{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,18]],"date-time":"2025-01-18T17:40:01Z","timestamp":1737222001061,"version":"3.33.0"},"reference-count":13,"publisher":"Wiley","issue":"10","license":[{"start":{"date-parts":[[2007,3,22]],"date-time":"2007-03-22T00:00:00Z","timestamp":1174521600000},"content-version":"vor","delay-in-days":5924,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems &amp;amp; Computers in Japan"],"published-print":{"date-parts":[[1991,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>This paper considers a method of detecting a fault in the TTL combinational circuit based on the supply current flowing into the circuit. The authors have proposed a fault detection method for the combinational circuit based on the supply current and indicated the feasibility of fault detection. However, the method proposed in the past is based only on the supply current waveform, and it is required to determine the feature vectors for all the measured supply currents. Consequently, to apply the method to the practical fault detection of logic circuits, the computational complexity as well as the computation time in determining the feature vector should be reduced.<\/jats:p><jats:p>From such a viewpoint, this paper proposes the following method of fault detection. Whether or not a fault exists is determined first by the average, the maximum and the minimum of the supply current. Only for the supply current waveform, which cannot be decided as the nonfaulty circuit, is the feature vector employed to make a further decision using the pattern recognition technique. The effectiveness of the method is demonstrated experimentally for the TTL logic circuit. Also, an algorithm is presented which can determine, from the set of faults, the fault for the reference pattern of the supply current.<\/jats:p>","DOI":"10.1002\/scj.4690221003","type":"journal-article","created":{"date-parts":[[2007,7,7]],"date-time":"2007-07-07T19:34:49Z","timestamp":1183836889000},"page":"18-29","source":"Crossref","is-referenced-by-count":3,"title":["Fault detection of ttl combinational circuits based on supply current"],"prefix":"10.1002","volume":"22","author":[{"given":"Masaki","family":"Hashizume","sequence":"first","affiliation":[]},{"given":"Takeorai","family":"Tamesada","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2007,3,22]]},"reference":[{"key":"e_1_2_1_2_2","unstructured":"R. Y.Li S. C.Diehl andS.Harrison.Power supply noise testing of VLSI chips. 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