{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,11]],"date-time":"2026-09-11T05:07:32Z","timestamp":1789103252040,"version":"build-2803163510"},"reference-count":60,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,9,10]],"date-time":"2026-09-10T00:00:00Z","timestamp":1788998400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"},{"start":{"date-parts":[[2026,9,10]],"date-time":"2026-09-10T00:00:00Z","timestamp":1788998400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/501100013128","name":"Korea Technology and Information Promotion Agency for SMEs","doi-asserted-by":"publisher","award":["RS\u20102025\u201025455230"],"award-info":[{"award-number":["RS\u20102025\u201025455230"]}],"id":[{"id":"10.13039\/501100013128","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["advanced.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Advanced Materials"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    Physical reservoir computing offers an energy\u2010efficient framework for spatiotemporal processing by exploiting nonlinear dynamics and fading memory. Two\u2010dimensional semiconductors provide intrinsic interfacial charge\u2010trapping dynamics as a potential source for such behaviors. However, purely defect\u2010driven reservoirs suffer from limited tunability and variability. Here, we demonstrate a ferroelectric\u2010assisted charge\u2010trap memory (FA\u2010CTM) that transforms inherently random interfacial charge dynamics into a highly controllable, designable physical reservoir. By introducing a ferroelectric underlayer and engineering voltage partitioning via capacitance matching, the FA\u2010CTM is intentionally driven in a volatile regime that strengthens nonlinearity while preserving reproducible fading\u2010memory behavior. This architecture achieves a 51% enhancement in the memory window together with a 12\u2010fold increase in on\u2010current compared to pristine dielectric counterparts. Through an industry\u2010academia partnership, we validated array\u2010level scalability using 8\u2010inch wafer\u2010scale MOCVD\u2010synthesized MoS\n                    <jats:sub>2<\/jats:sub>\n                    channels integrated via dry transfer processes. The result exhibits exceptional uniformity, with average reservoir state output\u2010current variation minimized to 3.11%, compared to 15.57% in non\u2010ferroelectric controls. Consequently, the FA\u2010CTM reservoir achieves 90.18% accuracy on EMNIST classification and supports a multitasking pipeline for video\u2010based object recognition and trajectory prediction. These results establish ferroelectric\u2010assisted field control as a practical method to co\u2010optimize tunability and uniformity in charge\u2010trap memories, providing a robust foundation for spatiotemporal processing.\n                  <\/jats:p>","DOI":"10.1002\/adma.74987","type":"journal-article","created":{"date-parts":[[2026,9,11]],"date-time":"2026-09-11T04:30:58Z","timestamp":1789101058000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Ferroelectric\u2010Assisted van der Waals Charge\u2010Dynamics Reservoir Arrays for Spatiotemporal Computing"],"prefix":"10.1002","author":[{"given":"Taemin","family":"Sim","sequence":"first","affiliation":[{"name":"Department of Electronic Engineering Kyung Hee University  Yongin South Korea"},{"name":"Department of Semiconductor Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-1990-6914","authenticated-orcid":false,"given":"Junseong","family":"Bae","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering Kyung Hee University  Yongin South Korea"},{"name":"Department of Semiconductor Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-8609-5820","authenticated-orcid":false,"given":"Eunjoo","family":"Yoo","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering Kyung Hee University  Yongin South Korea"},{"name":"Department of Semiconductor Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6078-3874","authenticated-orcid":false,"given":"Chang\u2010Seok","family":"Lee","sequence":"additional","affiliation":[{"name":"Advanced Device Platform Samsung Advanced Institute of Technology  Suwon South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7026-8721","authenticated-orcid":false,"given":"Sangwon","family":"Kim","sequence":"additional","affiliation":[{"name":"Advanced Device Platform Samsung Advanced Institute of Technology  Suwon South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8920-6181","authenticated-orcid":false,"given":"Minsu","family":"Seol","sequence":"additional","affiliation":[{"name":"Advanced Device Platform Samsung Advanced Institute of Technology  Suwon South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5351-342X","authenticated-orcid":false,"given":"Junyoung","family":"Kwon","sequence":"additional","affiliation":[{"name":"Advanced Device Platform Samsung Advanced Institute of Technology  Suwon South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyunmi","family":"Lee","sequence":"additional","affiliation":[{"name":"Advanced Device Platform Samsung Advanced Institute of Technology  Suwon South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shubham","family":"Patil","sequence":"additional","affiliation":[{"name":"Department of Electronic and Information Convergence Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5885-7299","authenticated-orcid":false,"given":"Anupom","family":"Devnath","sequence":"additional","affiliation":[{"name":"Department of Electronic and Information Convergence Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Batyrbek","family":"Alimkhanuly","sequence":"additional","affiliation":[{"name":"Department of Electronic and Information Convergence Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seungwoo","family":"Moon","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering Kyung Hee University  Yongin South Korea"},{"name":"Department of Semiconductor Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-8647-1693","authenticated-orcid":false,"given":"Changdeok","family":"Han","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering Kyung Hee University  Yongin South Korea"},{"name":"Department of Semiconductor Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5839-6533","authenticated-orcid":false,"given":"Seunghwan","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering Kyung Hee University  Yongin South Korea"},{"name":"Department of Semiconductor Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4701-2856","authenticated-orcid":false,"given":"Seunghyun","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering Kyung Hee University  Yongin South Korea"},{"name":"Department of Semiconductor Engineering Kyung Hee University  Yongin South Korea"},{"name":"Department of Electronic and Information Convergence Engineering Kyung Hee University  Yongin South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2026,9,10]]},"reference":[{"key":"e_1_2_10_2_1","doi-asserted-by":"publisher","DOI":"10.1038\/s42254\u2010021\u201000358\u20107"},{"key":"e_1_2_10_3_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010025\u201057352\u20101"},{"key":"e_1_2_10_4_1","doi-asserted-by":"publisher","DOI":"10.1038\/s42256\u2010018\u20100001\u20104"},{"key":"e_1_2_10_5_1","doi-asserted-by":"publisher","DOI":"10.1038\/s42256\u2010019\u20100089\u20101"},{"key":"e_1_2_10_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202306149"},{"key":"e_1_2_10_7_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature12742"},{"key":"e_1_2_10_8_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010022\u201029260\u20101"},{"key":"e_1_2_10_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928\u2010024\u201001133\u2010z"},{"key":"e_1_2_10_10_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41563\u2010023\u201001698\u20108"},{"key":"e_1_2_10_11_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010017\u201002337\u2010y"},{"key":"e_1_2_10_12_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928\u2010022\u201000838\u20103"},{"key":"e_1_2_10_13_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928\u2010019\u20100313\u20103"},{"key":"e_1_2_10_14_1","doi-asserted-by":"crossref","unstructured":"E.Nako K.Toprasertpong R.Nakane M.Takenaka andS.Takagi \u201cExperimental Demonstration of Novel Scheme of HZO\/Si FeFET Reservoir Computing With Parallel Data Processing for Speech Recognition \u201d in2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)(IEEE 2022) 220\u2013221 https:\/\/doi.org\/10.1109\/VLSITechnologyandCir46769.2022.9830412.","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830412"},{"key":"e_1_2_10_15_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010024\u201053321\u20102"},{"key":"e_1_2_10_16_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010023\u201039371\u2010y"},{"key":"e_1_2_10_17_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevResearch.4.033007"},{"key":"e_1_2_10_18_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.11.034021"},{"key":"e_1_2_10_19_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms4541"},{"key":"e_1_2_10_20_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010025\u201067983\u2010z"},{"key":"e_1_2_10_21_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928\u2010024\u201001158\u20104"},{"key":"e_1_2_10_22_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586\u2010025\u201008963\u20107"},{"key":"e_1_2_10_23_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928\u2010021\u201000670\u20101"},{"key":"e_1_2_10_24_1","doi-asserted-by":"publisher","DOI":"10.1039\/c8cs00417j"},{"key":"e_1_2_10_25_1","doi-asserted-by":"publisher","DOI":"10.1002\/admt.201901062"},{"key":"e_1_2_10_26_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.4c11898"},{"key":"e_1_2_10_27_1","doi-asserted-by":"publisher","DOI":"10.1021\/nn5059419"},{"key":"e_1_2_10_28_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4914968"},{"key":"e_1_2_10_29_1","doi-asserted-by":"publisher","DOI":"10.1021\/nn301572c"},{"key":"e_1_2_10_30_1","doi-asserted-by":"publisher","DOI":"10.1039\/C5NR07336G"},{"key":"e_1_2_10_31_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202205381"},{"key":"e_1_2_10_32_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.adr3241"},{"key":"e_1_2_10_33_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41578\u2010022\u201000443\u2010y"},{"key":"e_1_2_10_34_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586\u2010022\u201004425\u20106"},{"key":"e_1_2_10_35_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202206864"},{"key":"e_1_2_10_36_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.4c18973"},{"key":"e_1_2_10_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/Jeds.2023.3267081"},{"key":"e_1_2_10_38_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202003542"},{"key":"e_1_2_10_39_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202314164"},{"key":"e_1_2_10_40_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.4c06144"},{"key":"e_1_2_10_41_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41699\u2010021\u201000229\u2010w"},{"key":"e_1_2_10_42_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202411463"},{"key":"e_1_2_10_43_1","doi-asserted-by":"publisher","DOI":"10.1039\/d3nh00524k"},{"key":"e_1_2_10_44_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010019\u201013769\u2010z"},{"key":"e_1_2_10_45_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202305580"},{"key":"e_1_2_10_46_1","doi-asserted-by":"publisher","DOI":"10.1002\/advs.202408210"},{"key":"e_1_2_10_47_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202511704"},{"key":"e_1_2_10_48_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010020\u201020692\u20101"},{"key":"e_1_2_10_49_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202511728"},{"key":"e_1_2_10_50_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202405670"},{"key":"e_1_2_10_51_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202416811"},{"key":"e_1_2_10_52_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202314649"},{"key":"e_1_2_10_53_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.1c05841"},{"key":"e_1_2_10_54_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202208664"},{"key":"e_1_2_10_55_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010020\u201016766\u20109"},{"key":"e_1_2_10_56_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202418418"},{"key":"e_1_2_10_57_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361\u20106528\/aba46e"},{"key":"e_1_2_10_58_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.2c03453"},{"key":"e_1_2_10_59_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202010971"},{"key":"e_1_2_10_60_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.adn4524"},{"key":"e_1_2_10_61_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010024\u201044942\u20108"}],"container-title":["Advanced Materials"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/adma.74987","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/adma.74987","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/adma.74987","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,11]],"date-time":"2026-09-11T04:31:11Z","timestamp":1789101071000},"score":1,"resource":{"primary":{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/10.1002\/adma.74987"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9,10]]},"references-count":60,"alternative-id":["10.1002\/adma.74987"],"URL":"https:\/\/doi.org\/10.1002\/adma.74987","archive":["Portico"],"relation":{},"ISSN":["0935-9648","1521-4095"],"issn-type":[{"value":"0935-9648","type":"print"},{"value":"1521-4095","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,9,10]]},"assertion":[{"value":"2026-03-27","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-09-07","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-09-10","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"e74987"}}