{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,23]],"date-time":"2024-05-23T07:47:43Z","timestamp":1716450463390},"reference-count":12,"publisher":"Wiley","issue":"6","license":[{"start":{"date-parts":[[2010,8,16]],"date-time":"2010-08-16T00:00:00Z","timestamp":1281916800000},"content-version":"vor","delay-in-days":5372,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["American J Industrial Med"],"published-print":{"date-parts":[[1995,12]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>The Semiconductor Health Study included 14 U.S. companies with 82 silicon\u2010based wafer\u2010fabrication rooms and a complex array of processes and chemicals. Its epidemiologic components were a historical examination of spontaneous abortion rates among 902 women, a prospective evaluation of reproductive outcomes in 483 women, and a cross\u2010sectional review of MAle fertility and of respiratory, ergonomic, neurologic, or gastrointestinal problems among 3,175 men and women. Designing an exposure assessment strategy presented unique problems, and multiple agents had to be evaluated. A three\u2010tiered approach to exposure assessment was developed to reflect increasing specificity of exposures. At the first tier, employees were divided into fabrication and nonfabrication groups. At the second tier, work groups with qualitatively different exposures were determined. At the third tier, intensity of exposures to specific chemical, physical, and ergonomic agents was evaluated. Evaluations were based on worker reports of tasks performed, moderated by fabrication\u2010specific factors observed by study industrial hygienists during site visits.<\/jats:p>","DOI":"10.1002\/ajim.4700280604","type":"journal-article","created":{"date-parts":[[2010,8,17]],"date-time":"2010-08-17T00:49:12Z","timestamp":1282006152000},"page":"661-680","source":"Crossref","is-referenced-by-count":25,"title":["Tiered exposure\u2010assessment strategy in the semiconductor health study"],"prefix":"10.1002","volume":"28","author":[{"given":"S. Katharine","family":"Hammond","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. Katharine","family":"Hammond","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cynthia J.","family":"Hines","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marilyn F.","family":"Hallock","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Susan R.","family":"Woskle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sassan","family":"Abdollahzadeh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C. Robert","family":"Iden","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ellen","family":"Anson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fred","family":"Ramsey","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marc B.","family":"Schenker","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2010,8,16]]},"reference":[{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1002\/ajim.4700280608"},{"key":"e_1_2_1_3_1","first-page":"18","volume-title":"\u201cThreshold Limit Values for Chemical Substances and Physical Agents in the Work Environment and Biological Exposure Indices With Intended Changes for 1984\u20131985.\u201d","year":"1984"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1002\/ajim.4700280605"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1080\/1047322X.1993.10388229"},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/ajim.4700280607"},{"key":"e_1_2_1_7_1","doi-asserted-by":"crossref","DOI":"10.1063\/1.37130","volume-title":"Exposure and control assessment of semiconductor manufacturing","author":"Jones JH","year":"1988"},{"key":"e_1_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1539\/joh1959.21.29"},{"key":"e_1_2_1_9_1","unstructured":"NIOSH (1991):\u201cOccupational Exposure to Ethylene Glycol Monomethyl Ether Ethylene Glycol Monoethyl Ether and their Acetates.\u201dCriteria for a Recommended Standard DHHS(NIOSH) pub. no. 91\u2014119."},{"key":"e_1_2_1_10_1","first-page":"543","article-title":"Spontaneous abortion and general illness symptoms among semiconductor manufacturers","volume":"30","author":"Pastides H","year":"1988","journal-title":"J Occup Med"},{"key":"e_1_2_1_11_1","first-page":"47","volume-title":"\u201cHazard Assessment and Control Technology in Semiconductor Manufacturing.\u201d","author":"Scarpace L","year":"1989"},{"key":"e_1_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1002\/ajim.4700280603"},{"key":"e_1_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1002\/ajim.4700280606"}],"container-title":["American Journal of Industrial Medicine"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fajim.4700280604","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/ajim.4700280604","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,26]],"date-time":"2023-10-26T18:33:01Z","timestamp":1698345181000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/ajim.4700280604"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1995,12]]},"references-count":12,"journal-issue":{"issue":"6","published-print":{"date-parts":[[1995,12]]}},"alternative-id":["10.1002\/ajim.4700280604"],"URL":"https:\/\/doi.org\/10.1002\/ajim.4700280604","archive":["Portico"],"relation":{},"ISSN":["0271-3586","1097-0274"],"issn-type":[{"value":"0271-3586","type":"print"},{"value":"1097-0274","type":"electronic"}],"subject":[],"published":{"date-parts":[[1995,12]]}}}