{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,22]],"date-time":"2023-10-22T20:43:37Z","timestamp":1698007417130},"reference-count":8,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2007,3,21]],"date-time":"2007-03-21T00:00:00Z","timestamp":1174435200000},"content-version":"vor","delay-in-days":7384,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems &amp; Computers in Japan"],"published-print":{"date-parts":[[1987,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>In the fabrication processor of electronic components, the outlook inspection has been performed primarily by visual observation. The automation of this process is presently considered important. This paper describes automatic defect detection considering the stamped pattern on the surface of the electronic parts on the integrated circuit, etc. The only clue to the information on the kind of electronics part is the characters and symbols stamped on its surface. In this sense, the stamped pattern is considered as a part of the part quality. Some defects of the stamped pattern are the disappearance, lack of a part, and dirt. The feature of these defects are discussed first. The fixed\u2010point sampling is considered which detects the existence of the character pattern at the observation point. The method is modified so that the decision can be made at the observation point along the stroke. Furthermore, a character defect detection system is proposed which can shift the observation point in horizontal and vertical directions so that the system can cope with the variation of the position of the character. A dedicated image processing device was developed to perform the defect detection with high speed. The architecture and the operation of the system are described. The system is advantageous in that the high\u2010speed operation is realized by the pipeline control for a series of processings, from the parallel read\u2010out of the local patterns in the image memory to the matching operation. Finally, the configuration of the experimental system is described and the results are shown for the automatic outlook inspection for the stamped pattern of the actual electronic part, thereby indicating the usefulness of the proposed system.<\/jats:p>","DOI":"10.1002\/scj.4690180108","type":"journal-article","created":{"date-parts":[[2007,7,7]],"date-time":"2007-07-07T12:32:04Z","timestamp":1183811524000},"page":"79-90","source":"Crossref","is-referenced-by-count":2,"title":["Defect detection method for stamped patterns utilizing random access parallel matching technique"],"prefix":"10.1002","volume":"18","author":[{"given":"Yoshihiro","family":"Shima","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seiji","family":"Kashioka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshikazu","family":"Yasue","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2007,3,21]]},"reference":[{"key":"e_1_2_1_2_2","article-title":"Development of stamp inspection method","volume":"1265","author":"Kashioka S.","year":"1980","journal-title":"Nat. Conv. I. E. C. E., Japan"},{"key":"e_1_2_1_3_2","article-title":"Construction of experimental stamp inspection device","volume":"1266","author":"Shima Y.","year":"1980","journal-title":"Nat. Conv. I. E. C. E., Japan"},{"key":"e_1_2_1_4_2","first-page":"89","article-title":"Defect detection system for complex patterns","volume":"14","author":"Mese M.","year":"1974","journal-title":"Trans. I. E. E., Japan"},{"key":"e_1_2_1_5_2","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1976.4309551"},{"key":"e_1_2_1_6_2","first-page":"28","volume-title":"Character and figure recognition machines","author":"Sakai T.","year":"1967"},{"key":"e_1_2_1_7_2","article-title":"Construction of experimental parallel image processing device","volume":"76","author":"Mori K.","year":"1977","journal-title":"Tech. Rep."},{"issue":"4","key":"e_1_2_1_8_2","first-page":"208","article-title":"A high\u2010speed pattern processing system for three\u2010dimensional object","volume":"58","author":"Yachida M.","year":"1979","journal-title":"Trans. (D) I. E. C. E., Japan"},{"key":"e_1_2_1_9_2","article-title":"Development of image processing device using array structure","volume":"78","author":"Matsushima H.","year":"1978","journal-title":"Tech. Rep. I. E. C. E., Japan"}],"container-title":["Systems and Computers in Japan"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fscj.4690180108","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/scj.4690180108","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,21]],"date-time":"2023-10-21T03:29:44Z","timestamp":1697858984000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/scj.4690180108"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1987,1]]},"references-count":8,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1987,1]]}},"alternative-id":["10.1002\/scj.4690180108"],"URL":"https:\/\/doi.org\/10.1002\/scj.4690180108","archive":["Portico"],"relation":{},"ISSN":["0882-1666","1520-684X"],"issn-type":[{"value":"0882-1666","type":"print"},{"value":"1520-684X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1987,1]]}}}