC.2011.6055294"},{"key":"e_1_2_9_207_1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2018.112130359"},{"key":"e_1_2_9_208_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-019-1424-8"},{"key":"e_1_2_9_209_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-04484-2"},{"key":"e_1_2_9_210_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms15199"},{"key":"e_1_2_9_211_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0270-x"},{"key":"e_1_2_9_212_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-018-0180-5"},{"key":"e_1_2_9_213_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.7b00552"},{"key":"e_1_2_9_214_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.8b01526"},{"key":"e_1_2_9_215_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0023-2"},{"key":"e_1_2_9_216_1","doi-asserted-by":"crossref","unstructured":"R.Berdan T.Marukame S.Kabuyanagi K.Ota M.Saitoh S.Fujii J.Deguchi Y.Nishi in2019 Symp. on VLSI Technology IEEE Kyoto Japan2019 pp.T22\u2013T23.","DOI":"10.23919\/VLSIT.2019.8776500"},{"key":"e_1_2_9_217_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0221-6"},{"key":"e_1_2_9_218_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201705914"},{"key":"e_1_2_9_219_1","volume-title":"The Digitization of the World \u2013 From Edge to Core","author":"Reinsel D.","year":"2018"},{"key":"e_1_2_9_220_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mattod.2017.07.007"},{"key":"e_1_2_9_221_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0131-z"},{"key":"e_1_2_9_222_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.120.268103"},{"key":"e_1_2_9_223_1","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-018-0001-4"},{"key":"e_1_2_9_224_1","doi-asserted-by":"publisher","DOI":"10.3389\/fncom.2017.00081"},{"key":"e_1_2_9_225_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2016.07.065"},{"key":"e_1_2_9_226_1","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2014.00205"},{"key":"e_1_2_9_227_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-020-62676-7"}],"container-title":["Advanced Intelligent Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Faisy.202000105","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aisy.202000105","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/aisy.202000105","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aisy.202000105","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,7]],"date-time":"2025-10-07T14:53:22Z","timestamp":1759848802000},"score":1,"resource":{"primary":{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/10.1002\/aisy.202000105"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8,2]]},"references-count":226,"journal-issue":{"issue":"11","published-print":{"date-parts":[[2020,11]]}},"alternative-id":["10.1002\/aisy.202000105"],"URL":"https:\/\/doi.org\/10.1002\/aisy.202000105","archive":["Portico"],"relation":{},"ISSN":["2640-4567","2640-4567"],"issn-type":[{"value":"2640-4567","type":"print"},{"value":"2640-4567","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,8,2]]},"assertion":[{"value":"2020-05-15","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2020-08-02","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"2000105"}}