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However, the degradation model may be mis\u2010specified. A SSADT design problem under model mis\u2010specification scenario remains underexplored. In this study, we investigate the effect of model misspecification on the optimal plan when the true model comes from Tweedie exponential dispersion (TED) process with random effect, but is wrongly assumed to be Wiener, Gamma, and inverse Gaussian processes with random effect respectively. We derive the asymptotic variance of mean time\u2010to\u2010failure (MTTF) and minimize it under cost constraints to optimize plan. Finally, a numerical example involving LED chip data set is used to illustrate the method's practicality. Results show that, when the mis\u2010specified model is close to the true model, the corresponding optimal plans and properties under the mis\u2010specified model are close to those under the true model. In addition, when the mis\u2010specified model is far from the true model, the corresponding optimal plans are different from those under the true model, and the plans under the mis\u2010specified model show a certain robustness, which may be dominated by the effects of model mis\u2010specification.<\/jats:p>","DOI":"10.1002\/qre.70065","type":"journal-article","created":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T08:45:43Z","timestamp":1757321143000},"page":"237-253","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Optimal Planning of Step\u2010Stress Accelerated Degradation Test Based on Tweedie Exponential Dispersion Process With Model Misspecification"],"prefix":"10.1002","volume":"42","author":[{"given":"Weian","family":"Yan","sequence":"first","affiliation":[{"name":"School of Advanced Manufacturing Nanchang University  Nanchang China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7592-8384","authenticated-orcid":false,"given":"Qian","family":"He","sequence":"additional","affiliation":[{"name":"School of Transportation Engineering East China Jiaotong University  Nanchang Jiangxi China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weidong","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Advanced Manufacturing Nanchang University  Nanchang China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chunzhi","family":"Li","sequence":"additional","affiliation":[{"name":"School of Transportation Engineering East China Jiaotong University  Nanchang Jiangxi China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2025,9,8]]},"reference":[{"key":"e_1_2_9_2_1","volume-title":"Statistical Methods for Reliability Data","author":"Meeker W. 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