{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,25]],"date-time":"2026-09-25T11:07:02Z","timestamp":1790334422418,"version":"4.1.0"},"reference-count":55,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,9,25]],"date-time":"2026-09-25T00:00:00Z","timestamp":1790294400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"},{"start":{"date-parts":[[2026,9,25]],"date-time":"2026-09-25T00:00:00Z","timestamp":1790294400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003704","name":"Korea Research Institute of Chemical Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003704","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Small"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    Conductive bridging random access memory (CBRAM) is a promising candidate for next\u2010generation memory and neuromorphic computing. However, the stochastic nature of conductive filament rupture and high off\u2010state leakage current often severely limit the on\/off current ratio and device reliability. Here, we report a high\u2010performance Ag\/SiO\n                    <jats:sub>2<\/jats:sub>\n                    \/Graphene\/Pt memristor (Gr\u2010CBMEM) that exploits weak van der Waals (vdW) interaction at the electrode interface to control filament dynamics. Density functional theory (DFT) calculations reveal that the binding energy between the Ag filament and graphene surface is merely 0.48\u00a0eV, significantly lower than the strong metallic bonding (6.25\u00a0eV) at the Ag\/Pt interface and the Ag\u2013Ag cohesive energy (1.94\u00a0eV). This weak interfacial bonding facilitates clean and complete rupture of the filament during the RESET process, resulting in an ultralow off\u2010state current of 100 fA and a remarkably high on\/off ratio 10\n                    <jats:sup>9<\/jats:sup>\n                    . By optimizing SiO\n                    <jats:sub>2<\/jats:sub>\n                    thickness to 40\u00a0nm to suppress tunneling leakage, the device demonstrates stable bipolar switching and excellent endurance without the stuck\u2010set phenomenon. Furthermore, hardware\u2010based convolutional neural network (CNN) simulations demonstrate that the Gr\u2010CBMEM achieves recognition accuracy of &gt;91% on the CIFAR\u201010 image dataset. This work suggests that vdW interface engineering is a viable strategy for developing energy\u2010efficient, high\u2010reliability neuromorphic hardware.\n                  <\/jats:p>","DOI":"10.1002\/smll.75933","type":"journal-article","created":{"date-parts":[[2026,9,25]],"date-time":"2026-09-25T10:24:41Z","timestamp":1790331881000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["High\u2010Performance Conductive Bridging Memristor via van der Waals Interface Engineering for Neuromorphic Computing"],"prefix":"10.1002","author":[{"given":"Van Dam","family":"Do","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering Sungkyunkwan University  Suwon Republic of Korea"},{"name":"Viettel Semiconductor Center Viettel Group  Hanoi Vietnam"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyung Jin","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering Sungkyunkwan University  Suwon Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-6991-3591","authenticated-orcid":false,"given":"Minh Chien","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering Sungkyunkwan University  Suwon Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hong Woon","family":"Yun","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering Sungkyunkwan University  Suwon Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4118-9589","authenticated-orcid":false,"given":"Dinh Loc","family":"Duong","sequence":"additional","affiliation":[{"name":"Department of Energy Science Department of Physics Sungkyunkwan University  Suwon Republic of Korea"},{"name":"Department of Physics and Astronomy and Frontier Institute for Research in Sensor Technologies (FIRST) University of Maine  Orono Maine USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Van Tu","family":"Vu","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering Sungkyunkwan University  Suwon Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lei","family":"Liao","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Chemo\/Biosensing and Chemometrics College of Semiconductor (College of Integrated Circuit) Hunan University  Changsha People's Republic of China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4553-6338","authenticated-orcid":false,"given":"Xuming","family":"Zou","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Chemo\/Biosensing and Chemometrics College of Semiconductor (College of Integrated Circuit) Hunan University  Changsha People's Republic of China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7093-4835","authenticated-orcid":false,"given":"Huamin","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering University at Buffalo The State University of New York  Buffalo New York USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2873-8176","authenticated-orcid":false,"given":"Thanh Luan","family":"Phan","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering Sungkyunkwan University  Suwon Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7399-307X","authenticated-orcid":false,"given":"Woo Jong","family":"Yu","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering Sungkyunkwan University  Suwon Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2026,9,25]]},"reference":[{"key":"e_1_2_9_2_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41578\u2010019\u20100159\u20103"},{"key":"e_1_2_9_3_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41563\u2010019\u20100291\u2010x"},{"key":"e_1_2_9_4_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928\u2010018\u20100023\u20102"},{"key":"e_1_2_9_5_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.240"},{"key":"e_1_2_9_6_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928\u2010017\u20100006\u20108"},{"key":"e_1_2_9_7_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.4c01629"},{"key":"e_1_2_9_8_1","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202503877"},{"key":"e_1_2_9_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms12725"},{"key":"e_1_2_9_10_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010023\u201038667\u20103"},{"key":"e_1_2_9_11_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201703363"},{"key":"e_1_2_9_12_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565\u2010021\u201000921\u20104"},{"key":"e_1_2_9_13_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586\u2010020\u20102861\u20100"},{"key":"e_1_2_9_14_1","doi-asserted-by":"crossref","unstructured":"M. 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