{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T21:45:25Z","timestamp":1780695925249,"version":"3.54.1"},"reference-count":37,"publisher":"Wiley","issue":"12","license":[{"start":{"date-parts":[[2025,4,10]],"date-time":"2025-04-10T00:00:00Z","timestamp":1744243200000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Circuit Theory &amp;amp; Apps"],"published-print":{"date-parts":[[2025,12]]},"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>This paper presents a new design of a BJT\u2010based temperature sensor in a \n CMOS, with an inaccuracy of \n. In order to achieve high accuracy, high reliability, and self\u2010detection capability in the sensor system, we mainly make following innovations. First, we adopt an improved chopper technique with two sub\u2010OPAMPs instead of one OPAMP traditionally. By applying programmable delay lines and real\u2010time calibration, we achieve precise phase control. This avoids the complete disconnection of the feedback loop and, thus, reduces residual ripples. Second, we propose a theory of substituting dynamic element matching (DEM) with complementary switch (COM\u2010DEM) for classical DEM to reduce the effect of channel charge injection. In order to satisfy both almost no leakage current during turn\u2010off and small voltage drop during turn\u2010on, we adopt a multithreshold design by connecting the HVT structure and the LVT structure in series. Moreover, we present a new 16\u2010bit zoom analog\u2010to\u2010digital converter (ADC) to obtain the temperature information. By adopting a new SAR ADC structure, which is centered on a folded cascode amplifier, to perform the coarse conversion, our design realizes both a high resolution and reliability. Finally, a 10\u2010bit SAR ADC is applied to detect the key indicators of the analog front\u2010end, thus achieving self\u2010detection. Based on improvements above, experiments show our design achieves an inaccuracy of only \n (\n) from \n to \n, a relatively better trimmed accuracy compared with other designs. Operating at 2\u2009V supply, it consumes \n and obtains a resolution of 4.65\u2009mk in a 4\u2009ms conversion time, showing a figure\u2010of\u2010merit (FOM) of 3.38 \n.<\/jats:p>","DOI":"10.1002\/cta.4554","type":"journal-article","created":{"date-parts":[[2025,4,10]],"date-time":"2025-04-10T22:21:06Z","timestamp":1744323666000},"page":"6788-6800","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["A Highly Accurate BJT\u2010Based Temperature Sensor With COM\u2010DEM and a Zoom ADC"],"prefix":"10.1002","volume":"53","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-9700-1255","authenticated-orcid":false,"given":"Ziqi","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Integrated Circuits Shandong University  Jinan China"},{"name":"Shenzhen Research Institute of Shandong University  Shenzhen China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yafei","family":"Ning","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits Shandong University  Jinan China"},{"name":"Shenzhen Research Institute of Shandong University  Shenzhen China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiameng","family":"Lu","sequence":"additional","affiliation":[{"name":"Macau University of Science and Technology Avenida WaiLong, Taipa  Macau China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuhan","family":"Xia","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering Nanyang Technological University  Singapore Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiming","family":"Wen","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits Shandong University  Jinan China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hu","family":"Li","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits Shandong University  Jinan China"},{"name":"Shenzhen Research Institute of Shandong University  Shenzhen China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2025,4,10]]},"reference":[{"key":"e_1_2_9_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2921450"},{"key":"e_1_2_9_3_1","doi-asserted-by":"crossref","unstructured":"R.Zhang S.Fan andL.Geng.A Near\u2010Zero\u2010Power Temperature Sensor With\u00b10.24\u00b0CInaccuracy Using Only Standard CMOS Transistors for IoT Applications. Proc. IEEE Int. Symp. Circuits Syst. (ISCAS).2018 1\u20134.","DOI":"10.1109\/ISCAS.2018.8351156"},{"key":"e_1_2_9_4_1","first-page":"300","volume-title":"Thermal and Power Management of Integrated Circuits","author":"Vassighi A.","year":"2006"},{"key":"e_1_2_9_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2022.105671"},{"key":"e_1_2_9_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2638464"},{"key":"e_1_2_9_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2953834"},{"key":"e_1_2_9_8_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2022.105429"},{"key":"e_1_2_9_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.841013"},{"key":"e_1_2_9_10_1","doi-asserted-by":"crossref","unstructured":"M. A. P.Pertijs A.Bakker andJ. H.Huijsing.A High\u2010Accuracy Temperature Sensor With Second\u2010Order Curvature Correction and Digital Bus Interface. Proc. ISCAS.2001 368\u2013371.","DOI":"10.1109\/ISCAS.2001.921869"},{"key":"e_1_2_9_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.858476"},{"key":"e_1_2_9_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/4.701277"},{"key":"e_1_2_9_13_1","first-page":"430","article-title":"A Gas Detection System on a Single CMOS Chip Comprising Capacitive, Calorimetric, and Mass\u2010Sensitive Microsensors","volume":"1","author":"Hagleitner C.","year":"2002","journal-title":"IEEE ISSCC Digest of Technical Papers"},{"key":"e_1_2_9_14_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3190-3"},{"key":"e_1_2_9_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2921889"},{"key":"e_1_2_9_16_1","first-page":"72","article-title":"A BJT\u2010Based CMOS Temperature Sensor Achieving an Inaccuracy of \n\u00b10.45\u00b0C (\n3\u03c3) From \n\u201050\u00b0C to \n180\u00b0C and a Resolution\u2010FoM of \n7.2pJ.K2 at \n150\u00b0C","volume":"65","author":"Wang B.","year":"2022","journal-title":"IEEE International Solid\u2010State Circuits Conference (ISSCC)"},{"key":"e_1_2_9_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3068283"},{"key":"e_1_2_9_18_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.498597"},{"key":"e_1_2_9_19_1","unstructured":"K.\u2010T.Lim S.\u2010J.Kim andO.\u2010K.Kwon.The OP\u2010Amplifier With Offset Cancellation Circuit. 2003 IEEE Conference on Electron Devices and Solid\u2010State Circuits (IEEE Cat. No.03TH8668).2003 445\u2013447."},{"key":"e_1_2_9_20_1","doi-asserted-by":"crossref","unstructured":"F.Lacerda S.Pietri andA.Olmos.A Differential Switched\u2010Capacitor Amplifier With Programmable Gain and Output Offset Voltage. Proceedings of the 19th annual symposium on Integrated circuits and systems design.2006 98\u2013102.","DOI":"10.1145\/1150343.1150373"},{"key":"e_1_2_9_21_1","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1949.tb03645.x"},{"key":"e_1_2_9_22_1","doi-asserted-by":"publisher","DOI":"10.1049\/el.2018.0555"},{"key":"e_1_2_9_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2214831"},{"key":"e_1_2_9_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1976.1050820"},{"key":"e_1_2_9_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2613938"},{"key":"e_1_2_9_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2008485"},{"key":"e_1_2_9_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3085587"},{"key":"e_1_2_9_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/4.818927"},{"key":"e_1_2_9_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/NORCHP.2008.4738286"},{"key":"e_1_2_9_30_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3247434"},{"key":"e_1_2_9_31_1","doi-asserted-by":"crossref","unstructured":"Y.\u2010D.Kim J.\u2010H.Chung andK. E.Lozada et\u00a0al.A 100kHz\u2010BW 99dB\u2010DR Continuous\u2010Time Tracking\u2010Zoom Incremental ADC With Residue\u2010Gain Switching and Digital NC\u2010FF. 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).1\u20132.","DOI":"10.1109\/VLSITechnologyandCir46783.2024.10631347"},{"key":"e_1_2_9_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2954082"},{"key":"e_1_2_9_33_1","doi-asserted-by":"crossref","unstructured":"S.Zhou N.Liu andP.Ding.Architecture Analysis and Simulink Modeling of a High Resolution Zoom ADC.20238th International Conference on Integrated Circuits and Microsystems (ICICM).295\u2013300.","DOI":"10.1109\/ICICM59499.2023.10365867"},{"key":"e_1_2_9_34_1","doi-asserted-by":"crossref","unstructured":"X.Zhang F.Qian andJ.Xi et\u00a0al.A BJT\u2010Based Fully Integrated 16\u2010Bit ZOOM Temperature Sensor With an Inaccuracy of0.28\u00b0C(3\u03c3) From\u221240\u00b0Cto125\u00b0CUsing Improved 1\u2010Point Calibration. IEEE International Symposium on Circuits and Systems (ISCAS)2024 1\u20135.","DOI":"10.1109\/ISCAS58744.2024.10558646"},{"key":"e_1_2_9_35_1","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC56115.2022.9980768"},{"key":"e_1_2_9_36_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2987595"},{"key":"e_1_2_9_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC47793.2019.9056962"},{"key":"e_1_2_9_38_1","volume-title":"2018 IEEE International Solid\u2010State Circuits Conference\u2010(ISSCC)","author":"Lu C.\u2010Y.","year":"2018"}],"container-title":["International Journal of Circuit Theory and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/cta.4554","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T04:41:20Z","timestamp":1765341680000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/cta.4554"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4,10]]},"references-count":37,"journal-issue":{"issue":"12","published-print":{"date-parts":[[2025,12]]}},"alternative-id":["10.1002\/cta.4554"],"URL":"https:\/\/doi.org\/10.1002\/cta.4554","archive":["Portico"],"relation":{},"ISSN":["0098-9886","1097-007X"],"issn-type":[{"value":"0098-9886","type":"print"},{"value":"1097-007X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4,10]]},"assertion":[{"value":"2024-09-29","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-04-02","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-04-10","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}