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Based on technology computer aided design (TCAD) simulations of a SONOS device, the model contains a nonvolatile memristor with the state variable <jats:italic>Q<\/jats:italic><jats:sub>M<\/jats:sub> representing the memristor charge under the gate of the three\u2010terminal element. By incorporating the exponential dependence of the memristance on <jats:italic>Q<\/jats:italic><jats:sub>M<\/jats:sub> and the applied bias <jats:italic>V<\/jats:italic> for the gate, the compact model agrees quantitatively with the results from TCAD simulations as well as experimental measurements for the drain current. The compact model is implemented through VerilogA in the circuit simulation package Cadence Spectre and reproduces the experimental training behavior for the source\u2013drain conductance of a SONOS device after applying writing pulses ranging from \u221212\u2009V to +11\u2009V, with an accuracy higher than 90%.<\/jats:p><\/jats:sec>","DOI":"10.1002\/aisy.202200070","type":"journal-article","created":{"date-parts":[[2022,5,22]],"date-time":"2022-05-22T22:26:33Z","timestamp":1653258393000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Physical Compact Model for Three\u2010Terminal SONOS Synaptic Circuit Element"],"prefix":"10.1002","volume":"4","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7957-8953","authenticated-orcid":false,"given":"Su-in","family":"Yi","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering Texas A&amp;M University  College Station TX 77843 USA"}]},{"given":"A. 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