{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,14]],"date-time":"2026-08-14T10:27:53Z","timestamp":1786703273528,"version":"build-2736575974"},"reference-count":40,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,8,14]],"date-time":"2026-08-14T00:00:00Z","timestamp":1786665600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,8,14]],"date-time":"2026-08-14T00:00:00Z","timestamp":1786665600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/100023581","name":"National Science Foundation Graduate Research Fellowship Program","doi-asserted-by":"publisher","award":["DGE1255832"],"award-info":[{"award-number":["DGE1255832"]}],"id":[{"id":"10.13039\/100023581","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["advanced.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Advanced Science"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    Insulation resistance degradation caused by electromigration of oxygen vacancies under DC bias is a common mechanism that limits lifetime in multilayer ceramic capacitors (MLCCs). This work explores the use of high frequency ultrasound (100 MHz) as a non\u2010electrical, nondestructive characterization tool to spatially identify regions of degradation caused by oxygen vacancy migration through ultrasonic attenuation, which results from acoustic impedance changes leading to scattering contrast. To complement this technique, thermally stimulated depolarization current (TSDC) measurements were utilized to both degrade parts and evaluate the presence of electromigrated oxygen vacancy space charge. Commercial 1812 BME X7R MLCCs (100 V rated, 560 nF) were characterized using a custom ultrasonic immersion setup in both a pristine state and after TSDC (degraded at 130\u00b0C, 140\u00b0C, or 150\u00b0C for 8 h and measured using a 10\u00b0C min\n                    <jats:sup>\u22121<\/jats:sup>\n                    heating rate). Each TSDC condition induced oxygen vacancy migration across grain boundaries, which was confirmed using passive voltage contrast SEM. The average ultrasonic attenuation increased (1\u201016.4%) after TSDC stress. Additionally, more extreme poling conditions resulted in larger variations in the spatial attenuation response. Thus, ultrasonic attenuation is sensitive to MLCC degradation caused by electromigration of oxygen vacancies and may be useful as a non\u2010electrical evaluation of this mechanism.\n                  <\/jats:p>","DOI":"10.1002\/advs.77083","type":"journal-article","created":{"date-parts":[[2026,8,14]],"date-time":"2026-08-14T09:32:47Z","timestamp":1786699967000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Detection of Degraded Formulated BaTiO\n                    <sub>3<\/sub>\n                    Induced by Oxygen Vacancy Migration Using Ultrasonic Attenuation"],"prefix":"10.1002","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5504-0796","authenticated-orcid":false,"given":"Haley N.","family":"Jones","sequence":"first","affiliation":[{"name":"Materials Science and Engineering The Pennsylvania State University  University Park Pennsylvania USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Clive A.","family":"Randall","sequence":"additional","affiliation":[{"name":"Materials Science and Engineering The Pennsylvania State University  University Park Pennsylvania USA"},{"name":"Materials Research Institute The Pennsylvania State University  University Park Pennsylvania USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8089-4926","authenticated-orcid":false,"given":"Andrea P.","family":"Arg\u00fcelles","sequence":"additional","affiliation":[{"name":"Materials Research Institute The Pennsylvania State University  University Park Pennsylvania USA"},{"name":"Engineering Science and Mechanics The Pennsylvania State University  University Park Pennsylvania USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7267-9281","authenticated-orcid":false,"given":"Susan","family":"Trolier\u2010McKinstry","sequence":"additional","affiliation":[{"name":"Materials Science and Engineering The Pennsylvania State University  University Park Pennsylvania USA"},{"name":"Materials Research Institute The Pennsylvania State University  University Park Pennsylvania USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2026,8,14]]},"reference":[{"key":"e_1_2_11_2_1","first-page":"1","article-title":"Reliability of Multilayer Ceramic Capacitors with Base\u2010Metal Electrodes","volume":"5","author":"Liu D.","year":"2009","journal-title":"IEEE Parts Bulletin"},{"issue":"6","key":"e_1_2_11_3_1","doi-asserted-by":"crossref","first-page":"1645","DOI":"10.1111\/j.1151-2916.1990.tb09809.x","article-title":"dc Electrical Degradation of Perovskite\u2010Type Titanates: I, Ceramics","volume":"73","author":"Waser R.","year":"1990","journal-title":"Journal of the American Ceramic Society"},{"issue":"3","key":"e_1_2_11_4_1","doi-asserted-by":"crossref","first-page":"44","DOI":"10.1109\/MEI.2010.5482787","article-title":"A Brief Introduction to Ceramic Capacitors","volume":"26","author":"Pan M.\u2010J.","year":"2010","journal-title":"IEEE Electrical Insulation Magazine"},{"issue":"1","key":"e_1_2_11_5_1","doi-asserted-by":"crossref","first-page":"225","DOI":"10.1080\/00150197608241984","article-title":"Electrode and Materials Problems in Ceramic Capacitors","volume":"10","author":"Buessem W. 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Part II\u2014Insulation Resistance Degradation Under Applied dc Bias","volume":"96","author":"Yang G. Y.","year":"2004","journal-title":"Journal of Applied Physics"},{"issue":"23","key":"e_1_2_11_9_1","doi-asserted-by":"crossref","first-page":"4650","DOI":"10.1063\/1.1759390","article-title":"Vacancy Ordering in Reduced Barium Titanate","volume":"84","author":"Woodward D. I.","year":"2004","journal-title":"Applied Physics Letters"},{"issue":"1","key":"e_1_2_11_10_1","doi-asserted-by":"crossref","first-page":"616","DOI":"10.1038\/s41598-024-51254-w","article-title":"Thermal Activation Energy on Electrical Degradation Process in BaTiO3 Based Multilayer Ceramic Capacitors for Lifetime Reliability","volume":"14","author":"Chun J.","year":"2024","journal-title":"Scientific Reports"},{"key":"e_1_2_11_11_1","unstructured":"R. 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