{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T21:14:13Z","timestamp":1761513253680},"reference-count":29,"publisher":"Wiley","issue":"6","license":[{"start":{"date-parts":[[2013,2,25]],"date-time":"2013-02-25T00:00:00Z","timestamp":1361750400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Scanning"],"published-print":{"date-parts":[[2013,11]]},"abstract":"<jats:title>Summary<\/jats:title><jats:sec><jats:label \/><jats:p>Transmission electron forward scatter diffraction (t\u2010EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold\u2010field emission scanning electron microscope (CFE\u2010SEM). We demonstrated that t\u2010EFSD is applicable for tilt angles ranging from \u221220\u00b0 to \u221240\u00b0. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE\u2010SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam\/mechanical drift are important limitations in the CFE\u2010SEM used in this work. Finally, the importance of t\u2010EFSD in materials science characterization was illustrated through three examples of phase identification and orientation mapping. SCANNING 35:375\u2013386, 2013. \u00a9 2013 Wiley Periodicals, Inc.<\/jats:p><\/jats:sec>","DOI":"10.1002\/sca.21078","type":"journal-article","created":{"date-parts":[[2013,2,25]],"date-time":"2013-02-25T17:12:43Z","timestamp":1361812363000},"page":"375-386","source":"Crossref","is-referenced-by-count":28,"title":["Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold\u2010field emission scanning electron microscope for nanomaterials characterization"],"prefix":"10.1002","volume":"35","author":[{"given":"Nicolas","family":"Brodusch","sequence":"first","affiliation":[{"name":"Mining and Materials Engineering Department McGill University Montr\u00e9al, Qu\u00e9bec Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hendrix","family":"Demers","sequence":"additional","affiliation":[{"name":"Mining and Materials Engineering Department McGill University Montr\u00e9al, Qu\u00e9bec Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michel","family":"Trudeau","sequence":"additional","affiliation":[{"name":"Institut de Recherche d'Hydro\u2010Qu\u00e9bec Varennes, Qu\u00e9bec Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raynald","family":"Gauvin","sequence":"additional","affiliation":[{"name":"Mining and Materials Engineering Department McGill University Montr\u00e9al, Qu\u00e9bec Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2013,2,25]]},"reference":[{"key":"e_1_2_7_2_1","doi-asserted-by":"publisher","DOI":"10.1002\/sca.1998.4950200210"},{"key":"e_1_2_7_3_1","doi-asserted-by":"publisher","DOI":"10.1111\/jmi.12007\/abstract"},{"key":"e_1_2_7_4_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-88136-2_5"},{"key":"e_1_2_7_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2007.03.010"},{"key":"e_1_2_7_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/sca.20262"},{"key":"e_1_2_7_7_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3205-4_1"},{"key":"e_1_2_7_8_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.0022-2720.2004.01321.x"},{"key":"e_1_2_7_9_1","volume-title":"L'Analyse EBSD\u2014Principes et Applications","author":"Dingley DJ.","year":"2004"},{"key":"e_1_2_7_10_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-88136-2_6"},{"key":"e_1_2_7_11_1","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927605506445"},{"key":"e_1_2_7_12_1","first-page":"154","volume-title":"Frontiers of characterization and metrology for nanoelectronics","author":"Geiss RH","year":"2009"},{"key":"e_1_2_7_13_1","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927610094018"},{"key":"e_1_2_7_14_1","doi-asserted-by":"publisher","DOI":"10.1002\/sca.1998.4950200105"},{"key":"e_1_2_7_15_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2818.2011.03566.x"},{"key":"e_1_2_7_16_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature08879"},{"key":"e_1_2_7_17_1","volume-title":"Scanning microscopy for nanotechnology\u2014techniques and applications","author":"Maitland T","year":"2006"},{"key":"e_1_2_7_18_1","doi-asserted-by":"publisher","DOI":"10.1002\/jemt.1060080206"},{"key":"e_1_2_7_19_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-2617-3_4"},{"key":"e_1_2_7_20_1","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-540-38967-5","volume-title":"Scanning electron microscopy\u2014physics of image formation and microanalysis","author":"Reimer L.","year":"1998"},{"key":"e_1_2_7_21_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-88136-2_1"},{"key":"e_1_2_7_22_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2818.2005.01475.x"},{"key":"e_1_2_7_23_1","doi-asserted-by":"publisher","DOI":"10.1179\/026708309X12506933873828"},{"key":"e_1_2_7_24_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2012.06.004"},{"key":"e_1_2_7_25_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0968-4328(97)00032-2"},{"key":"e_1_2_7_26_1","doi-asserted-by":"publisher","DOI":"10.1080\/095008396180290"},{"key":"e_1_2_7_27_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-88136-2_17"},{"key":"e_1_2_7_28_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-76501-3"},{"key":"e_1_2_7_29_1","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927606060090"},{"key":"e_1_2_7_30_1","doi-asserted-by":"publisher","DOI":"10.1002\/crat.201100125"}],"container-title":["Scanning"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fsca.21078","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fsca.21078","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/sca.21078","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T17:10:49Z","timestamp":1696525849000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/sca.21078"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,2,25]]},"references-count":29,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2013,11]]}},"alternative-id":["10.1002\/sca.21078"],"URL":"https:\/\/doi.org\/10.1002\/sca.21078","archive":["Portico"],"relation":{},"ISSN":["0161-0457","1932-8745"],"issn-type":[{"value":"0161-0457","type":"print"},{"value":"1932-8745","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,2,25]]}}}