{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T05:15:57Z","timestamp":1698124557382},"reference-count":20,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2006,12,13]],"date-time":"2006-12-13T00:00:00Z","timestamp":1165968000000},"content-version":"vor","delay-in-days":5339,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Circuit Theory &amp; Apps"],"published-print":{"date-parts":[[1992,5]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>An analogue CAD tool capable of simulating MOS circuit performance variance caused by intra\u2010die variability inherent to IC fabrication processes has been developed. the nucleus of this tool is a general, CAD\u2010compatible, MOS statistical model called SMOS which comprehends the effects of device geometry, circuit layout and transistor bias on parameter variance. an example of the model calculation procedure is presented to illustrate both the modelling algorithms and the process characterization data required by the statistical model. the statistical model is verified through experimental data which show excellent agreement with performance variances predicted by simulation. Implementations of the statistical model in two circuit simulation environments, SPICE and APLAC, are also described. Statistical analysis and simulation of two basic analogue subcircuits, the current mirror and the source\u2010coupled pair, are presented.<\/jats:p>","DOI":"10.1002\/cta.4490200310","type":"journal-article","created":{"date-parts":[[2007,7,2]],"date-time":"2007-07-02T04:04:24Z","timestamp":1183349064000},"page":"327-348","source":"Crossref","is-referenced-by-count":8,"title":["SMOS: A CAD\u2010compatible statistical model for analogue mos integrated circuit simulation"],"prefix":"10.1002","volume":"20","author":[{"given":"Christopher","family":"Michael","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christopher","family":"Abel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammed","family":"Ismail","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2006,12,13]]},"reference":[{"key":"e_1_2_1_2_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052250"},{"key":"e_1_2_1_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1986.1052648"},{"key":"e_1_2_1_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"e_1_2_1_5_2","first-page":"186","article-title":"Statistical modelling for integrated circuits","volume":"129","author":"Rankin P. J.","year":"1982","journal-title":"Proc. IEE"},{"key":"e_1_2_1_6_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1984.1270055"},{"key":"e_1_2_1_7_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052319"},{"key":"e_1_2_1_8_2","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1985.22252"},{"key":"e_1_2_1_9_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1986.1270173"},{"key":"e_1_2_1_10_2","doi-asserted-by":"publisher","DOI":"10.1109\/66.24930"},{"key":"e_1_2_1_11_2","doi-asserted-by":"publisher","DOI":"10.1109\/4.75008"},{"key":"e_1_2_1_12_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052773"},{"key":"e_1_2_1_13_2","volume-title":"Common Principal Components and Related Multivariate Models","author":"Flury B.","year":"1988"},{"key":"e_1_2_1_14_2","volume-title":"Factor Analysis: an Applied Approach","author":"Cureton E. E.","year":"1983"},{"key":"e_1_2_1_15_2","volume-title":"Statistical Analysis: A Computer Oriented Approach","author":"Afifi A. A.","year":"1972"},{"key":"e_1_2_1_16_2","unstructured":"C.MichaelandM.Ismail Simulation of mismatch induced variance in short\u2010channel analog CMOS circuits' Proc. SRC TECHCON 1990 pp.351\u2013354."},{"key":"e_1_2_1_17_2","doi-asserted-by":"publisher","DOI":"10.1109\/4.127338"},{"key":"e_1_2_1_18_2","unstructured":"C.Michael Statistical modeling for computer\u2010aided design of analog MOS circuits' Ph.D. Dissertation the Ohio State University 1991."},{"key":"e_1_2_1_19_2","unstructured":"C.Michael A.Kankkunen H.SuandM.Ismail An analog CAD tool for statistical simulation of MOS circuits' to be published."},{"key":"e_1_2_1_20_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270305"},{"key":"e_1_2_1_21_2","unstructured":"APLAC\u2014an object\u2010oriented analog circuit simulator and design tool' Technical Rep. Helsinki University of Technology and Nokia Research Center 1991."}],"container-title":["International Journal of Circuit Theory and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fcta.4490200310","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/cta.4490200310","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,23]],"date-time":"2023-10-23T11:58:45Z","timestamp":1698062325000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/cta.4490200310"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1992,5]]},"references-count":20,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1992,5]]}},"alternative-id":["10.1002\/cta.4490200310"],"URL":"https:\/\/doi.org\/10.1002\/cta.4490200310","archive":["Portico"],"relation":{},"ISSN":["0098-9886","1097-007X"],"issn-type":[{"value":"0098-9886","type":"print"},{"value":"1097-007X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1992,5]]}}}