{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,23]],"date-time":"2023-10-23T05:06:01Z","timestamp":1698037561414},"reference-count":11,"publisher":"Wiley","issue":"8","license":[{"start":{"date-parts":[[2007,3,21]],"date-time":"2007-03-21T00:00:00Z","timestamp":1174435200000},"content-version":"vor","delay-in-days":6653,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems &amp;amp; Computers in Japan"],"published-print":{"date-parts":[[1989,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Central Research Laboratory, Hitachi, Ltd., Kokubunji, Japan 185<\/jats:p><jats:p>One of the most important problems in the quality inspection of printed characters, monitoring of printing devices, and evaluation of character recognition devices, is the automatic quality evaluation of the printed character for the character patterns stamped on the object surface or on a paper sheet. This paper considers the characters stamped on the surface of an electronic part such as transistor and integrated circuit, and reports on the result of comparison of defect detection methods for the automatic outlook inspection. First, properties of the stamped pattern, which is the object of inspection, are described, indicating the problems in detecting the defects such as lack, smudge and blur. Then three realizations of the defect detection are proposed: (1) a weighted matching is made with the reference pattern; (2) the reference pattern is divided spatially, and the matching is tried for the divided patterns; and (3) essential points are extracted from the core and background portions of the character, and a local pattern matching is tried. Finally, those defect detection methods are implemented on a computer, and an experiment was made for the actual stamped patterns on the transistor. The results for those methods are compared, and their effectiveness and the range of applications are indicated.<\/jats:p>","DOI":"10.1002\/scj.4690200805","type":"journal-article","created":{"date-parts":[[2007,7,7]],"date-time":"2007-07-07T18:37:57Z","timestamp":1183833477000},"page":"48-58","source":"Crossref","is-referenced-by-count":1,"title":["Consideration on automatic defect detection algorithm for stamped patterns in electronic parts"],"prefix":"10.1002","volume":"20","author":[{"given":"Yoshihiro","family":"Shima","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seiji","family":"Kashioka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshikazu","family":"Yasue","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2007,3,21]]},"reference":[{"key":"e_1_2_1_2_2","article-title":"Development of stamp inspection method","volume":"1265","author":"Kashioka S.","year":"1980","journal-title":"Nat. Conv. Gen. I.E.C.I.E., Japan"},{"key":"e_1_2_1_3_2","article-title":"Experimental construction of stamp inspection system","volume":"1266","author":"Shima Y.","year":"1980","journal-title":"Nat. Conv. Gen. I.E.C.I.E., Japan"},{"issue":"12","key":"e_1_2_1_4_2","first-page":"89","article-title":"Defect detection system for complex patterns","volume":"49","author":"Mase M.","year":"1974","journal-title":"Trans. I.E.E., Japan"},{"key":"e_1_2_1_5_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1980.4766975"},{"key":"e_1_2_1_6_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1983.4767453"},{"issue":"4","key":"e_1_2_1_7_2","first-page":"225","article-title":"Evaluation of mass\u2010printed character quality","volume":"13","author":"Yamazaki","year":"1972","journal-title":"Inf. Proc."},{"key":"e_1_2_1_8_2","unstructured":"JIS C 5253.Printed character specification for optical character recognition. Jap. Assoc. Spc. (Feb.1977)."},{"key":"e_1_2_1_9_2","doi-asserted-by":"publisher","DOI":"10.1016\/0031-3203(74)90017-X"},{"key":"e_1_2_1_10_2","doi-asserted-by":"publisher","DOI":"10.1016\/0031-3203(77)90026-7"},{"key":"e_1_2_1_11_2","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1976.4309551"},{"issue":"3","key":"e_1_2_1_12_2","first-page":"417","article-title":"Defect detection of stamped pattern by parallel extraction matching of sub\u2010images","volume":"69","author":"Shima Y.","year":"1986","journal-title":"Trans. (D) I.E.C.I.E., Japan"}],"container-title":["Systems and Computers in Japan"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fscj.4690200805","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/scj.4690200805","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,22]],"date-time":"2023-10-22T07:56:44Z","timestamp":1697961404000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/scj.4690200805"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1989,1]]},"references-count":11,"journal-issue":{"issue":"8","published-print":{"date-parts":[[1989,1]]}},"alternative-id":["10.1002\/scj.4690200805"],"URL":"https:\/\/doi.org\/10.1002\/scj.4690200805","archive":["Portico"],"relation":{},"ISSN":["0882-1666","1520-684X"],"issn-type":[{"value":"0882-1666","type":"print"},{"value":"1520-684X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1989,1]]}}}