{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T00:49:35Z","timestamp":1779324575028,"version":"3.51.4"},"reference-count":47,"publisher":"Wiley","issue":"2","license":[{"start":{"date-parts":[[2025,5,12]],"date-time":"2025-05-12T00:00:00Z","timestamp":1747008000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"},{"start":{"date-parts":[[2025,5,12]],"date-time":"2025-05-12T00:00:00Z","timestamp":1747008000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Circuit Theory &amp; Apps"],"published-print":{"date-parts":[[2026,2]]},"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    A set of measurement techniques that can find multiple DC operating points, as well as explore regions of operation that are unobservable with traditional experimental methods, is described. These techniques are particularly useful for transistor circuits that exhibit hysteresis, S\u2010 and N\u2010type current\u2010versus\u2010voltage curves and multiple DC operating points (typically with different physical stability properties). These techniques are the experimental version of well\u2010known homotopy techniques used in the simulation of DC operating points and can be applied\n                    <jats:italic>without<\/jats:italic>\n                    access to a numerical simulation model. Such numerical simulation techniques used to identify and describe such behaviors are also surveyed and compared with the measurement techniques described herein.\n                  <\/jats:p>","DOI":"10.1002\/cta.4602","type":"journal-article","created":{"date-parts":[[2025,5,12]],"date-time":"2025-05-12T03:36:11Z","timestamp":1747020971000},"page":"1135-1150","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["A Continuation Method\u2010Based Approach for Measuring the DC Behavior of Nonlinear Circuits"],"prefix":"10.1002","volume":"54","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-7264-4465","authenticated-orcid":false,"given":"Robert\u00a0C.","family":"Melville","sequence":"first","affiliation":[{"name":"Emecon, LLC  Berkeley Heights New Jersey USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4134-1875","authenticated-orcid":false,"given":"Michael\u00a0M.","family":"Green","sequence":"additional","affiliation":[{"name":"Department of EECS University of California  Irvine California USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2025,5,12]]},"reference":[{"key":"e_1_2_11_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1985.1085760"},{"key":"e_1_2_11_3_1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.4490040302"},{"key":"e_1_2_11_4_1","first-page":"1225","article-title":"Bifurcation Analysis of Nonlinear Resistive Circuits by Curve Tracing Methods","volume":"78","author":"Jiang L.","year":"1995","journal-title":"IEICE Transactions"},{"key":"e_1_2_11_5_1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.4490110205"},{"key":"e_1_2_11_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/81.678477"},{"key":"e_1_2_11_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.365126"},{"key":"e_1_2_11_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2693208"},{"key":"e_1_2_11_9_1","doi-asserted-by":"crossref","unstructured":"L. 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