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However, hardware implementation of NNs using realistic memristors is challenging due to the ubiquity of faults (mainly classified into hard and soft faults) in memristors. Herein, a hardware\u2010friendly, low\u2010power multifault\u2010tolerant training (MFTT) scheme capable of addressing both hard and soft faults simultaneously for memristive NNs is proposed. The MFTT scheme consists of multifault detection, targeted weight pruning, and in\u2009situ training with the Manhattan update rule. Specifically, multifault detection is first conducted to detect both hard and large soft faults. The detected faulty weights are subsequently pruned to prevent them from disturbing the NN. The sparsified NN after pruning is in\u2009situ trained so that the hard and large soft faults can be effectively tolerated using the sparsity and self\u2010adaptivity of NNs. In addition, the remaining small soft faults can be well tolerated by the Manhattan update rule. Experimentally, MFTT demonstrates the lowest accuracy losses among several representative fault\u2010tolerant schemes not only in the hard fault\u2010only (when the hard fault ratio exceeds 10%) and soft fault\u2010only (when the soft faults are large) cases, but also in the case where both types of faults coexist.<\/jats:p><\/jats:sec>","DOI":"10.1002\/aisy.202100237","type":"journal-article","created":{"date-parts":[[2022,2,24]],"date-time":"2022-02-24T07:00:34Z","timestamp":1645686034000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["A Multifault\u2010Tolerant Training Scheme for Nonideal Memristive Neural Networks"],"prefix":"10.1002","volume":"4","author":[{"given":"Yihong","family":"Chen","sequence":"first","affiliation":[{"name":"Institute for Advanced Materials South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"},{"name":"Guangdong Provincial Key Laboratory of Optical Information Materials and Technology South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1756-641X","authenticated-orcid":false,"given":"Zhen","family":"Fan","sequence":"additional","affiliation":[{"name":"Institute for Advanced Materials South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"},{"name":"Guangdong Provincial Key Laboratory of Optical Information Materials and Technology South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"}]},{"given":"Shuai","family":"Dong","sequence":"additional","affiliation":[{"name":"Institute for Advanced Materials South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"}]},{"given":"Minghui","family":"Qin","sequence":"additional","affiliation":[{"name":"Institute for Advanced Materials South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"}]},{"given":"Min","family":"Zeng","sequence":"additional","affiliation":[{"name":"Institute for Advanced Materials South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"}]},{"given":"Xubing","family":"Lu","sequence":"additional","affiliation":[{"name":"Institute for Advanced Materials South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"}]},{"given":"Gougu","family":"Zhou","sequence":"additional","affiliation":[{"name":"Guangdong Provincial Key Laboratory of Optical Information Materials and Technology South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"}]},{"given":"Xingsen","family":"Gao","sequence":"additional","affiliation":[{"name":"Institute for Advanced Materials South China Academy of Advanced Optoelectronics South China Normal University  Guangzhou 510006 China"}]},{"given":"Jun-Ming","family":"Liu","sequence":"additional","affiliation":[{"name":"Laboratory of Solid State Microstructures and Innovation Center of Advanced Microstructures Nanjing University  Nanjing 210093 China"}]}],"member":"311","published-online":{"date-parts":[[2022,2,24]]},"reference":[{"key":"e_1_2_9_2_1","unstructured":"C.Szegedy S.Ioffe V.Vanhoucke A. 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