{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,22]],"date-time":"2023-10-22T06:11:04Z","timestamp":1697955064087},"reference-count":5,"publisher":"Wiley","issue":"2","license":[{"start":{"date-parts":[[2007,3,21]],"date-time":"2007-03-21T00:00:00Z","timestamp":1174435200000},"content-version":"vor","delay-in-days":6653,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems &amp;amp; Computers in Japan"],"published-print":{"date-parts":[[1989,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Binary image pattern matching is used widely in character and symbol recognition, and to determine pattern positions [1, 2].<\/jats:p><jats:p>Binary level deviation and superposition of noise have been reported as the causes of inaccuracy in matching between the template and image patterns. As a result, measures have been reported to solve this problem. However, these measures have not been entirely effective. There still remain problems of pattern change due to sampling deviation and error in matching caused by this change.<\/jats:p><jats:p>This paper presents a method to prevent sampling errors by using Boke processing [3, 4]. Also, the matching errors which occur due to binary pattern sampling are analyzed and measures to reduce them are proposed.<\/jats:p>","DOI":"10.1002\/scj.4690200201","type":"journal-article","created":{"date-parts":[[2007,7,7]],"date-time":"2007-07-07T17:30:17Z","timestamp":1183829417000},"page":"1-14","source":"Crossref","is-referenced-by-count":0,"title":["Analysis and evaluation of sampling methods in binary pattern matching"],"prefix":"10.1002","volume":"20","author":[{"given":"Seiji","family":"Kashioka","sequence":"first","affiliation":[]},{"given":"Masakazu","family":"Ejiri","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2007,3,21]]},"reference":[{"issue":"1","key":"e_1_2_1_2_2","first-page":"9","article-title":"A transistor assembly system with a group control based on a recognition technique for time division pattern","volume":"96","author":"Kashioka Ejiri","year":"1976","journal-title":"Journal of Institute of Electrical Engineers of Japan (C)"},{"key":"e_1_2_1_3_2","doi-asserted-by":"crossref","unstructured":"S.Kashioka.Local pattern matching technique and its application to semiconductor production. SPIE 336\u2013Robot Vision pp.113\u201329(May1982).","DOI":"10.1117\/12.933618"},{"issue":"5","key":"e_1_2_1_4_2","first-page":"668","article-title":"Theory of character recognition by matching methods","volume":"56","author":"Tijima Yasukura","year":"1973","journal-title":"Jour. I.E.C.E., Japan"},{"issue":"2","key":"e_1_2_1_5_2","first-page":"224","article-title":"A revision for a correlation method for character recognition: a proposal of a feature extraction method by supplementary phases","volume":"67","author":"Yasuda","year":"1984","journal-title":"Trans. I.E.C.E., Japan (D)"},{"key":"e_1_2_1_6_2","first-page":"1103","article-title":"A selection of a standard in partial pattern matchings","volume":"68","author":"Kashioka Shima","year":"1985","journal-title":"TRans. I.E.C.E., Japan (D)"}],"container-title":["Systems and Computers in Japan"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fscj.4690200201","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/scj.4690200201","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,22]],"date-time":"2023-10-22T01:53:09Z","timestamp":1697939589000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/scj.4690200201"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1989,1]]},"references-count":5,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1989,1]]}},"alternative-id":["10.1002\/scj.4690200201"],"URL":"https:\/\/doi.org\/10.1002\/scj.4690200201","archive":["Portico"],"relation":{},"ISSN":["0882-1666","1520-684X"],"issn-type":[{"value":"0882-1666","type":"print"},{"value":"1520-684X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1989,1]]}}}