{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,20]],"date-time":"2026-09-20T09:06:05Z","timestamp":1789895165634,"version":"4.0.1"},"reference-count":61,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T00:00:00Z","timestamp":1784246400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T00:00:00Z","timestamp":1784246400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/100012818","name":"Comunidad de Madrid","doi-asserted-by":"publisher","award":["TEC\u20102024\/ECO\u2010332"],"award-info":[{"award-number":["TEC\u20102024\/ECO\u2010332"]}],"id":[{"id":"10.13039\/100012818","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100000781","name":"European Research Council","doi-asserted-by":"publisher","award":["101163902"],"award-info":[{"award-number":["101163902"]}],"id":[{"id":"10.13039\/501100000781","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["advanced.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Advanced Science"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    Adhesion stabilizes van der Waals materials and heterostructures, yet reported interaction strengths show a wide dispersion that hinders a consistent link between microscopic dispersive forces and macroscopic observables. Here, we determine clean\u2010interface adhesion by measuring tip\u2010sample interactions in ultrahigh vacuum using calibrated AFM probes of different radii, in situ thermal cleaning, and realistic contact distances. This approach isolates the dispersive interaction of clean interfaces and allows us to extract mixed Hamaker constants for SiO\n                    <jats:sub>2<\/jats:sub>\n                    interacting with few\u2010layer graphene (12 \u00d7 10\n                    <jats:sup>\u221220<\/jats:sup>\n                    J), MoS\n                    <jats:sub>2<\/jats:sub>\n                    (13 \u00d7 10\n                    <jats:sup>\u221220<\/jats:sup>\n                    J), and SiO\n                    <jats:sub>2<\/jats:sub>\n                    (6.1 \u00d7 10\n                    <jats:sup>\u221220<\/jats:sup>\n                    J). Agreement between static adhesion spectroscopy and noncontact frequency\u2010modulation AFM (FM\u2010AFM) provides an internal consistency check of the interaction scale. Controlled humidity cycles further show that even very dry ambient conditions already enhance adhesion, while higher humidity produces a strong reversible increase associated with capillary forces, explaining one major contribution to the large spread of commonly reported values. These results establish clean\u2010interface experimental benchmark values for dispersive interactions in representative layered materials, enabling quantitative comparison with dielectric\u2010response and Lifshitz\u2010based models that relate Hamaker constants to binding energy and macroscopic properties of van der Waals crystals.\n                  <\/jats:p>","DOI":"10.1002\/advs.76609","type":"journal-article","created":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T19:39:20Z","timestamp":1784317160000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Hamaker Constants of van der Waals Materials under Clean\u2010Interface Conditions"],"prefix":"10.1002","author":[{"given":"Daniel","family":"Gallego\u2010Fuente","sequence":"first","affiliation":[{"name":"Departamento de F\u00edsica de la Materia Condensada Universidad Aut\u00f3noma de Madrid  Madrid Spain"},{"name":"Condensed Matter Physics Center (IFIMAC) Universidad Aut\u00f3noma de Madrid  Madrid Spain"},{"name":"Instituto Nicol\u00e1s Cabrera Universidad Aut\u00f3noma de Madrid  Madrid Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jaime","family":"Colchero","sequence":"additional","affiliation":[{"name":"Optics and Nanophysics Research Center Universidad de Murcia  Murcia Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8583-8061","authenticated-orcid":false,"given":"Julio","family":"Gomez\u2010Herrero","sequence":"additional","affiliation":[{"name":"Departamento de F\u00edsica de la Materia Condensada Universidad Aut\u00f3noma de Madrid  Madrid Spain"},{"name":"Condensed Matter Physics Center (IFIMAC) Universidad Aut\u00f3noma de Madrid  Madrid Spain"},{"name":"Instituto Nicol\u00e1s Cabrera Universidad Aut\u00f3noma de Madrid  Madrid Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pablo","family":"Ares","sequence":"additional","affiliation":[{"name":"Departamento de F\u00edsica de la Materia Condensada Universidad Aut\u00f3noma de Madrid  Madrid Spain"},{"name":"Condensed Matter Physics Center (IFIMAC) Universidad Aut\u00f3noma de Madrid  Madrid Spain"},{"name":"Instituto Nicol\u00e1s Cabrera Universidad Aut\u00f3noma de Madrid  Madrid 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