{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T09:19:45Z","timestamp":1790846385784,"version":"4.1.0"},"reference-count":178,"publisher":"Wiley","issue":"4","license":[{"start":{"date-parts":[[2021,12,8]],"date-time":"2021-12-08T00:00:00Z","timestamp":1638921600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/100010661","name":"Horizon 2020 Framework Programme","doi-asserted-by":"publisher","award":["101016734"],"award-info":[{"award-number":["101016734"]}],"id":[{"id":"10.13039\/100010661","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["advanced.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Advanced Intelligent Systems"],"published-print":{"date-parts":[[2022,4]]},"abstract":"<jats:sec><jats:label\/><jats:p>Development of unconventional computing architectures, including neuromorphic computing, relies heavily on novel devices with properly engineered properties. This requires exploration of new functional materials and their designed interfaces. Ferroelectric memories including two\u2010terminal ferroelectric tunnel junctions and three\u2010terminal ferroelectric field\u2010effect transistors have shown promising performances in recent years as analog, multibit memory components with ultralow power consumption. However, for ferroelectric memory technology to become a mainstream technology, CMOS integration of these components is of major importance. For further diversifying their application to edge computing and smart sensing industry, a vast unchartered territory of low\u2010temperature processable and CMOS back\u2010end\u2010of\u2010line (BEOL) compatible materials needs to be researched. In recent years, doped HfO<jats:sub>2<\/jats:sub>\u2010based memory devices and in\u2010memory computing architectures have gathered huge momentum as one of the \u201cbeyond von Neumann\u201d computing alternatives. In comparison, molecular ferroelectric\u2010based systems are still in their early exploratory phase. This review discusses the potential for doped HfO<jats:sub>2<\/jats:sub> and molecular ferroelectrics as CMOS BEOL and flexible and wearable platform compatible neuromorphic devices and circuits and the challenges that need to be overcome for turning the opportunities to a technological reality.<\/jats:p><\/jats:sec>","DOI":"10.1002\/aisy.202100175","type":"journal-article","created":{"date-parts":[[2021,12,9]],"date-time":"2021-12-09T02:39:41Z","timestamp":1639017581000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":70,"title":["Back\u2010End CMOS Compatible and Flexible Ferroelectric Memories for Neuromorphic Computing and Adaptive Sensing"],"prefix":"10.1002","volume":"4","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7779-3959","authenticated-orcid":false,"given":"Sayani","family":"Majumdar","sequence":"first","affiliation":[{"name":"VTT Technical Research Centre of Finland Ltd.  P.O. Box 1000 FI-02044 VTT Espoo Finland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2021,12,8]]},"reference":[{"key":"e_1_2_11_2_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-020-0738-x"},{"key":"e_1_2_11_3_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0457-1"},{"key":"e_1_2_11_4_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0435-7"},{"key":"e_1_2_11_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2899262"},{"key":"e_1_2_11_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000085"},{"key":"e_1_2_11_7_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-020-0655-z"},{"key":"e_1_2_11_8_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41563-019-0291-x"},{"key":"e_1_2_11_9_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000137"},{"key":"e_1_2_11_10_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms3072"},{"key":"e_1_2_11_11_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"e_1_2_11_12_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-04484-2"},{"key":"e_1_2_11_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2439635"},{"key":"e_1_2_11_14_1","doi-asserted-by":"crossref","unstructured":"S.Yu Z.Li P.\u2010Y.Chen H.Wu B.Gao D.Wang W.Wu H.Qian inIEEE International Electron Devices Meeting (IEDM) IEEE Piscataway NJ2016 p.16.2.1.","DOI":"10.1109\/IEDM.2016.7838429"},{"key":"e_1_2_11_15_1","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2018.00435"},{"key":"e_1_2_11_16_1","doi-asserted-by":"publisher","DOI":"10.1093\/brain\/awl082"},{"key":"e_1_2_11_17_1","doi-asserted-by":"publisher","DOI":"10.1038\/81453"},{"key":"e_1_2_11_18_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6528\/ab554b"},{"key":"e_1_2_11_19_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.9b00180"},{"key":"e_1_2_11_20_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201903700"},{"key":"e_1_2_11_21_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5108562"},{"key":"e_1_2_11_22_1","doi-asserted-by":"publisher","DOI":"10.1002\/pi.5980"},{"key":"e_1_2_11_23_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isci.2020.101846"},{"key":"e_1_2_11_24_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0103-3"},{"key":"e_1_2_11_25_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000149"},{"key":"e_1_2_11_26_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3510"},{"key":"e_1_2_11_27_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201604740"},{"key":"e_1_2_11_28_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2016.70"},{"key":"e_1_2_11_29_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0023-2"},{"key":"e_1_2_11_30_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5111291"},{"key":"e_1_2_11_31_1","doi-asserted-by":"publisher","DOI":"10.1039\/C8NR07135G"},{"key":"e_1_2_11_32_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0270-x"},{"key":"e_1_2_11_33_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0288-0"},{"key":"e_1_2_11_34_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5142089"},{"key":"e_1_2_11_35_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201604310"},{"key":"e_1_2_11_36_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aac8a5"},{"key":"e_1_2_11_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2477135"},{"key":"e_1_2_11_38_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0405-0"},{"key":"e_1_2_11_39_1","unstructured":"International Roadmap for Devices and Systems 2020 edition Beyond CMOS2020 https:\/\/irds.ieee.org\/images\/files\/pdf\/2020\/2020IRDS_BC.pdf"},{"key":"e_1_2_11_40_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41578-019-0159-3"},{"key":"e_1_2_11_41_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0411-2"},{"key":"e_1_2_11_42_1","doi-asserted-by":"publisher","DOI":"10.1557\/mrc.2020.71"},{"key":"e_1_2_11_43_1","doi-asserted-by":"crossref","unstructured":"K.\u2010T.Chen C.\u2010Y.Liao C.Lo H.\u2010Y.Chen G.\u2010Y.Siang S.Liu S.\u2010C.Chang M.\u2010H.Liao S.\u2010T.Chang M. H.Lee inElectron Devices Technology and Manufacturing Conf. (EDTM) IEEE Singapore2019 p.62.","DOI":"10.1109\/EDTM.2019.8731272"},{"key":"e_1_2_11_44_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-020-2208-x"},{"key":"e_1_2_11_45_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-09533-2"},{"key":"e_1_2_11_46_1","doi-asserted-by":"publisher","DOI":"10.1063\/5.0037617"},{"key":"e_1_2_11_47_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11837-018-3140-5"},{"key":"e_1_2_11_48_1","doi-asserted-by":"crossref","unstructured":"C.Shi T.Costa J.Elloian K. L.Shepard IEEE Int. Electron Devices Meeting (IEDM) IEEE Piscataway NJ2018 p.4.5.1.","DOI":"10.1109\/IEDM.2018.8614632"},{"key":"e_1_2_11_49_1","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2015.2457782"},{"key":"e_1_2_11_50_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmat.2019.11.001"},{"key":"e_1_2_11_51_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-15105-2"},{"key":"e_1_2_11_52_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature21004"},{"key":"e_1_2_11_53_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201505118"},{"key":"e_1_2_11_54_1","doi-asserted-by":"publisher","DOI":"10.1557\/s43577-021-00093-5"},{"key":"e_1_2_11_55_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature22994"},{"key":"e_1_2_11_56_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-020-2038-x"},{"key":"e_1_2_11_57_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-00501-9"},{"key":"e_1_2_11_58_1","doi-asserted-by":"publisher","DOI":"10.1038\/d41586-020-00592-6"},{"key":"e_1_2_11_59_1","doi-asserted-by":"publisher","DOI":"10.1039\/C8CS00928G"},{"key":"e_1_2_11_60_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-16606-w"},{"key":"e_1_2_11_61_1","doi-asserted-by":"publisher","DOI":"10.3390\/ma13010166"},{"key":"e_1_2_11_62_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5129692"},{"key":"e_1_2_11_63_1","unstructured":"B. A.Dahl J.Cruz-Colon R. C.Baumann J. A.Rodriguez C.Zhou J.Rodriguez-Latorre S.Khan T.San T.Trinh inIEEE Radiation Effects Data Workshop IEEE Piscataway NJ2015 pp.1\u20136."},{"key":"e_1_2_11_64_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201800600"},{"key":"e_1_2_11_65_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.8b12092"},{"key":"e_1_2_11_66_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201800795"},{"key":"e_1_2_11_67_1","doi-asserted-by":"publisher","DOI":"10.1039\/D1NR01722E"},{"key":"e_1_2_11_68_1","doi-asserted-by":"publisher","DOI":"10.1039\/D0NH00559B"},{"key":"e_1_2_11_69_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3634052"},{"key":"e_1_2_11_70_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4919135"},{"key":"e_1_2_11_71_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4916707"},{"key":"e_1_2_11_72_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4995619"},{"key":"e_1_2_11_73_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2019.111013"},{"key":"e_1_2_11_74_1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2017.2732166"},{"key":"e_1_2_11_75_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms4583"},{"key":"e_1_2_11_76_1","first-page":"1","volume":"21","author":"Naber R. C. G.","year":"2009","journal-title":"Adv. Mater."},{"key":"e_1_2_11_77_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3009956"},{"key":"e_1_2_11_78_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.92.214115"},{"key":"e_1_2_11_79_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2002.1015207"},{"key":"e_1_2_11_80_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201103119"},{"key":"e_1_2_11_81_1","doi-asserted-by":"publisher","DOI":"10.1557\/mrc.2018.175"},{"key":"e_1_2_11_82_1","unstructured":"H.Jiang M. A.Bhuiyan Z.Liu T.P.Ma inIEEE Int. Memory Workshop IEEE Piscataway NJ2020 p.51."},{"key":"e_1_2_11_83_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4867975"},{"key":"e_1_2_11_84_1","doi-asserted-by":"publisher","DOI":"10.1039\/C5TC01074H"},{"key":"e_1_2_11_85_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4916715"},{"key":"e_1_2_11_86_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4927805"},{"key":"e_1_2_11_87_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201600173"},{"key":"e_1_2_11_88_1","doi-asserted-by":"publisher","DOI":"10.1063\/5.0013487"},{"key":"e_1_2_11_89_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b13866"},{"key":"e_1_2_11_90_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5030562"},{"key":"e_1_2_11_91_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201600460"},{"key":"e_1_2_11_92_1","doi-asserted-by":"publisher","DOI":"10.1080\/01411598908206863"},{"key":"e_1_2_11_93_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep04772"},{"key":"e_1_2_11_94_1","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/21\/48\/485902"},{"key":"e_1_2_11_95_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl200221z"},{"key":"e_1_2_11_96_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3055411"},{"key":"e_1_2_11_97_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.94.246802"},{"key":"e_1_2_11_98_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.72.125341"},{"key":"e_1_2_11_99_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1126230"},{"key":"e_1_2_11_100_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1171200"},{"key":"e_1_2_11_101_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl901754t"},{"key":"e_1_2_11_102_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms5289"},{"key":"e_1_2_11_103_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201703273"},{"key":"e_1_2_11_104_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms6414"},{"key":"e_1_2_11_105_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3415"},{"key":"e_1_2_11_106_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201504519"},{"key":"e_1_2_11_107_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-020-0647-z"},{"key":"e_1_2_11_108_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-00492-7"},{"key":"e_1_2_11_109_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3649"},{"key":"e_1_2_11_110_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4864100"},{"key":"e_1_2_11_111_1","doi-asserted-by":"publisher","DOI":"10.1038\/44352"},{"key":"e_1_2_11_112_1","doi-asserted-by":"publisher","DOI":"10.1021\/nn2018528"},{"key":"e_1_2_11_113_1","doi-asserted-by":"publisher","DOI":"10.1021\/nn401378t"},{"key":"e_1_2_11_114_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms11502"},{"key":"e_1_2_11_115_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4756918"},{"key":"e_1_2_11_116_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2011.213"},{"key":"e_1_2_11_117_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-15159-2"},{"key":"e_1_2_11_118_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep05075"},{"key":"e_1_2_11_119_1","doi-asserted-by":"publisher","DOI":"10.1039\/C8NR04734K"},{"key":"e_1_2_11_120_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.201900034"},{"key":"e_1_2_11_121_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-019-56816-x"},{"key":"e_1_2_11_122_1","doi-asserted-by":"crossref","unstructured":"H.Zhou J.Ocker M.Mennenga M.Noack S.M\u00fcller M.Trentzsch S.D\u00fcnkel S.Beyer T.Mikolajick inIEEE Int. Memory Workshop (IMW) IEEE Piscataway NJ2020 p.1.","DOI":"10.1109\/IMW48823.2020.9108131"},{"key":"e_1_2_11_123_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2829122"},{"key":"e_1_2_11_124_1","volume-title":"Applied Physics","author":"Park B.\u2010E.","year":"2016"},{"key":"e_1_2_11_125_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.200902095"},{"key":"e_1_2_11_126_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3608145"},{"key":"e_1_2_11_127_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3247881"},{"key":"e_1_2_11_128_1","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/42\/24\/245101"},{"key":"e_1_2_11_129_1","unstructured":"H.Mulaosmanovic J.Ocker S.M\u00fcller M.Noack J.M\u00fcller P.Polakowski T.Mikolajick S.Slesazeck inIEEE Symp. on VLSI Technology IEEE Piscataway NJ2017."},{"key":"e_1_2_11_130_1","unstructured":"M.Jerry P.Chen J.Zhang P.Sharma K.Ni S.Yu S.Datta inIEEE Int. Electron Devices Meeting IEEE Piscataway NJ2017 p.6.2.1."},{"key":"e_1_2_11_131_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.0c00877"},{"key":"e_1_2_11_132_1","doi-asserted-by":"crossref","unstructured":"S.Dutta H.Ye W.Chakraborty Y.\u2010C.Luo M.San Jose B.Grisafe A.Khanna I.Lightcap S.Shinde S.Yu S.Datta inIEEE Int. Electron Devices Meeting IEEE Piscataway NJ2020 p.36.4.1.","DOI":"10.1109\/IEDM13553.2020.9371974"},{"key":"e_1_2_11_133_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aad6f8"},{"key":"e_1_2_11_134_1","unstructured":"K.Ni J. A.Smith B.Grisafe T.Rakshit B.Obradovic J. A.Kittl M.Rodder S.Datta presented atProc. of the Technical Digest - International Electron Devices Meeting San Francisco CA 2019."},{"key":"e_1_2_11_135_1","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2019.2925061"},{"key":"e_1_2_11_136_1","unstructured":"X.Sun P.Wang K.Ni S.Datta S.Yu inProc. of the Technical Digest \u2013 Int. Electron Devices Meeting San Francisco CA2019."},{"key":"e_1_2_11_137_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2856818"},{"key":"e_1_2_11_138_1","doi-asserted-by":"crossref","unstructured":"T.Ali P.Polakowski K.K\u00fchnel M.Czernohorsky T.K\u00e4mpfe M.Rudolph B.P\u00e4tzold D.Lehninger F.M\u00fcller R.Olivo M.Lederer R.Hoffmann P.Steinke K.Zimmermann U.M\u00fchle K.Seidel J.M\u00fcller inIEEE Int. Electron Devices Meeting IEEE Piscataway NJ2019 p.28.7.1.","DOI":"10.1109\/IEDM19573.2019.8993642"},{"key":"e_1_2_11_139_1","doi-asserted-by":"crossref","unstructured":"X.Chen X.Yin M.Niemier X. S.Hu inDesign Automation & Test in Europe Conf. & Exhibition IEEE Dresden Germany https:\/\/doi.org\/10.23919\/DATE.2018.8342199.","DOI":"10.23919\/DATE.2018.8342199"},{"key":"e_1_2_11_140_1","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2020.00634"},{"key":"e_1_2_11_141_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-020-01544-z"},{"key":"e_1_2_11_142_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2852698"},{"key":"e_1_2_11_143_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2021.3066319"},{"key":"e_1_2_11_144_1","doi-asserted-by":"crossref","unstructured":"T.Hsu Y.\u2010C.Chiu W.\u2010C.Wei Y.\u2010C.Lo C.\u2010C.Lo R.\u2010S.Liu K.\u2010T.Tang M.\u2010F.Chang C.\u2010C.Hsieh inIEEE Int. Electron Devices Meeting IEEE Piscataway NJ2019 p.22.5.1.","DOI":"10.1109\/IEDM19573.2019.8993452"},{"key":"e_1_2_11_145_1","unstructured":"T.Francois L.Grenouillet J.Coignus P.Blaise C.Carabasse N.Vaxelaire T.Magis F.Aussenac V.Loup C.Pellissier S.Slesazeck V.Havel C.Richter A.Makosiej B.Giraud E. T.Breyer M.Materano P.Chiquet M.Bocquet E.Nowak U.Schroeder F.Gaillard inIEEE Int. Electron Devices Meeting IEEE Piscataway NJ2019."},{"key":"e_1_2_11_146_1","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.202000524"},{"key":"e_1_2_11_147_1","doi-asserted-by":"crossref","unstructured":"S.Beyer S.D\u00fcnkel M.Trentzsch J.M\u00fcller A.Hellmich D.Utess J.Paul D.Kleimaier J.Pellerin S.M\u00fcller J.Ocker A.Benoist H.Zhou M.Mennenga M.Schuster F.Tassan M.Noack A.Pourkeramati F.M\u00fcller M.Lederer T.Ali R.Hoffmann T.K\u00e4mpfe K.Seidel inIEEE Int. Memory Workshop IEEE Piscataway NJ2020 p.1.","DOI":"10.1109\/IMW48823.2020.9108150"},{"key":"e_1_2_11_148_1","doi-asserted-by":"publisher","DOI":"10.1021\/am402852y"},{"key":"e_1_2_11_149_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2015169"},{"key":"e_1_2_11_150_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.orgel.2013.04.025"},{"key":"e_1_2_11_151_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2339"},{"key":"e_1_2_11_152_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1179963"},{"key":"e_1_2_11_153_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201903558"},{"key":"e_1_2_11_154_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202101951"},{"key":"e_1_2_11_155_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms2832"},{"key":"e_1_2_11_156_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1159655"},{"key":"e_1_2_11_157_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsanm.9b00033"},{"key":"e_1_2_11_158_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.1500661"},{"key":"e_1_2_11_159_1","doi-asserted-by":"crossref","unstructured":"C.Matsui K.Toprasertpong S.Takagi K.Takeuchi in2021 Symp. on VLSI Technology 2021 p.1.","DOI":"10.23919\/VLSICircuits52068.2021.9492448"},{"key":"e_1_2_11_160_1","unstructured":"A.Jonas Z.Hu WO 2009\/144310 Al 2009."},{"key":"e_1_2_11_161_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000040"},{"key":"e_1_2_11_162_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b16173"},{"key":"e_1_2_11_163_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202001074"},{"key":"e_1_2_11_164_1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2885932"},{"key":"e_1_2_11_165_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.7b01571"},{"key":"e_1_2_11_166_1","doi-asserted-by":"publisher","DOI":"10.1039\/C8CP02024H"},{"key":"e_1_2_11_167_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep24407"},{"key":"e_1_2_11_168_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.orgel.2012.04.026"},{"key":"e_1_2_11_169_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2903641"},{"key":"e_1_2_11_170_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3083219"},{"key":"e_1_2_11_171_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.abe1341"},{"key":"e_1_2_11_172_1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2020.3008789"},{"key":"e_1_2_11_173_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5129963"},{"key":"e_1_2_11_174_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41699-017-0040-4"},{"key":"e_1_2_11_175_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5022864"},{"key":"e_1_2_11_176_1","doi-asserted-by":"publisher","DOI":"10.3938\/jkps.67.1499"},{"key":"e_1_2_11_177_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2132062"},{"key":"e_1_2_11_178_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat1329"},{"key":"e_1_2_11_179_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.8b05604"}],"container-title":["Advanced Intelligent Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aisy.202100175","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/aisy.202100175","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aisy.202100175","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,7]],"date-time":"2025-10-07T14:34:22Z","timestamp":1759847662000},"score":1,"resource":{"primary":{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/10.1002\/aisy.202100175"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12,8]]},"references-count":178,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2022,4]]}},"alternative-id":["10.1002\/aisy.202100175"],"URL":"https:\/\/doi.org\/10.1002\/aisy.202100175","archive":["Portico"],"relation":{},"ISSN":["2640-4567","2640-4567"],"issn-type":[{"value":"2640-4567","type":"print"},{"value":"2640-4567","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,12,8]]},"assertion":[{"value":"2021-09-16","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2021-12-08","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"2100175"}}