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Developing energy\u2010efficient, CMOS compatible, reliable, and tunable spintronic neurons to emulate brain\u2010inspired processes has been a key research goal for decades. Here, a new type of DW device is reported with biological neuron characteristics driven by the synergistic interaction between spin\u2010orbit torque and built\u2010in field (<jats:italic>H<\/jats:italic><jats:sub>built\u2010in<\/jats:sub>) in magnetic tunnel junctions, enabling time\u2010 and energy\u2010efficient leaky\u2010integrate\u2010and\u2010fire and self\u2010reset neuromorphic implementations. A tilted magnetic anisotropic free layer is proposed and further executed to mitigate the DW retrograde motion by suppressing the Walker breakdown. Complementary experiments and micromagnetic co\u2010simulation results show that the integrating\/leaking time of the developed spintronic neuron can be tuned to 12\/15\u00a0ns with an integrating power consumption of 65 \u00b5W, which is 36\u00d7 and 1.84\u00d7 time and energy efficient than the state\u2010of\u2010the\u2010art alternatives, respectively. Moreover, the spatial distribution of <jats:italic>H<\/jats:italic><jats:sub>built\u2010in<\/jats:sub> can be modulated by adjusting the width and compensation of the reference layer, facilitating tunable activation function generator exploration. Such architecture demonstrates great potential in both fundamental research and new trajectories of technology advancement for spintronic neuron hardware applications.<\/jats:p>","DOI":"10.1002\/advs.202203006","type":"journal-article","created":{"date-parts":[[2022,8,4]],"date-time":"2022-08-04T21:30:50Z","timestamp":1659648650000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":24,"title":["Synergy of Spin\u2010Orbit Torque and Built\u2010In Field in Magnetic Tunnel Junctions with Tilted Magnetic Anisotropy: Toward Tunable and Reliable Spintronic Neurons"],"prefix":"10.1002","volume":"9","author":[{"given":"Di","family":"Wang","sequence":"first","affiliation":[{"name":"Key Laboratory of Microelectronic Devices and Integrated Technology Institute of Microelectronics Chinese Academy of Sciences  Beijing 100029 China"},{"name":"School of Integrated Circuits University of Chinese Academy of Sciences  Beijing 100049 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ziwei","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Microelectronic Devices and Integrated Technology Institute of Microelectronics Chinese Academy of Sciences  Beijing 100029 China"},{"name":"School of Integrated Circuits University of Chinese Academy of Sciences  Beijing 100049 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nuo","family":"Xu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Sciences University of California  Berkeley CA 94720 USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Long","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Microelectronic Devices and Integrated Technology Institute of Microelectronics Chinese Academy of Sciences  Beijing 100029 China"},{"name":"School of Integrated Circuits University of Chinese Academy of Sciences  Beijing 100049 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Huai","family":"Lin","sequence":"additional","affiliation":[{"name":"Key Laboratory of Microelectronic Devices and Integrated Technology Institute of Microelectronics Chinese Academy of Sciences  Beijing 100029 China"},{"name":"School of Integrated Circuits University of Chinese Academy of Sciences  Beijing 100049 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuefeng","family":"Zhao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Microelectronic Devices and Integrated Technology Institute of Microelectronics Chinese Academy of Sciences  Beijing 100029 China"},{"name":"School of Microelectronics University of Science and Technology of China  Hefei 230026 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sheng","family":"Jiang","sequence":"additional","affiliation":[{"name":"School of Microelectronics Northwestern Polytechnical University  Xi'an 710072 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weinan","family":"Lin","sequence":"additional","affiliation":[{"name":"Department of Physics Xiamen University  Xiamen 361005 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nan","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Microelectronics University of Science and Technology of China  Hefei 230026 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ming","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits University of Chinese Academy of Sciences  Beijing 100049 China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0618-1960","authenticated-orcid":false,"given":"Guozhong","family":"Xing","sequence":"additional","affiliation":[{"name":"Key Laboratory of Microelectronic Devices and Integrated Technology Institute of Microelectronics Chinese Academy of Sciences  Beijing 100029 China"},{"name":"School of Integrated Circuits University of Chinese Academy of Sciences  Beijing 100049 China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2022,8,4]]},"reference":[{"key":"e_1_2_8_1_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-020-0655-z"},{"key":"e_1_2_8_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isci.2020.101614"},{"key":"e_1_2_8_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mattod.2017.07.007"},{"key":"e_1_2_8_4_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-021-04196-6"},{"key":"e_1_2_8_5_1","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202200028"},{"key":"e_1_2_8_6_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-17215-3"},{"key":"e_1_2_8_7_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2016.70"},{"key":"e_1_2_8_8_1","volume-title":"2019 Int. 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