{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T15:46:44Z","timestamp":1774972004535,"version":"3.50.1"},"reference-count":45,"publisher":"Wiley","issue":"6","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2018R1A2A3075302"],"award-info":[{"award-number":["2018R1A2A3075302"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2020M3F3A2A01082592"],"award-info":[{"award-number":["2020M3F3A2A01082592"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2021R1A6A3A13039237"],"award-info":[{"award-number":["2021R1A6A3A13039237"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2019M3F3A1A03079603"],"award-info":[{"award-number":["2019M3F3A1A03079603"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["advanced.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Advanced Intelligent Systems"],"published-print":{"date-parts":[[2022,6]]},"abstract":"<jats:sec><jats:label\/><jats:p>An artificial synapse is an essential element to construct a hardware\u2010based artificial neural network (ANN). While various synaptic devices have been proposed along with studies on electrical characteristics and proper applications, a small number of conductance states with nonlinear and asymmetric conductance changes have been problematic and imposed limits on computational performance. Their applications are thus still limited to the classification of simple images or acoustic datasets. Herein, a polymer electrolyte\u2010gated synaptic transistor (pEGST) is demonstrated for video\u2010based learning and inference using transfer learning. In particular, abnormal car detection (ACD) is attempted with video\u2010based learning and inference to avoid traffic accidents. The pEGST showed multiple states of 8,192 (=13 bits) for weight modulation with linear and symmetric conductance changes and helped reduce the error rate to 3% to judge whether a car in a video is abnormal.<\/jats:p><\/jats:sec>","DOI":"10.1002\/aisy.202100231","type":"journal-article","created":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T04:44:52Z","timestamp":1646109892000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["A Multiple\u2010State Ion Synaptic Transistor Applicable to Abnormal Car Detection with Transfer Learning"],"prefix":"10.1002","volume":"4","author":[{"given":"Ji-Man","family":"Yu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Gyeongdo","family":"Ham","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Chungryeol","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Chemical and Biomolecular Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Jae-Hyeok","family":"Lee","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Joon-Kyu","family":"Han","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Jin-Ki","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Donggon","family":"Jang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Nahyun","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Moon-Seok","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Sung Gap","family":"Im","sequence":"additional","affiliation":[{"name":"Department of Chemical and Biomolecular Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"given":"Dae-Shik","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5480-7027","authenticated-orcid":false,"given":"Yang-Kyu","family":"Choi","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea"}]}],"member":"311","published-online":{"date-parts":[[2022,3]]},"reference":[{"key":"e_1_2_8_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/5.58356"},{"key":"e_1_2_8_3_1","doi-asserted-by":"publisher","DOI":"10.1038\/354515a0"},{"key":"e_1_2_8_4_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0006-8"},{"key":"e_1_2_8_5_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.240"},{"key":"e_1_2_8_6_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0448-2"},{"key":"e_1_2_8_7_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0288-0"},{"key":"e_1_2_8_8_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-019-0270-x"},{"key":"e_1_2_8_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0059-3"},{"key":"e_1_2_8_10_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.aaw5581"},{"key":"e_1_2_8_11_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.abb2958"},{"key":"e_1_2_8_12_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201604310"},{"key":"e_1_2_8_13_1","doi-asserted-by":"crossref","unstructured":"J.Tang D.Bishop S.Kim M.Copel T.Gokmen T.Todorov S.Shin K.-T.Lee P.Solomon K.Chan W.Haensch J.Rozen inProc. Inter. Electron Devices Meeting (IEDM) IEEE Piscataway NJ USA 2018 p.13.1.1\u201313.1.4https:\/\/doi.org\/10.1109\/IEDM.2018.8614551.","DOI":"10.1109\/IEDM.2018.8614551"},{"key":"e_1_2_8_14_1","doi-asserted-by":"crossref","unstructured":"S.Kim T.Todorov M.Onen T.Gokmen D.Bishop P.Solomon K.-T.Lee M.Copel D. B.Farmer J. A.Ott T.Ando H.Miyazoe V.Narayanan J.Rozen inProc. Inter. Electron Devices Meeting (IEDM) IEEE Piscataway NJ USA 2019https:\/\/doi.org\/10.1109\/IEDM19573.2019.8993463.","DOI":"10.1109\/IEDM19573.2019.8993463"},{"key":"e_1_2_8_15_1","doi-asserted-by":"publisher","DOI":"10.1002\/advs.201901265"},{"key":"e_1_2_8_16_1","doi-asserted-by":"publisher","DOI":"10.1002\/advs.201801339"},{"key":"e_1_2_8_17_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-07572-5"},{"key":"e_1_2_8_18_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-17849-3"},{"key":"e_1_2_8_19_1","doi-asserted-by":"crossref","unstructured":"S.Park A.Sheri J.Kim J.Noh J.Jang M.Jeon B.Lee B. R.Lee B. H.Lee H.Hwang inIEEE Inter. Electron Devices Meeting (IEDM) IEEE Piscataway NJ USA 2013https:\/\/doi.org\/10.1109\/IEDM.2013.6724692.","DOI":"10.1109\/IEDM.2013.6724692"},{"key":"e_1_2_8_20_1","doi-asserted-by":"crossref","unstructured":"B.Kim C. M.Kang J.Kim S. H.Lee C. C.Cung J. W.Choi inIEEE Int. Conf. Intelligent Transportation Systems (ITSC) IEEE Yokohama Japan 2017 Vol.20 pp.399\u2013404https:\/\/doi.org\/10.1109\/ITSC.2017.8317943.","DOI":"10.1109\/ITSC.2017.8317943"},{"key":"e_1_2_8_21_1","doi-asserted-by":"crossref","unstructured":"S.Mozaffari O. Y.Al-Jarrah M.Dianati P.Jennings A.Mouzakitis inIEEE Trans. Intelligent Transportation Systems 2020 23 pp.33\u201347.","DOI":"10.1109\/TITS.2020.3012034"},{"key":"e_1_2_8_22_1","doi-asserted-by":"crossref","unstructured":"H.Kim K.Lee G.Hwang C.Suh inProc. AAAI conf. Artificial Intelligence 2019 Vol.33 pp.978\u2013985https:\/\/doi.org\/10.1609\/aaai.v33i01.3301978.","DOI":"10.1609\/aaai.v33i01.3301978"},{"key":"e_1_2_8_23_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202010971"},{"key":"e_1_2_8_24_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-23719-3"},{"key":"e_1_2_8_25_1","doi-asserted-by":"publisher","DOI":"10.1002\/smll.201800521"},{"key":"e_1_2_8_26_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201301878"},{"key":"e_1_2_8_27_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat4237"},{"key":"e_1_2_8_28_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-019-12423-y"},{"key":"e_1_2_8_29_1","doi-asserted-by":"crossref","unstructured":"M.Jerry P.-Y.Chen J.Zhang P.Sharma K.Ni S.Yu S.Datta inTech. Dig. - Int. Electron Devices Meeting (IEDM) IEEE Piscataway NJUSA 2018 pp.6.2.1\u20136.2.4https:\/\/doi.org\/10.1109\/IEDM.2017.8268338.","DOI":"10.1109\/IEDM.2017.8268338"},{"key":"e_1_2_8_30_1","doi-asserted-by":"crossref","unstructured":"Y.Lin H.Wu B.Gao P.Yao W.Wu Q.Zhang X.Zhang X.Li F.Li J.Lu G.Li S.Yu H.Qian inIEEE Int. Electron Devices Meeting (IEDM) IEEE Piscataway NJ USA 2018 pp.3.4.1\u20133.4.4https:\/\/doi.org\/10.1109\/IEDM.2018.8614483.","DOI":"10.1109\/IEDM.2018.8614483"},{"key":"e_1_2_8_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2723319"},{"key":"e_1_2_8_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2418342"},{"key":"e_1_2_8_33_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2789723"},{"key":"e_1_2_8_34_1","unstructured":"M.Lin Q.Chen S.Yan Preprint atarXiv:1312.4400 2013."},{"key":"e_1_2_8_35_1","unstructured":"B.Zhou A.Khosla A.Lapedriza A.Oliva A.Torralba inProc. IEEE Conf. on Computer Vision and Pattern Recognition (CVPR) Las Vegas NV USA 2016 pp.2921\u20132929."},{"key":"e_1_2_8_36_1","doi-asserted-by":"crossref","unstructured":"A.Howard M.Sandler G.Chu L.-C.Chen B.Chen M.Tan W.Wang Y.Zhu R.Pang V.Vasudevan Q. V.Le H.Adam inInter. conference on computer vision (ICCV) Seoul KOR 2019 pp.1314\u20131324.","DOI":"10.1109\/ICCV.2019.00140"},{"key":"e_1_2_8_37_1","first-page":"4400","volume":"1312","author":"Lin M.","year":"2013","journal-title":"arXiv preprint arXiv"},{"key":"e_1_2_8_38_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2877587"},{"key":"e_1_2_8_39_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2018.2842585"},{"key":"e_1_2_8_40_1","doi-asserted-by":"crossref","unstructured":"S.Yu Z.Li P.-Y.Chen W.Wu B.Gao D.Wang W.Wu H.Qian in2016 IEEE Inter. Electron Devices Meeting (IEDM) IEEE Piscataway NJ USA 2016 pp.16.2.1\u201316.2.4https:\/\/doi.org\/10.1109\/IEDM.2016.7838429.","DOI":"10.1109\/IEDM.2016.7838429"},{"key":"e_1_2_8_41_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aabe70"},{"key":"e_1_2_8_42_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat4856"},{"key":"e_1_2_8_43_1","unstructured":"I. R. D. S.More Moore inThe Inter. Roadmap for Device and Systems: 2020 IEEE Piscataway NJ USA 2020 https:\/\/irds.ieee.org\/editions\/2020"},{"key":"e_1_2_8_44_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201203680"},{"key":"e_1_2_8_45_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201800600"},{"key":"e_1_2_8_46_1","doi-asserted-by":"publisher","DOI":"10.1039\/D1TC01486B"}],"container-title":["Advanced Intelligent Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aisy.202100231","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/aisy.202100231","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aisy.202100231","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,7]],"date-time":"2025-10-07T17:09:20Z","timestamp":1759856960000},"score":1,"resource":{"primary":{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/10.1002\/aisy.202100231"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":45,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2022,6]]}},"alternative-id":["10.1002\/aisy.202100231"],"URL":"https:\/\/doi.org\/10.1002\/aisy.202100231","archive":["Portico"],"relation":{},"ISSN":["2640-4567","2640-4567"],"issn-type":[{"value":"2640-4567","type":"print"},{"value":"2640-4567","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,3]]},"assertion":[{"value":"2021-11-11","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2022-03-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"2100231"}}