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These devices rely on light\u2010induced changes in conductance states, which are used to create synaptic weights for image recognition tasks in neural networks. However, a major drawback of such devices is the rapid decay of conductance states after light stimulus removal, which hinders their long\u2010term memory and performance without a continuous external stimulus in place. To address this issue, a platform neural network scheme is proposed to counter the natural decay of conductance in optoelectronic devices. The approach restores the memory effect of the devices and significantly enhances their performance by several orders of magnitude without using additional energy\u2010intensive techniques like training pulses or gate fields. Herein, the model is validated experimentally using optoelectronic devices fabricated with two different materials, BP and doped In<jats:sub>2<\/jats:sub>O<jats:sub>3<\/jats:sub>, and demonstrates the restoration of memory\/image retention ability to any material system being studied for optoelectronic synapses and vision. This approach has important implications for the practical application of neuromorphic visual processing technologies, bringing them closer to real\u2010world applications.<\/jats:p>","DOI":"10.1002\/aisy.202300069","type":"journal-article","created":{"date-parts":[[2023,4,18]],"date-time":"2023-04-18T23:11:36Z","timestamp":1681859496000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Adaptive Convolutional Neural Networks for Enhanced Memory Retention and Restoration in Optoelectronic Vision Devices"],"prefix":"10.1002","volume":"5","author":[{"given":"Thiha","family":"Aung","sequence":"first","affiliation":[{"name":"School of Engineering RMIT University  Melbourne VIC 3000 Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Taimur","family":"Ahmed","sequence":"additional","affiliation":[{"name":"Department of IT and Computer Science Pak-Austria Fachhochschule Institute of Applied Sciences and Technology  22620 Haripur Pakistan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Aishani","family":"Mazumder","sequence":"additional","affiliation":[{"name":"School of Engineering RMIT University  Melbourne VIC 3000 Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Aaron","family":"Elbourne","sequence":"additional","affiliation":[{"name":"School of Science RMIT University  Melbourne VIC 3000 Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Abhishek","family":"Ranjan","sequence":"additional","affiliation":[{"name":"School of Engineering Sapienza University of Rome  Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nitu","family":"Syed","sequence":"additional","affiliation":[{"name":"School of Engineering RMIT University  Melbourne VIC 3000 Australia"},{"name":"School of Physics The University of Melbourne  Parkville VIC 3010 Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Torben","family":"Daeneke","sequence":"additional","affiliation":[{"name":"School of Engineering RMIT University  Melbourne VIC 3000 Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chung Kim","family":"Nguyen","sequence":"additional","affiliation":[{"name":"School of Engineering RMIT University  Melbourne VIC 3000 Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Akram","family":"AI-Hourani","sequence":"additional","affiliation":[{"name":"School of Engineering RMIT University  Melbourne VIC 3000 Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3645-9847","authenticated-orcid":false,"given":"Sumeet","family":"Walia","sequence":"additional","affiliation":[{"name":"School of Engineering RMIT University  Melbourne VIC 3000 Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2023,4,18]]},"reference":[{"key":"e_1_2_8_2_1","doi-asserted-by":"publisher","DOI":"10.1002\/admt.202101494"},{"key":"e_1_2_8_3_1","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10222764"},{"key":"e_1_2_8_4_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-019-0501-3"},{"key":"e_1_2_8_5_1","doi-asserted-by":"publisher","DOI":"10.1186\/s43074-021-00026-0"},{"key":"e_1_2_8_6_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuron.2019.01.040"},{"key":"e_1_2_8_7_1","unstructured":"M.Rhu N.Gimelshein J.Clemons A.Zulfiqar S. 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