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Rapid Commun."],"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Poly(3,4\u2010ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) films have emerged as potential alternatives to indium\u2013tin oxide as transparent electrodes in optoelectronic devices because of their superior transparency, flexibility, and chemical doping stability. However, pristine PEDOT:PSS films show low conductivities because the insulating PSS\u2010rich domains isolate the conductive PEDOT\u2010rich domains. In this study, the conductivities and corresponding spatially resolved Raman properties of PEDOT:PSS thin films treated with various concentrations of H<jats:sub>2<\/jats:sub>SO<jats:sub>4<\/jats:sub> are presented. After the PEDOT:PSS films are treated with the H<jats:sub>2<\/jats:sub>SO<jats:sub>4<\/jats:sub> solutions, their electrical conductivities are significantly improved from 0.5 (nontreated) to 4358 S cm<jats:sup>\u22121<\/jats:sup> (100% v\/v). Raman heat maps of the peak shifts and widths of the C<jats:sub>\u03b1<\/jats:sub>\u2550C<jats:sub>\u03b2<\/jats:sub> stretching mode are constructed. A blueshift and width decrease of the C<jats:sub>\u03b1<\/jats:sub>\u2550C<jats:sub>\u03b2<\/jats:sub> Raman mode in PEDOT are uniformly observed in the entire measurement area (20 \u00d7 20 \u00b5m<jats:sup>2<\/jats:sup>), indicating that microstructural transitions are successfully accomplished across the area from the coiled to linear conformation and high crystallinity upon H<jats:sub>2<\/jats:sub>SO<jats:sub>4<\/jats:sub> treatment. Thus, it is proved that comprehensive Raman map analysis can be easily utilized to clarify microstructural properties distributed in large areas induced by various dopants. These results also offer valuable insights for evaluating and optimizing the performance of other conductive thin films.<\/jats:p>","DOI":"10.1002\/marc.202400299","type":"journal-article","created":{"date-parts":[[2024,6,8]],"date-time":"2024-06-08T09:03:52Z","timestamp":1717837432000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Enhanced Microstructural Uniformity in Sulfuric\u2010Acid\u2010Treated Poly(3,4\u2010Ethylenedioxythiophene):Poly(Styrene Sulfonate) Films Using Raman Map Analysis"],"prefix":"10.1002","author":[{"given":"Hyewon","family":"Kim","sequence":"first","affiliation":[{"name":"BB21 Plus Program, Department of Chemistry Pukyong National University  Busan 48513 Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiyeong","family":"Park","sequence":"additional","affiliation":[{"name":"BB21 Plus Program, Department of Chemistry Pukyong National University  Busan 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