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Subsequently, we incorporated RH_14T into the on\u2010board memory array in two variations: RH_14T with minimal area overhead (RH_14T_small) and RH_14T with substantial area overhead (RH_14T_large), which have critical charges of 30.10 and 38.77 fC, respectively. Given the higher sensitivity of higher order bits compared to lower order bits in image pixels, RH_14T_small was allocated for the least significant bit (LSB) positions. RH_14_large, on the other hand, was used for the most significant bit (MSB) positions within the memory array. This configuration enhanced the array's overall area, power, and space radiation tolerance. Furthermore, the RH_14T model was bench marked against other recently introduced radiation\u2010hardened SRAM cells and compared proposed RH_14T CC18T, RHC14T, RHMC12T, SARP12T, SRRD12T, DICE, and QUCCE12T across several critical design parameters. Notably, RH_14T's sensitive nodes can recover their original data even after radiation\u2010induced value flips. In addition to these benefits, RH_14T also demonstrates a high static voltage noise margin and reduced read and write delays compared to most of the cells it was compared with.<\/jats:p>","DOI":"10.1002\/cta.4426","type":"journal-article","created":{"date-parts":[[2025,1,12]],"date-time":"2025-01-12T17:54:15Z","timestamp":1736704455000},"page":"5562-5578","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Radiation\u2010Tolerant SRAM for Satellite Image Compression Systems: A Hybrid Memory Array Approach"],"prefix":"10.1002","volume":"53","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9926-2697","authenticated-orcid":false,"given":"Priyanka","family":"Sharma","sequence":"first","affiliation":[{"name":"Department of Electronics &amp; Telecommunication Institute of Engineering &amp; Technology  Indore Madhya Pradesh India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vaibhav","family":"Neema","sequence":"additional","affiliation":[{"name":"Department of Electronics &amp; Telecommunication Institute of Engineering &amp; Technology  Indore Madhya Pradesh India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shailesh","family":"Singh\u00a0Chouhan","sequence":"additional","affiliation":[{"name":"Department of Computer Science, Electrical and Space Engineering Lule\u00e5 University of Technology  Lule\u00e5 Norbotten Sweden"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nitesh","family":"Kumar\u00a0Soni","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering Medi\u2010Caps University  Indore Madhya Pradesh India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2025,1,12]]},"reference":[{"key":"e_1_2_10_2_1","doi-asserted-by":"publisher","DOI":"10.1080\/01431161003743199"},{"key":"e_1_2_10_3_1","doi-asserted-by":"publisher","DOI":"10.5194\/acp\u20109\u20101687\u20102009"},{"key":"e_1_2_10_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2006.888937"},{"key":"e_1_2_10_5_1","doi-asserted-by":"publisher","DOI":"10.1111\/1365\u20102664.12261"},{"key":"e_1_2_10_6_1","doi-asserted-by":"publisher","DOI":"10.3390\/s23020730"},{"key":"e_1_2_10_7_1","doi-asserted-by":"publisher","DOI":"10.1201\/9781003332312-6"},{"key":"e_1_2_10_8_1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.3429"},{"key":"e_1_2_10_9_1","doi-asserted-by":"publisher","DOI":"10.3390\/mi13081332"},{"key":"e_1_2_10_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2013.6507427"},{"key":"e_1_2_10_11_1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.3635"},{"key":"e_1_2_10_12_1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.3093"},{"key":"e_1_2_10_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/MAES.2020.3008468"},{"key":"e_1_2_10_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251342"},{"key":"e_1_2_10_15_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11277\u2010020\u201007953\u20104"},{"key":"e_1_2_10_16_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00542\u2010023\u201005500\u20102"},{"key":"e_1_2_10_17_1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.3635"},{"key":"e_1_2_10_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2098419"},{"key":"e_1_2_10_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/23.983153"},{"key":"e_1_2_10_20_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10489\u2010021\u201002789\u20102"},{"key":"e_1_2_10_21_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.matpr.2023.03.377"},{"key":"e_1_2_10_22_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.memori.2023.100028"},{"key":"e_1_2_10_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2931614"},{"key":"e_1_2_10_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2021.3049215"},{"key":"e_1_2_10_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/MIEL.2017.8190065"},{"key":"e_1_2_10_26_1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.3418"},{"key":"e_1_2_10_27_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2023.105691"},{"key":"e_1_2_10_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3147675"},{"key":"e_1_2_10_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3061642"},{"key":"e_1_2_10_30_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2023.105729"},{"key":"e_1_2_10_31_1","doi-asserted-by":"crossref","unstructured":"E.Farjallah V.Gherman J. 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