{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T09:47:50Z","timestamp":1743328070195},"reference-count":7,"publisher":"Wiley","issue":"11","license":[{"start":{"date-parts":[[2007,3,21]],"date-time":"2007-03-21T00:00:00Z","timestamp":1174435200000},"content-version":"vor","delay-in-days":5923,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems &amp; Computers in Japan"],"published-print":{"date-parts":[[1991,1]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>To reduce VLSI turnaround time and cost, an efficient fault diagnosis method must be developed. Electron\u2010beam probing, which allows observation of the signal values within a chip, is one of the promising approaches for fault diagnosis. However, it is strongly desired that the number of probes be reduced; otherwise, a great deal of effort results.<\/jats:p><jats:p>The electron\u2010beam probing, guided by deduction based on implications of internal signal values [6], is considered one of the effective solutions to this problem. Here this idea is built upon by adding preprocessing to further reduce the number of probes and postprocessing to improve the diagnosis resolution. The method proposed efficiently diagnoses multiple stuck\u2010at faults in combinational circuits. Using computational experiments it is also shown that almost all of the faults are diagnosed by probing about 15 percent of the nets when test patterns for detecting single stuck\u2010at faults are used.<\/jats:p>","DOI":"10.1002\/scj.4690221103","type":"journal-article","created":{"date-parts":[[2007,7,7]],"date-time":"2007-07-07T20:03:41Z","timestamp":1183838621000},"page":"21-30","source":"Crossref","is-referenced-by-count":11,"title":["Method of diagnosing multiple stuck\u2010at\u2010faults in combinational circuits"],"prefix":"10.1002","volume":"22","author":[{"given":"Teruhiko","family":"Yamada","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuji","family":"Hamada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tatsuo","family":"Matsumoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshihiko","family":"Takahashi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takao","family":"Nakayama","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2007,3,21]]},"reference":[{"key":"e_1_2_1_2_2","volume-title":"Fault Diagnosis of Digital Systems","author":"Chang H. 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Proc. 18th DAC pp.189\u2013195(June1981).","DOI":"10.1109\/DAC.1981.1585351"},{"key":"e_1_2_1_8_2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676174"}],"container-title":["Systems and Computers in Japan"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fscj.4690221103","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/scj.4690221103","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,23]],"date-time":"2023-10-23T05:09:18Z","timestamp":1698037758000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/scj.4690221103"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1991,1]]},"references-count":7,"journal-issue":{"issue":"11","published-print":{"date-parts":[[1991,1]]}},"alternative-id":["10.1002\/scj.4690221103"],"URL":"https:\/\/doi.org\/10.1002\/scj.4690221103","archive":["Portico"],"relation":{},"ISSN":["0882-1666","1520-684X"],"issn-type":[{"value":"0882-1666","type":"print"},{"value":"1520-684X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1991,1]]}}}