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A facile 4\u2010Acetamidobenzoic acid (containing an acetamido, a carboxyl, and a benzene ring)\u2010based molecular synergistic passivation (MSP) strategy is developed here to engineer the SnO<jats:sub>x<\/jats:sub>\/perovskite interface, in which dense SnO<jats:sub>x<\/jats:sub> are prepared using an E\u2010beam evaporation technology while the perovskite is deposited with vacuum flash evaporation deposition method. MSP engineering can synergistically passivate defects at the SnO<jats:sub>x<\/jats:sub>\/perovskite interface by coordinating with Sn<jats:sup>4+<\/jats:sup> and Pb<jats:sup>2+<\/jats:sup> with functional group \uf8ffC\uf8feO in the acetamido and carboxyl. The optimized solar cell devices can achieve the highest efficiency of 22.51% based on E\u2010Beam deposited SnO<jats:sub>x<\/jats:sub> and 23.29% based on solution\u2010processed SnO<jats:sub>2<\/jats:sub>, respectively, accompanied by excellent stability exceeding 3000\u00a0h. Further, the self\u2010powered photodetectors exhibit a remarkably low dark current of 5.22\u00a0\u00d7\u00a010<jats:sup>\u22129<\/jats:sup>\u00a0A\u00a0cm<jats:sup>\u22122<\/jats:sup>, a response of 0.53\u00a0A\u00a0W<jats:sup>\u22121<\/jats:sup> at zero bias, a detection limit of 1.3\u00a0\u00d7\u00a010<jats:sup>13<\/jats:sup>\u00a0Jones, and a linear dynamic range up to 80.4\u00a0dB. This work proposes a molecular synergistic passivation strategy to enhance the efficiency and responsivity of solar cells and self\u2010powered photodetectors.<\/jats:p>","DOI":"10.1002\/smll.202303200","type":"journal-article","created":{"date-parts":[[2023,5,13]],"date-time":"2023-05-13T13:41:57Z","timestamp":1683985317000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":43,"title":["Molecular Synergistic Passivation for Efficient Perovskite Solar Cells and Self\u2010Powered Photodetectors"],"prefix":"10.1002","volume":"19","author":[{"given":"Chunlei","family":"Chen","sequence":"first","affiliation":[{"name":"School of Materials Science and Engineering State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology  Tianjin 300130 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yunfei","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Materials Science and Engineering State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology  Tianjin 300130 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Deyu","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Materials Science and Engineering State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology  Tianjin 300130 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mengjia","family":"Li","sequence":"additional","affiliation":[{"name":"School of Materials Science and Engineering State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology  Tianjin 300130 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zuolin","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Materials Science and Engineering State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology  Tianjin 300130 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hongjian","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Materials Science and Engineering State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology  Tianjin 300130 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yinsu","family":"Feng","sequence":"additional","affiliation":[{"name":"School of Materials Science and Engineering State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology  Tianjin 300130 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chen","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Materials Science and Engineering State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology  Tianjin 300130 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jie","family":"Sun","sequence":"additional","affiliation":[{"name":"Center for Excellence in Nanoscience (CAS) Key Laboratory of Nanosystem and Hierarchical Fabrication (CAS) National Center for Nanoscience and Technology  Beijing 100190 China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiangzhao","family":"Chen","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optoelectronic Technology &amp; 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