{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,23]],"date-time":"2023-10-23T07:40:02Z","timestamp":1698046802749},"reference-count":11,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2008,9,12]],"date-time":"2008-09-12T00:00:00Z","timestamp":1221177600000},"content-version":"vor","delay-in-days":6709,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Trans Emerging Tel Tech"],"published-print":{"date-parts":[[1990,5]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>The Spurious Response phenomenon in a typical superheterodyne receiver, caused by one or more interfering transmitters, is analyzed. Particularly, a suitable model of superheterodyne receiver and the algorithm for the interference level computation is presented. The new approach to the Electromagnetic Interference (EMI) problem, above mentioned, is given by the algorithm for the evaluation of the spurious response rejection parameter: \u03b2<jats:sub>st<\/jats:sub>. In this way it is possible to evaluate the interference level of a victim receiver without using complex measurement procedures.<\/jats:p>","DOI":"10.1002\/ett.4460010306","type":"journal-article","created":{"date-parts":[[2008,9,12]],"date-time":"2008-09-12T13:03:17Z","timestamp":1221224597000},"page":"265-276","source":"Crossref","is-referenced-by-count":0,"title":["A mathematical model for the evaluation of spurious response interference in a superheterodyne receiver"],"prefix":"10.1002","volume":"1","author":[{"given":"Giuseppe","family":"De Franco","sequence":"first","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2008,9,12]]},"reference":[{"key":"e_1_2_1_2_2","volume-title":"A handbook series on electromagnetic interference and compatibility","author":"Duff W. G.","year":"1972"},{"key":"e_1_2_1_3_2","unstructured":"J. W.Rockway S. T.Li D. E.Baron W.Kowalyskin:Design communication algorithm (DECAL). IEEE Symp. 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