{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,7]],"date-time":"2026-03-07T02:13:22Z","timestamp":1772849602164,"version":"3.50.1"},"reference-count":43,"publisher":"Wiley","issue":"4","license":[{"start":{"date-parts":[[2023,2,27]],"date-time":"2023-02-27T00:00:00Z","timestamp":1677456000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61867004"],"award-info":[{"award-number":["61867004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100014717","name":"National Outstanding Youth Science Fund Project of National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["41801288"],"award-info":[{"award-number":["41801288"]}],"id":[{"id":"10.13039\/100014717","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["J Software Evolu Process"],"published-print":{"date-parts":[[2024,4]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Spectrum\u2010based fault localization (SBFL) is considered as the most popular lightweight fault localization method. However, pure SBFL is proved to be tedious and time\u2010consuming for programmers to detect faults. This is because the suspiciousness is duplicated and they usually involve only the first few suspicious elements in the debugging process before losing patience. For this reason, benefiting from abundant spectrum information created by SBFL, we propose a new spectral fault localization technique using empirical mode decomposition method (EMD) to improve the accuracy of automatic software debugging. To accomplish that, the faulty program is evaluated by SBFL, and then, the resultant suspiciousness scores are taken as signals and nonfaulty elements as noise. Next, EMD is employed to decompose the suspicious scores of SBFL to eliminate massively repeated ones. Hence, elements are reranked according to new scores, and the ranking list is reconstructed by enlarging the high\u2010performance range (checking 5% elements) and <jats:italic>TOP\u20105<\/jats:italic> region to detect more faults. The performance of EMD\u2010SBFL is tested and compared with pure SBFL with EXAM scores and Top\u2010n ranks both on Siemens programs with seeded faults and large\u2010sized Defects4j programs with real faults. The result reveals that EMD\u2010SBFL is significantly effective to locate nearly over doubled faults by only check Top\u20101 and outperforms the state\u2010of\u2010the art SBFL techniques.<\/jats:p>","DOI":"10.1002\/smr.2546","type":"journal-article","created":{"date-parts":[[2023,3,5]],"date-time":"2023-03-05T06:05:35Z","timestamp":1677996335000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Spectrum\u2010based fault localization using empirical mode decomposition algorithm"],"prefix":"10.1002","volume":"36","author":[{"given":"Xin","family":"Fan","sequence":"first","affiliation":[{"name":"College of Aerospace Engineering Nanjing University of Aeronautics and Astronautics  Nanjing China"},{"name":"School of Software Nanchang Hangkong University  Nanchang China"},{"name":"Software Testing and Evaluation Center Nanchang Hangkong University  Nanchang China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0551-1099","authenticated-orcid":false,"given":"Qi","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Software Nanchang Hangkong University  Nanchang China"},{"name":"Software Testing and Evaluation Center Nanchang Hangkong University  Nanchang China"}]},{"given":"Li","family":"Yu","sequence":"additional","affiliation":[{"name":"College of Aerospace Engineering Nanjing University of Aeronautics and Astronautics  Nanjing China"}]},{"given":"Fangqi","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Software Nanchang Hangkong University  Nanchang China"},{"name":"Software Testing and Evaluation Center Nanchang Hangkong University  Nanchang China"}]},{"given":"Jiahao","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Software Nanchang Hangkong University  Nanchang China"},{"name":"Software Testing and Evaluation Center Nanchang Hangkong University  Nanchang China"}]},{"given":"Wei","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Software Nanchang Hangkong University  Nanchang China"},{"name":"Software Testing and Evaluation Center Nanchang Hangkong University  Nanchang China"}]}],"member":"311","published-online":{"date-parts":[[2023,2,27]]},"reference":[{"key":"e_1_2_9_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.341844"},{"key":"e_1_2_9_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/581396.581397"},{"key":"e_1_2_9_4_1","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/1820454"},{"key":"e_1_2_9_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2285319"},{"key":"e_1_2_9_6_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2018.02.001"},{"key":"e_1_2_9_7_1","doi-asserted-by":"publisher","DOI":"10.1002\/spe.2527"},{"key":"e_1_2_9_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2796849"},{"key":"e_1_2_9_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2010.11.915"},{"key":"e_1_2_9_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2017.04.017"},{"key":"e_1_2_9_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2776912"},{"key":"e_1_2_9_12_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11219\u2010015\u20109295\u20101"},{"key":"e_1_2_9_13_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2015.10.052"},{"key":"e_1_2_9_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/QR2MSE46217.2019.9021217"},{"key":"e_1_2_9_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2019.8668002"},{"key":"e_1_2_9_16_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2020.106312"},{"key":"e_1_2_9_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"},{"key":"e_1_2_9_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2938561"},{"key":"e_1_2_9_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/TAIC.PART.2007.13"},{"key":"e_1_2_9_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/2000791.2000795"},{"key":"e_1_2_9_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2013.52"},{"key":"e_1_2_9_22_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.09.037"},{"key":"e_1_2_9_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2172031"},{"key":"e_1_2_9_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2008.65"},{"key":"e_1_2_9_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/SERE.2012.12"},{"key":"e_1_2_9_26_1","doi-asserted-by":"crossref","unstructured":"ParninC OrsoA.Are automated debugging techniques actually helping programmers?Proceedings of the 2011 International Symposium on Software Testing and Analysis;2011:199\u2010209.","DOI":"10.1145\/2001420.2001445"},{"key":"e_1_2_9_27_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2021.106512"},{"key":"e_1_2_9_28_1","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.1998.0193"},{"key":"e_1_2_9_29_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2007.05.007"},{"key":"e_1_2_9_30_1","doi-asserted-by":"publisher","DOI":"10.1146\/annurev.fluid.31.1.417"},{"key":"e_1_2_9_31_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.matpr.2021.10.152"},{"key":"e_1_2_9_32_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2021.07.011"},{"key":"e_1_2_9_33_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jenvrad.2020.106353"},{"key":"e_1_2_9_34_1","doi-asserted-by":"publisher","DOI":"10.1109\/CSPA.2019.8696018"},{"key":"e_1_2_9_35_1","doi-asserted-by":"publisher","DOI":"10.1145\/267896.267925"},{"key":"e_1_2_9_36_1","first-page":"8","volume-title":"Application of Empirical Modal Decomposition in Vibration Analysis","author":"Yang YF","year":"2013"},{"key":"e_1_2_9_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2018.8409666"},{"issue":"06","key":"e_1_2_9_38_1","first-page":"1278","article-title":"Fault diagnosis method based on EMD and spectrum correction","volume":"32","author":"Liu LJ","year":"2011","journal-title":"J Instrument"},{"key":"e_1_2_9_39_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.106443"},{"key":"e_1_2_9_40_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2017.05.018"},{"key":"e_1_2_9_41_1","unstructured":"https:\/\/sir.unl.edu\/portal\/index.php"},{"key":"e_1_2_9_42_1","unstructured":"https:\/\/github.com\/rjust\/defects4j"},{"key":"e_1_2_9_43_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10489\u2010021\u201002954\u20107"},{"key":"e_1_2_9_44_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3025460"}],"container-title":["Journal of Software: Evolution and Process"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/smr.2546","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/smr.2546","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/smr.2546","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,11]],"date-time":"2024-04-11T07:48:50Z","timestamp":1712821730000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/smr.2546"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2,27]]},"references-count":43,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2024,4]]}},"alternative-id":["10.1002\/smr.2546"],"URL":"https:\/\/doi.org\/10.1002\/smr.2546","archive":["Portico"],"relation":{},"ISSN":["2047-7473","2047-7481"],"issn-type":[{"value":"2047-7473","type":"print"},{"value":"2047-7481","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2,27]]},"assertion":[{"value":"2022-05-04","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2023-02-06","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2023-02-27","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"e2546"}}