{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,13]],"date-time":"2026-02-13T09:58:21Z","timestamp":1770976701075,"version":"3.50.1"},"reference-count":51,"publisher":"Wiley","issue":"6","license":[{"start":{"date-parts":[[2023,1,27]],"date-time":"2023-01-27T00:00:00Z","timestamp":1674777600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":["advanced.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Advanced Intelligent Systems"],"published-print":{"date-parts":[[2023,6]]},"abstract":"<jats:sec><jats:label\/><jats:p>In recent years, neuromorphic computing has been rapidly developed to overcome the limitations of von Neumann architecture. In this regard, the demand for high\u2010performance synaptic devices with high switching speeds, low power consumption, and multilevel conductance is increasing. Among the various synaptic devices, ferroelectric tunnel junctions (FTJs) are promising candidates. While previous studies have focused on improving reliability of FTJs to enhance the synaptic behavior, low\u2010frequency noise (LFN) of FTJs has not been characterized and its impact on the learning accuracy in neuromorphic computing remains unknown. Herein, the LFN characteristics of FTJs fabricated on n\u2010 and p\u2010type Si along with the impact of 1\/<jats:italic>f<\/jats:italic> noise on the learning accuracy of convolutional neural networks (CNNs) are investigated. The results indicate that the FTJ on p\u2010type Si exhibits a far lower 1\/<jats:italic>f<\/jats:italic> noise than that on n\u2010type Si. The FTJ on p\u2010type Si exhibits a significantly higher learning accuracy (86.26%) than that on n\u2010type Si (78.70%) owing to its low\u2010noise properties. This study provides valuable insights into the LFN characteristics of FTJs and a solution to improve the performance of synaptic devices by significantly reducing the 1\/<jats:italic>f<\/jats:italic> noise.<\/jats:p><\/jats:sec>","DOI":"10.1002\/aisy.202200377","type":"journal-article","created":{"date-parts":[[2023,1,27]],"date-time":"2023-01-27T23:19:37Z","timestamp":1674861577000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":23,"title":["1\/<i>f<\/i> Noise in Synaptic Ferroelectric Tunnel Junction: Impact on Convolutional Neural Network"],"prefix":"10.1002","volume":"5","author":[{"given":"Wonjun","family":"Shin","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center Seoul National University  Seoul 08826 Republic of Korea"}]},{"given":"Kyung Kyu","family":"Min","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center Seoul National University  Seoul 08826 Republic of Korea"}]},{"given":"Jong-Ho","family":"Bae","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering Kookmin University  Seoul 02707 Korea"}]},{"given":"Jaehyeon","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center Seoul National University  Seoul 08826 Republic of Korea"}]},{"given":"Ryun-Han","family":"Koo","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center Seoul National University  Seoul 08826 Republic of Korea"}]},{"given":"Dongseok","family":"Kwon","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center Seoul National University  Seoul 08826 Republic of Korea"}]},{"given":"Jae-Joon","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center Seoul National University  Seoul 08826 Republic of Korea"}]},{"given":"Daewoong","family":"Kwon","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering Hanyang University  Seoul 04763 Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3559-9802","authenticated-orcid":false,"given":"Jong-Ho","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center Seoul National University  Seoul 08826 Republic of Korea"}]}],"member":"311","published-online":{"date-parts":[[2023,1,27]]},"reference":[{"key":"e_1_2_8_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2929245"},{"key":"e_1_2_8_3_1","doi-asserted-by":"crossref","first-page":"191","DOI":"10.1007\/978-981-13-8379-3_8","volume-title":"Applications of Emerging Memory Technology","author":"Talati N.","year":"2020"},{"key":"e_1_2_8_4_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-020-3227-1"},{"key":"e_1_2_8_5_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0103-3"},{"key":"e_1_2_8_6_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-021-00649-y"},{"key":"e_1_2_8_7_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0385-0"},{"key":"e_1_2_8_8_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0023-2"},{"key":"e_1_2_8_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0002-z"},{"key":"e_1_2_8_10_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0006-8"},{"key":"e_1_2_8_11_1","doi-asserted-by":"publisher","DOI":"10.1002\/smsc.202100086"},{"key":"e_1_2_8_12_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-021-00593-x"},{"key":"e_1_2_8_13_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-021-00626-5"},{"key":"e_1_2_8_14_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0160-7"},{"key":"e_1_2_8_15_1","doi-asserted-by":"publisher","DOI":"10.1557\/mrs.2019.201"},{"key":"e_1_2_8_16_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0074-4"},{"key":"e_1_2_8_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2701282"},{"key":"e_1_2_8_18_1","doi-asserted-by":"publisher","DOI":"10.1039\/D2MH00080F"},{"key":"e_1_2_8_19_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0463-3"},{"key":"e_1_2_8_20_1","doi-asserted-by":"publisher","DOI":"10.1002\/admi.201900042"},{"key":"e_1_2_8_21_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3634052"},{"key":"e_1_2_8_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3045955"},{"key":"e_1_2_8_23_1","doi-asserted-by":"publisher","DOI":"10.1063\/5.0077840"},{"key":"e_1_2_8_24_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2021.151566"},{"key":"e_1_2_8_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2917032"},{"key":"e_1_2_8_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.3001639"},{"key":"e_1_2_8_27_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.0c15091"},{"key":"e_1_2_8_28_1","volume":"7","author":"Yang Y.","year":"2021","journal-title":"Sci. Adv."},{"key":"e_1_2_8_29_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6528\/aac6b3"},{"key":"e_1_2_8_30_1","doi-asserted-by":"publisher","DOI":"10.1039\/D2MH00340F"},{"key":"e_1_2_8_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3052306"},{"key":"e_1_2_8_32_1","doi-asserted-by":"publisher","DOI":"10.1039\/D1NR06525D"},{"key":"e_1_2_8_33_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2013.144"},{"key":"e_1_2_8_34_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3127175"},{"key":"e_1_2_8_35_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3079244"},{"key":"e_1_2_8_36_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3072915"},{"key":"e_1_2_8_37_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2020.129166"},{"key":"e_1_2_8_38_1","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.53.497"},{"key":"e_1_2_8_39_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2020.128087"},{"key":"e_1_2_8_40_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6641\/abf906"},{"key":"e_1_2_8_41_1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2022.3147386"},{"key":"e_1_2_8_42_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3047727"},{"key":"e_1_2_8_43_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2022.131398"},{"key":"e_1_2_8_44_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2869072"},{"key":"e_1_2_8_45_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202100179"},{"key":"e_1_2_8_46_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.3041515"},{"key":"e_1_2_8_47_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3079881"},{"key":"e_1_2_8_48_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2735945"},{"key":"e_1_2_8_49_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.365720"},{"key":"e_1_2_8_50_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.819254"},{"key":"e_1_2_8_51_1","unstructured":"H.WangM.YurochkinY.SunD.PapailiopoulosY.Khazaeni(preprint) arXiv:2002.064402020(accessed: February 2020)."},{"key":"e_1_2_8_52_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3168797"}],"container-title":["Advanced Intelligent Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aisy.202200377","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/aisy.202200377","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aisy.202200377","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,7]],"date-time":"2025-10-07T21:30:56Z","timestamp":1759872656000},"score":1,"resource":{"primary":{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/10.1002\/aisy.202200377"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1,27]]},"references-count":51,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2023,6]]}},"alternative-id":["10.1002\/aisy.202200377"],"URL":"https:\/\/doi.org\/10.1002\/aisy.202200377","archive":["Portico"],"relation":{},"ISSN":["2640-4567","2640-4567"],"issn-type":[{"value":"2640-4567","type":"print"},{"value":"2640-4567","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,1,27]]},"assertion":[{"value":"2022-10-25","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2023-01-27","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"2200377"}}