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By IMC, matrix\u2010vector multiplication (MVM) can be executed in the crosspoint array in just one step, thus accelerating a broad range of tasks in machine learning and data analytics. However, a key issue for RRAM crosspoint arrays is the forming operation of the memories which limits the stability and accuracy of the conductance state in the memory device. In this work, a hardware implementation of crosspoint array of forming\u2010free devices for fast, energy\u2010efficient accelerators of MVM is reported. RRAM devices with a 1.5\u2009nm\u2010thick HfO<jats:sub>2<\/jats:sub> layer show an initial low resistance without forming and an analogue\u2010mode programming behavior for high\u2010accuracy IMC. Accurate hardware MVM is demonstrated by experimental eigenvalue\/eigenvector calculation according to the power\u2010iteration algorithm, with a fast convergence within about ten iterations to the correct solution. Deflation technique and principal component analysis (PCA) enable the classification of the Iris dataset with 98% accuracy compared with floating\u2010point implementation. These results support forming\u2010free crosspoint arrays for accelerating advanced machine learning with IMC.<\/jats:p><\/jats:sec>","DOI":"10.1002\/aisy.202200053","type":"journal-article","created":{"date-parts":[[2022,5,13]],"date-time":"2022-05-13T03:49:42Z","timestamp":1652413782000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":26,"title":["Forming\u2010Free Resistive Switching Memory Crosspoint Arrays for In\u2010Memory Machine Learning"],"prefix":"10.1002","volume":"4","author":[{"given":"Saverio","family":"Ricci","sequence":"first","affiliation":[{"name":"Dipartimento di Elettronica Informazione e Bioingegneria (DEIB) Politecnico di Milano and IUNET  piazza L. da Vinci 32 20133 Milano Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Piergiulio","family":"Mannocci","sequence":"additional","affiliation":[{"name":"Dipartimento di Elettronica Informazione e Bioingegneria (DEIB) Politecnico di Milano and IUNET  piazza L. da Vinci 32 20133 Milano Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Matteo","family":"Farronato","sequence":"additional","affiliation":[{"name":"Dipartimento di Elettronica Informazione e Bioingegneria (DEIB) Politecnico di Milano and IUNET  piazza L. da Vinci 32 20133 Milano Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shahin","family":"Hashemkhani","sequence":"additional","affiliation":[{"name":"Dipartimento di Elettronica Informazione e Bioingegneria (DEIB) Politecnico di Milano and IUNET  piazza L. da Vinci 32 20133 Milano Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1853-1614","authenticated-orcid":false,"given":"Daniele","family":"Ielmini","sequence":"additional","affiliation":[{"name":"Dipartimento di Elettronica Informazione e Bioingegneria (DEIB) Politecnico di Milano and IUNET  piazza L. da Vinci 32 20133 Milano Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2022,5,13]]},"reference":[{"key":"e_1_2_10_2_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41563-019-0291-x"},{"key":"e_1_2_10_3_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.240"},{"key":"e_1_2_10_4_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000040"},{"key":"e_1_2_10_5_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-021-00943-y"},{"key":"e_1_2_10_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201600195"},{"key":"e_1_2_10_7_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202101161"},{"key":"e_1_2_10_8_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0002-z"},{"key":"e_1_2_10_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms15199"},{"key":"e_1_2_10_10_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-25455-0"},{"key":"e_1_2_10_11_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41563-021-01099-9"},{"key":"e_1_2_10_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3095433"},{"key":"e_1_2_10_13_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000137"},{"key":"e_1_2_10_14_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"e_1_2_10_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/MNANO.2022.3141515"},{"key":"e_1_2_10_16_1","first-page":"bsa501","volume-title":"Principal Component Analysis","author":"Jolliffe I.","year":"2005"},{"key":"e_1_2_10_17_1","volume-title":"Multivariate Analysis of Quality: An Introduction","author":"Martens H.","year":"2001"},{"key":"e_1_2_10_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838345"},{"key":"e_1_2_10_19_1","doi-asserted-by":"publisher","DOI":"10.3390\/nano12030455"},{"key":"e_1_2_10_20_1","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/6724018"},{"key":"e_1_2_10_21_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202105022"},{"key":"e_1_2_10_22_1","doi-asserted-by":"publisher","DOI":"10.1002\/celc.201300165"},{"key":"e_1_2_10_23_1","doi-asserted-by":"publisher","DOI":"10.1088\/2634-4386\/ac29ca"},{"key":"e_1_2_10_24_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-019-11411-6"},{"key":"e_1_2_10_25_1","first-page":"121","volume":"187","author":"Wang C.","year":"2018","journal-title":"Microelectron. 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