{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,21]],"date-time":"2023-10-21T06:10:25Z","timestamp":1697868625928},"reference-count":9,"publisher":"Wiley","issue":"6","license":[{"start":{"date-parts":[[2007,3,21]],"date-time":"2007-03-21T00:00:00Z","timestamp":1174435200000},"content-version":"vor","delay-in-days":7749,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems &amp;amp; Computers in Japan"],"published-print":{"date-parts":[[1986,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>As the social missions of computer systems increase, it becomes more important to develop high\u2010reliability software. For this reason software systems are tested repeatedly to remove latent errors in the testing phase during software development. One of the most interesting methods is to evaluate software reliability by using test data observed in the error\u2010detection process. In this paper we model the error\u2010detection process as a stochastic model and introduce several effective measures to evaluate software reliability. In modeling we use the number of test run trials as a unit of the error\u2010detection period and assume that the cumulative number of software errors detected in an arbitrary testing time interval is a nonhomogeneous Poisson process. Further, we consider the difficulty of error detection because the reliability of software is evaluated from the characteristics and frequency of the errors. Applying the model to the actual test data, we perform the goodness\u2010of\u2010fit test and infer the software reliability measures. Finally, we discuss an optimum software release problem based on the software reliability index.<\/jats:p>","DOI":"10.1002\/scj.4690170606","type":"journal-article","created":{"date-parts":[[2007,7,7]],"date-time":"2007-07-07T12:03:35Z","timestamp":1183809815000},"page":"50-56","source":"Crossref","is-referenced-by-count":0,"title":["A discrete software reliability growth model with two types of errors"],"prefix":"10.1002","volume":"17","author":[{"given":"Takeshi","family":"Kitaoka","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shigeru","family":"Yamada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shunji","family":"Osaki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2007,3,21]]},"reference":[{"key":"e_1_2_1_2_2","first-page":"4","article-title":"Software reliability\u2010status and perspectives","volume":"8","author":"Ramamoorthy C. V.","year":"1982","journal-title":"I.E.E.E. Trans. Softw. Eng."},{"key":"e_1_2_1_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"},{"key":"e_1_2_1_4_2","first-page":"5","article-title":"Theories of software reliability: How good are they and how can they be improved","volume":"6","author":"Littlewood B.","year":"1980","journal-title":"I.E.E.E. Trans. Softw. Eng."},{"key":"e_1_2_1_5_2","first-page":"9","article-title":"The measurement and management of software reliability","volume":"68","author":"Musa J. D.","year":"1980","journal-title":"Proc. I.E.E.E."},{"key":"e_1_2_1_6_2","first-page":"2","article-title":"Software reliability growth modeling with number of test runs","volume":"67","author":"Yamada S.","year":"1984","journal-title":"Trans. I.E.C.E., Japan (Section E)"},{"key":"e_1_2_1_7_2","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(83)91372-0"},{"key":"e_1_2_1_8_2","doi-asserted-by":"crossref","unstructured":"A. L.GoelandK.Okumoto. A time dependent error detection rate model for software performance assessment with applications Technical Report Syracuse University New York (1980).","DOI":"10.21236\/ADA088186"},{"key":"e_1_2_1_9_2","first-page":"2","article-title":"A note on optimum release times for software systems","volume":"66","author":"Yamada","year":"1983","journal-title":"Trans. I.E.C.E., Japan"},{"key":"e_1_2_1_10_2","first-page":"6","article-title":"Inflection S\u2010shaped software reliability growth model","volume":"28","author":"Ohba","year":"1983","journal-title":"IPS\u2010Japan Proc. WGSE Meeting"}],"container-title":["Systems and Computers in Japan"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fscj.4690170606","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/scj.4690170606","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,20]],"date-time":"2023-10-20T16:59:53Z","timestamp":1697821193000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/scj.4690170606"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1986,1]]},"references-count":9,"journal-issue":{"issue":"6","published-print":{"date-parts":[[1986,1]]}},"alternative-id":["10.1002\/scj.4690170606"],"URL":"https:\/\/doi.org\/10.1002\/scj.4690170606","archive":["Portico"],"relation":{},"ISSN":["0882-1666","1520-684X"],"issn-type":[{"value":"0882-1666","type":"print"},{"value":"1520-684X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1986,1]]}}}