{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,30]],"date-time":"2026-03-30T11:02:53Z","timestamp":1774868573596,"version":"3.50.1"},"reference-count":59,"publisher":"Wiley","issue":"16","license":[{"start":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T00:00:00Z","timestamp":1769731200000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"},{"start":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T00:00:00Z","timestamp":1769731200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/100019377","name":"Materials and Manufacturing Directorate","doi-asserted-by":"publisher","award":["FA8650\u201021\u2010C5711"],"award-info":[{"award-number":["FA8650\u201021\u2010C5711"]}],"id":[{"id":"10.13039\/100019377","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000181","name":"Air Force Office of Scientific Research","doi-asserted-by":"publisher","award":["LRIR23RXCOR003"],"award-info":[{"award-number":["LRIR23RXCOR003"]}],"id":[{"id":"10.13039\/100000181","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Small"],"published-print":{"date-parts":[[2026,3]]},"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    CuInP\n                    <jats:sub>2<\/jats:sub>\n                    S\n                    <jats:sub>6<\/jats:sub>\n                    (CIPS) is an emerging 2D room\u2010temperature ferroelectric material that has recently attracted much attention. Its ferroelectricity is mainly affected by the motion of copper (Cu) ions in the lattice, so understanding the properties of Cu ions therein is imperative for potential applications. Here, we report the direct observation of electron beam induced Cu ion migration and aggregation dynamics in CIPS by using a combination of in situ transmission electron microscopy and simulations. Both electron beam irradiation experiments and density functional theory (DFT) calculations confirm the instability of Cu ions, with electron beam irradiation experiments capturing high mobility structural degradation dynamics at the atomic scale. The results further suggest that the lateral electric field resulting from the positive sample charging induced by the electron\u2010matter interactions can influence the collective migration dynamics of Cu ions. Furthermore, it is found that these migrated Cu ions tend to aggregate at physical boundaries either set by the substrate or the sample itself and eventually form Cu nanoparticles. This work thus provides a comprehensive understanding of the behavior of Cu ions in CIPS ranging from the atomic scale to the mesoscopic scale, and will help guide the design of novel CIPS\u2010based electronic devices.\n                  <\/jats:p>","DOI":"10.1002\/smll.202509539","type":"journal-article","created":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T14:32:21Z","timestamp":1769783541000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Direct Observation of Electron Beam Induced Cu Ion Migration and Aggregation Dynamics in van der Waals Layered CuInP\n                    <sub>2<\/sub>\n                    S\n                    <sub>6<\/sub>"],"prefix":"10.1002","volume":"22","author":[{"given":"Shuai","family":"Jiang","sequence":"first","affiliation":[{"name":"Department of Materials Science and Engineering University of Connecticut  Storrs Connecticut USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Serzat","family":"Safaltin","sequence":"additional","affiliation":[{"name":"Institute of Materials Science University of Connecticut  Storrs Connecticut USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Meltem","family":"Bolluk","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Engineering University of Connecticut  Storrs Connecticut USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael A.","family":"Susner","sequence":"additional","affiliation":[{"name":"Materials and Manufacturing Directorate Air Force Research Laboratory  Wright\u2010Patterson Air Force Base Ohio USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benjamin S.","family":"Conner","sequence":"additional","affiliation":[{"name":"Materials and Manufacturing Directorate Air Force Research Laboratory  Wright\u2010Patterson Air Force Base Ohio USA"},{"name":"Azimuth Corporation  Fairborn Ohio USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Emmanuel","family":"Rowe","sequence":"additional","affiliation":[{"name":"Materials and Manufacturing Directorate Air Force Research Laboratory  Wright\u2010Patterson Air Force Base Ohio USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. Pamir","family":"Alpay","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Engineering University of Connecticut  Storrs Connecticut USA"},{"name":"Institute of Materials Science University of Connecticut  Storrs Connecticut USA"},{"name":"Department of Physics University of Connecticut  Storrs Connecticut USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8365-3098","authenticated-orcid":false,"given":"Volkan","family":"Ortalan","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Engineering University of Connecticut  Storrs Connecticut 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