{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,31]],"date-time":"2026-07-31T20:32:50Z","timestamp":1785529970363,"version":"3.56.0"},"reference-count":50,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,7,31]],"date-time":"2026-07-31T00:00:00Z","timestamp":1785456000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,7,31]],"date-time":"2026-07-31T00:00:00Z","timestamp":1785456000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"content-domain":{"domain":["advanced.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Advanced Science"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    Ultraviolet (UV) imagers are important for a variety of applications, such as quality inspection in the semiconductor industry, forensics and food quality inspection, but are often costly because they require dedicated semiconductor process flows. Here, an imaging chip is introduced that has been fabricated using standard 40\u00a0nm complementary metal\u2010oxide\u2010semiconductor (CMOS) technology. Instead of using a conventional charge\u2010based photodetection principle, the imager uses a capacitive operation principle where UV\u2010light causes capacitance changes via the photodielectric effect in a functionalization layer, which are measured by the underlying CMOS circuitry. This spin\u2010coated or inkjet\u2010printed functionalization layer consists of solution\u2010processed, wide\u2010bandgap, semiconducting metal\u2010oxide nanoparticles, such as ZnO, SnO\n                    <jats:sub>2<\/jats:sub>\n                    and Ga\n                    <jats:sub>2<\/jats:sub>\n                    O\n                    <jats:sub>3<\/jats:sub>\n                    . Owing to their bandgap\u2010dependent optical absorption, these materials exhibit distinct capacitive responses across UV\u2010A, UV\u2010B, and UV\u2010C spectral regions, thereby enabling band\u2010selective detection and multispectral UV imaging. The sensors exhibit low noise\u2010equivalent powers (17\u2010138 fW Hz\n                    <jats:sup>\u22121\/2<\/jats:sup>\n                    ) across the UV bands. Unlike conventional silicon CMOS imagers, the present capacitive\u2010CMOS platform is inherently visible\u2010blind, providing selective UV detection. This work positions late\u2010functionalized capacitive\u2010CMOS arrays as a route toward reducing the fabrication complexity of UV imagers, which can lead to their more widespread implementation in consumer and low\u2010volume application\u2010specific products.\n                  <\/jats:p>","DOI":"10.1002\/advs.76880","type":"journal-article","created":{"date-parts":[[2026,7,31]],"date-time":"2026-07-31T18:43:08Z","timestamp":1785523388000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Multispectral UV Imaging on Capacitive CMOS Arrays Enabled by Solution\u2010Processed Metal\u2010Oxide Nanoparticles"],"prefix":"10.1002","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9752-2352","authenticated-orcid":false,"given":"Suman","family":"Kundu","sequence":"first","affiliation":[{"name":"Department of Microelectronics Faculty of Electrical Engineering Mathematics and Computer Science  TU Delft Netherlands"},{"name":"Department of Precision and Microsystems Engineering Faculty of Mechanical Engineering  TU Delft Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tao","family":"Shen","sequence":"additional","affiliation":[{"name":"Department of Microelectronics Faculty of Electrical Engineering Mathematics and Computer Science  TU Delft Netherlands"},{"name":"Department of Precision and Microsystems Engineering Faculty of Mechanical Engineering  TU Delft Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kai","family":"Betlem","sequence":"additional","affiliation":[{"name":"Department of Microelectronics Faculty of Electrical Engineering Mathematics and Computer Science  TU Delft Netherlands"},{"name":"Department of Precision and Microsystems Engineering Faculty of Mechanical Engineering  TU Delft Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8423-3159","authenticated-orcid":false,"given":"Murali K.","family":"Ghatkesar","sequence":"additional","affiliation":[{"name":"Department of Precision and Microsystems Engineering Faculty of Mechanical Engineering  TU Delft Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5764-1218","authenticated-orcid":false,"given":"Peter G.","family":"Steeneken","sequence":"additional","affiliation":[{"name":"Department of Precision and Microsystems Engineering Faculty of Mechanical Engineering  TU Delft Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-1284-629X","authenticated-orcid":false,"given":"Frans P.","family":"Widdershoven","sequence":"additional","affiliation":[{"name":"Department of Microelectronics Faculty of Electrical Engineering Mathematics and Computer Science  TU Delft Netherlands"},{"name":"NXP Semiconductors Technology &amp; Operations\/CTO Office  Eindhoven Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2026,7,31]]},"reference":[{"key":"e_1_2_9_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/MCD.2005.1438751"},{"key":"e_1_2_9_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2005.07.002"},{"key":"e_1_2_9_4_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2008.04.012"},{"key":"e_1_2_9_5_1","doi-asserted-by":"publisher","DOI":"10.1155\/2010\/920693"},{"key":"e_1_2_9_6_1","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2017.75"},{"key":"e_1_2_9_7_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41566\u2010022\u201001141\u20105"},{"key":"e_1_2_9_8_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586\u2010025\u201008991\u20103"},{"key":"e_1_2_9_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565\u2010022\u201001243\u20109"},{"key":"e_1_2_9_10_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586\u2010025\u201009062\u20103"},{"key":"e_1_2_9_11_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41578\u2010023\u201000583\u20109"},{"key":"e_1_2_9_12_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.aax8801"},{"key":"e_1_2_9_13_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.adk3860"},{"key":"e_1_2_9_14_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928\u2010021\u201000632\u20107"},{"key":"e_1_2_9_15_1","doi-asserted-by":"publisher","DOI":"10.1038\/natrevmats.2016.100"},{"key":"e_1_2_9_16_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms2180"},{"key":"e_1_2_9_17_1","doi-asserted-by":"publisher","DOI":"10.1063\/5.0082348"},{"key":"e_1_2_9_18_1","doi-asserted-by":"publisher","DOI":"10.1088\/1674\u20104926\/42\/8\/081801"},{"key":"e_1_2_9_19_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsphotonics.0c01245"},{"key":"e_1_2_9_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3071980"},{"key":"e_1_2_9_21_1","volume-title":"Exploring Ultraviolet Photography: Bee Vision, Forensic Imaging, and Other Near\u2010Ultraviolet Adventures With Your DSLR","author":"Prutchi D.","year":"2016"},{"key":"e_1_2_9_22_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.304582"},{"key":"e_1_2_9_23_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202109498"},{"key":"e_1_2_9_24_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010020\u201016015\u2010z"},{"key":"e_1_2_9_25_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200901108"},{"key":"e_1_2_9_26_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41378\u2010022\u201000446\u20103"},{"key":"e_1_2_9_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2433939"},{"key":"e_1_2_9_28_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsaelm.4c02279"},{"key":"e_1_2_9_29_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41377\u2010021\u201000527\u20104"},{"key":"e_1_2_9_30_1","doi-asserted-by":"publisher","DOI":"10.1002\/1521\u2010396X(200111)188:1<289::AID\u2010PSSA289>3.0.CO;2\u2010U"},{"key":"e_1_2_9_31_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.597077"},{"key":"e_1_2_9_32_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.754794"},{"key":"e_1_2_9_33_1","doi-asserted-by":"publisher","DOI":"10.1002\/advs.202101106"},{"key":"e_1_2_9_34_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202506449"},{"key":"e_1_2_9_35_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2015.163"},{"key":"e_1_2_9_36_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3032712"},{"key":"e_1_2_9_37_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.accounts.6b00349"},{"key":"e_1_2_9_38_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2861558"},{"key":"e_1_2_9_39_1","doi-asserted-by":"publisher","DOI":"10.1039\/D1FD00044F"},{"key":"e_1_2_9_40_1","first-page":"23","volume-title":"Imaging Sensors, Power Management, PLLs and Frequency Synthesizers: Advances in Analog Circuit Design 2023","author":"Widdershoven F.","year":"2024"},{"key":"e_1_2_9_41_1","doi-asserted-by":"publisher","DOI":"10.1002\/andp.19093330303"},{"key":"e_1_2_9_42_1","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.2210370217"},{"key":"e_1_2_9_43_1","volume-title":"Wiley Encyclopedia of Electrical and Electronics Engineering","author":"Avanesyan V. T.","year":"2001"},{"key":"e_1_2_9_44_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsaelm.4c00222"},{"key":"e_1_2_9_45_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5036982"},{"key":"e_1_2_9_46_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-007-6178-0_5-2"},{"key":"e_1_2_9_47_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ssc.2009.01.014"},{"key":"e_1_2_9_48_1","doi-asserted-by":"publisher","DOI":"10.34133\/research.0385"},{"key":"e_1_2_9_49_1","doi-asserted-by":"publisher","DOI":"10.1146\/annurev\u2010fluid\u2010022321\u2010114001"},{"key":"e_1_2_9_50_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep17374"},{"key":"e_1_2_9_51_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41699\u2010019\u20100125\u20103"}],"container-title":["Advanced Science"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/advs.76880","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/advs.76880","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/advs.76880","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,31]],"date-time":"2026-07-31T18:43:09Z","timestamp":1785523389000},"score":1,"resource":{"primary":{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/10.1002\/advs.76880"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7,31]]},"references-count":50,"alternative-id":["10.1002\/advs.76880"],"URL":"https:\/\/doi.org\/10.1002\/advs.76880","archive":["Portico"],"relation":{},"ISSN":["2198-3844","2198-3844"],"issn-type":[{"value":"2198-3844","type":"print"},{"value":"2198-3844","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7,31]]},"assertion":[{"value":"2026-04-28","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-07-21","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-07-31","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"e76880"}}