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However, a major challenge of implementing robust hardware neural networks is the conductance instability over time of resistive memories, due to the local recombination of oxygen vacancies. This effect causes resistive memory\u2010based neural networks to rapidly lose accuracy, an issue that is sometimes overlooked. Herein, this conductance instability issue is shown, which can be avoided without changing the material stack of the resistive memory by exploiting an original programming strategy. This technique relies on program\u2010and\u2010verify loops with appropriately chosen wait times and ensures that the resistive memories are programmed into states with stable filaments. To test the strategy, a 32\u2009\u00d7\u200932 in\u2010memory computing system, fabricated in a hybrid complementary metal\u2010oxide\u2010semiconductor (CMOS)\/hafnium oxide technology, is programmed to classify heart arrhythmia from electrocardiogram. When the resistive memories are programmed conventionally, the system loses accuracy within hours. In contrast, when using this technique, the system maintains an accuracy of 95% over more than 2 months. These results highlight the potential of resistive memory for the implementation of low\u2010power neural networks with long\u2010term stability.<\/jats:p><\/jats:sec>","DOI":"10.1002\/aisy.202200145","type":"journal-article","created":{"date-parts":[[2022,9,25]],"date-time":"2022-09-25T14:39:19Z","timestamp":1664116759000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":22,"title":["Experimental Demonstration of Multilevel Resistive Random Access Memory Programming for up to Two Months Stable Neural Networks Inference Accuracy"],"prefix":"10.1002","volume":"4","author":[{"given":"Eduardo","family":"Esmanhotto","sequence":"first","affiliation":[{"name":"CEA-Leti Universit\u00e9 Grenoble Alpes  38400 Grenoble France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tifenn","family":"Hirtzlin","sequence":"additional","affiliation":[{"name":"CEA-Leti Universit\u00e9 Grenoble Alpes  38400 Grenoble France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Djohan","family":"Bonnet","sequence":"additional","affiliation":[{"name":"CEA-Leti Universit\u00e9 Grenoble Alpes  38400 Grenoble France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Niccolo","family":"Castellani","sequence":"additional","affiliation":[{"name":"CEA-Leti Universit\u00e9 Grenoble Alpes  38400 Grenoble France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jean-Michel","family":"Portal","sequence":"additional","affiliation":[{"name":"IM2NP Aix-Marseille Universit\u00e9  13007 Marseille France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Damien","family":"Querlioz","sequence":"additional","affiliation":[{"name":"CNRS Centre de Nanosciences et de Nanotechnologies Universit\u00e9 Paris-Saclay  91120 Palaiseau France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0536-5722","authenticated-orcid":false,"given":"Elisa","family":"Vianello","sequence":"additional","affiliation":[{"name":"CEA-Leti Universit\u00e9 Grenoble Alpes  38400 Grenoble France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2022,9,25]]},"reference":[{"key":"e_1_2_9_2_1","first-page":"145","volume":"554","year":"2018","journal-title":"Nature"},{"key":"e_1_2_9_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2016.2573586"},{"key":"e_1_2_9_4_1","doi-asserted-by":"publisher","DOI":"10.1038\/s42254-020-0208-2"},{"key":"e_1_2_9_5_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"e_1_2_9_6_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-018-0180-5"},{"key":"e_1_2_9_7_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000040"},{"key":"e_1_2_9_8_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000115"},{"key":"e_1_2_9_9_1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.202100432"},{"key":"e_1_2_9_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isci.2020.101809"},{"key":"e_1_2_9_11_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-020-1942-4"},{"key":"e_1_2_9_12_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-00523-3"},{"key":"e_1_2_9_13_1","unstructured":"Y.Xi B.Gao J.Tang X.Mu F.Xu P.Yao X.Li W.Zhang M.Zhao H.Qian H.Wu in2020 IEEE 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) IEEE Piscataway NJ2020."},{"key":"e_1_2_9_14_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.8.024028"},{"key":"e_1_2_9_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2448731"},{"key":"e_1_2_9_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2931769"},{"key":"e_1_2_9_17_1","unstructured":"A.Fantini L.Goux S.Clima R.Degraeve A.Redolfi C.Adelmann C.Polimeni Y.Chen M.Komura A.Belmonte D.Wouters M.Jurczak in2014 IEEE 6th Int. 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