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To understand this, a dynamical model is developed, which links the internal physical mechanism to the current response. Thereby, the electronic current is calculated by tunneling processes over oxygen vacancies. The model allows to understand the physical transport properties and the current\u2013voltage dependence. Integrating ionic hopping processes clarifies the variability in the electronic conduction. The derived model does not require empirical input parameters and only depends on the properties of the materials. This allows to use literature values and independently compare them to electrical measurements. The model predicts the experiments correctly. Thereupon, the physical properties of the conduction are investigated with respect to the transport over discrete energy levels, which change under the hopping of oxygen vacancies. 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