{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,23]],"date-time":"2026-10-23T02:39:14Z","timestamp":1792723154999,"version":"4.5.0"},"reference-count":62,"publisher":"Wiley","issue":"59","license":[{"start":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T00:00:00Z","timestamp":1787011200000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"},{"start":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T00:00:00Z","timestamp":1787011200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Small"],"published-print":{"date-parts":[[2026,10]]},"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>High\u2010density, semiconducting aligned carbon nanotube arrays (A\u2010CNTs) are essential for next\u2010generation electronics. Dimension\u2010limited self\u2010alignment (DLSA) is a leading route to wafer\u2010scale A\u2010CNT fabrication, yet the instabilities that limit array quality remain poorly understood, hampering targeted process optimization. Here, we establish a multiscale characterization framework combining cross\u2010polarized optical microscopy (xPOM) and scanning electron microscopy (SEM) to evaluate DLSA\u2010prepared A\u2010CNT wafers and identify the underlying film\u2010formation mechanism. Notably, characterization of the entire 4\u2010inch wafer is achieved within approximately 1 h, providing an efficient route for high\u2010throughput macroscopic inspection. Cross\u2010validation across multiple characterization methods reveals a hierarchical morphology comprising four spatial regions and recurring macroscopic defects. These observations, together with in situ measurements of DLSA dynamics, support a two\u2010stage self\u2010assembly mechanism: initial two\u2010dimensional biphasic self\u2010assembly behavior followed by quasi\u2010one\u2010dimensional triphasic self\u2010assembly coupled to continuous transfer. The second stage, imposed by orientational confinement at the air\/top\u2010layer\/CNT\u2010dispersion interface, is proposed to drive globally consistent alignment. Specific defects are further associated with distinct kinematic processes and mechanical stress states. This mechanistic picture provides a framework for suppressing non\u2010idealities in A\u2010CNTs and supporting their eventual integration into CNT\u2010based logic circuits.<\/jats:p>","DOI":"10.1002\/smll.75336","type":"journal-article","created":{"date-parts":[[2026,8,19]],"date-time":"2026-08-19T06:20:59Z","timestamp":1787120459000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Multiscale Characterization and Two\u2010Stage Assembly Mechanism of Dimension\u2010Limited Self\u2010Aligned Carbon Nanotube Arrays"],"prefix":"10.1002","volume":"22","author":[{"given":"Bing","family":"Gao","sequence":"first","affiliation":[{"name":"State Key Laboratory of Silicon and Advanced Semiconductor Materials School of Materials Science and Engineering Zhejiang University  Hangzhou Zhejiang 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Hangzhou Zhejiang China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hanyu","family":"Xu","sequence":"additional","affiliation":[{"name":"Chongqing Institute of Carbon\u2010Based Integrated Circuits Peking University  Chongqing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5393-059X","authenticated-orcid":false,"given":"Yu","family":"Xia","sequence":"additional","affiliation":[{"name":"Key Laboratory For the Physics and Chemistry of Nanodevices and Center for Carbon\u2010based Electronics School of Electronics Peking University  Beijing China"},{"name":"Institute of Carbon\u2010Based Thin Film Electronics Peking University  Taiyuan Shanxi China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1622-3447","authenticated-orcid":false,"given":"Zhiyong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Key Laboratory For the Physics and Chemistry of Nanodevices and Center for Carbon\u2010based Electronics School of Electronics Peking University  Beijing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8845-5664","authenticated-orcid":false,"given":"Chuanhong","family":"Jin","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Silicon and Advanced Semiconductor Materials School of Materials Science and Engineering Zhejiang University  Hangzhou Zhejiang China"},{"name":"Chongqing Institute of Carbon\u2010Based Integrated Circuits Peking University  Chongqing 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