{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T07:40:02Z","timestamp":1698133202540},"reference-count":7,"publisher":"Wiley","issue":"9","license":[{"start":{"date-parts":[[2007,3,21]],"date-time":"2007-03-21T00:00:00Z","timestamp":1174435200000},"content-version":"vor","delay-in-days":5923,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems &amp; Computers in Japan"],"published-print":{"date-parts":[[1991,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>A diagnosis method for single bridging faults in combinational circuits is proposed. In this method the cause of an error observed at the outputs is analyzed using a diagnosis table constructed based on the circuit and its test patterns. The size of the diagnosis table is proportional to the number of nets the number of tests and much smaller than the fault dictionary.<\/jats:p><jats:p>The results of experiments conducted using the test patterns for single stuck\u2010at faults show that the testing time is nearly proportional to the size of the circuit and that the number of possible fault locations can be reduced to 20 to 30. Hence, it is expected that by conducting fault simulations for those fault possibilities, a maximal resolution can be obtained within a reasonable amount of computation time.<\/jats:p>","DOI":"10.1002\/scj.4690220905","type":"journal-article","created":{"date-parts":[[2007,11,14]],"date-time":"2007-11-14T12:17:07Z","timestamp":1195042627000},"page":"43-51","source":"Crossref","is-referenced-by-count":1,"title":["Method of diagnosing single bridging faults in combinational circuit"],"prefix":"10.1002","volume":"22","author":[{"given":"Teruhiko","family":"Yamada","sequence":"first","affiliation":[]},{"given":"Kouji","family":"Yamazaki","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2007,3,21]]},"reference":[{"key":"e_1_2_1_2_2","volume-title":"Fault Diagnosis of Digital Systems","author":"Chang H. Y.","year":"1970"},{"key":"e_1_2_1_3_2","doi-asserted-by":"crossref","unstructured":"M.AbramoviciandM. A.Breuer.Fault diagnosis based on effect\u2010cause analysis: An introduction. Proc. 17th DAC pp.69\u201376(June1980).","DOI":"10.1145\/800139.804514"},{"key":"e_1_2_1_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1986.294966"},{"key":"e_1_2_1_5_2","unstructured":"N.Yamaguchi T.Sato H.Todokoro Y.Hagiwara andT.Sakamoto.Investigation of a VLSI fault diagnosis method using electronbeam tester. I.E.C.E. Tech. Report FTS89\u201012 (June1989)."},{"key":"e_1_2_1_6_2","article-title":"A bridging fault diagnosis method for combinational circuits","volume":"10","author":"Yamazaki K.","year":"1989","journal-title":"Proc. I.E.C.E. National Conference"},{"key":"e_1_2_1_7_2","first-page":"963","article-title":"Testing for bridging faults in combinational logic circuits","volume":"64","author":"Yamada T.","year":"1981","journal-title":"I.E.C.E. Trans. (D)"},{"key":"e_1_2_1_8_2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676174"}],"container-title":["Systems and Computers in Japan"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fscj.4690220905","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/scj.4690220905","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,23]],"date-time":"2023-10-23T02:38:32Z","timestamp":1698028712000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/scj.4690220905"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1991,1]]},"references-count":7,"journal-issue":{"issue":"9","published-print":{"date-parts":[[1991,1]]}},"alternative-id":["10.1002\/scj.4690220905"],"URL":"https:\/\/doi.org\/10.1002\/scj.4690220905","archive":["Portico"],"relation":{},"ISSN":["0882-1666","1520-684X"],"issn-type":[{"value":"0882-1666","type":"print"},{"value":"1520-684X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1991,1]]}}}