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Precise diagnosis is possible via histopathologic examination to monitor the existence of fungus and performance of a fungal culture for confirmation. Phase\u2010contrast hard X\u2010ray microscopy using synchrotron radiation provides 70\u2010nm spatial resolution and enables imaging of minute internal cellular structures. This study confirms the feasibility of diagnosing onychomycosis using a phase\u2010contrast hard X\u2010ray microscope developed at 1B2 beam line using a Pohang light source. Microsc. Res. 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