{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,22]],"date-time":"2023-10-22T20:43:37Z","timestamp":1698007417490},"reference-count":9,"publisher":"Wiley","issue":"9","license":[{"start":{"date-parts":[[2007,3,21]],"date-time":"2007-03-21T00:00:00Z","timestamp":1174435200000},"content-version":"vor","delay-in-days":7384,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems &amp; Computers in Japan"],"published-print":{"date-parts":[[1987,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>The increasing time for functional testing of the logical circuit has become a problem in recent years. As a solution a built\u2010in test is proposed as a means to make testing easier. In the proposed method, the testing circuit is built in the IC chip, and the test is executed within the chip to verify whether the function is fault\u2010free. This paper proposes a new built\u2010in test for the semiconductor memory by considering its internal operation. In the method, all the data from memory cells on the same word\u2010line can be treated at the same time, using the built\u2010in test circuit in the chip. As a result, the length of the test sequence is of the order of <jats:italic>N<\/jats:italic><jats:sup>1\/2<\/jats:sup>, realizing a high\u2010speed testing. Another feature is that the tests for the memory\u2010cell array and the decoder can be executed independently, making it possible to cope with the multiple fault in those circuits. The built\u2010in test circuit can be implemented in a relatively simple way, and the extra hardware overhead becomes almost negligible with the increase of the memory capacity.<\/jats:p>","DOI":"10.1002\/scj.4690180907","type":"journal-article","created":{"date-parts":[[2007,7,7]],"date-time":"2007-07-07T14:22:12Z","timestamp":1183818132000},"page":"64-73","source":"Crossref","is-referenced-by-count":0,"title":["A built\u2010in test for functional testing in semiconductor random access memory"],"prefix":"10.1002","volume":"18","author":[{"given":"Yukiya","family":"Miura","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hideo","family":"Tamamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuichi","family":"Narita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2007,3,21]]},"reference":[{"key":"e_1_2_1_2_2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675150"},{"key":"e_1_2_1_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675739"},{"key":"e_1_2_1_4_2","doi-asserted-by":"publisher","DOI":"10.1145\/356914.356916"},{"key":"e_1_2_1_5_2","unstructured":"T.Sridhar.A new parallel test approach for large memories Proc. 1985 Int'l Test Conf. pp.462\u2013470(1985)."},{"key":"e_1_2_1_6_2","doi-asserted-by":"publisher","DOI":"10.1016\/0167-9260(84)90030-0"},{"key":"e_1_2_1_7_2","unstructured":"K.KinoshitaandK. K.Saluja.Built\u2010in testing of memory chips Technical Report No. EE8335 University of Newcastle (1983)."},{"key":"e_1_2_1_8_2","article-title":"Built\u2010in memory testing by compact testing method","volume":"11","author":"Kinoshita K.","year":"1981","journal-title":"Tech. Rep. Elect. Device, Inf. Proc. Soc. Jap."},{"key":"e_1_2_1_9_2","unstructured":"M.Nicolaidis.An efficient built\u2010in self test scheme for functional test of embedded RAMs Proc. 15th Fault\u2010Tolerant Computing pp.118\u2013123(June1985)."},{"issue":"6","key":"e_1_2_1_10_2","first-page":"427","article-title":"Testing mechanism for compressing testing data","volume":"61","author":"Fujiwara","year":"1978","journal-title":"Trans. (D), I. E. C. E., Japan"}],"container-title":["Systems and Computers in Japan"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fscj.4690180907","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/scj.4690180907","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,21]],"date-time":"2023-10-21T06:41:37Z","timestamp":1697870497000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/scj.4690180907"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1987,1]]},"references-count":9,"journal-issue":{"issue":"9","published-print":{"date-parts":[[1987,1]]}},"alternative-id":["10.1002\/scj.4690180907"],"URL":"https:\/\/doi.org\/10.1002\/scj.4690180907","archive":["Portico"],"relation":{},"ISSN":["0882-1666","1520-684X"],"issn-type":[{"value":"0882-1666","type":"print"},{"value":"1520-684X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1987,1]]}}}