{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,26]],"date-time":"2026-09-26T08:01:55Z","timestamp":1790409715696,"version":"4.1.0"},"reference-count":45,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,9,26]],"date-time":"2026-09-26T00:00:00Z","timestamp":1790380800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,9,26]],"date-time":"2026-09-26T00:00:00Z","timestamp":1790380800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["463184206 \u2013 SFB 1548 FLAIR"],"award-info":[{"award-number":["463184206 \u2013 SFB 1548 FLAIR"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["127000\u2010832011"],"award-info":[{"award-number":["127000\u2010832011"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003052","name":"Ministry of Trade, Industry and Energy","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Small"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    Space charge layers (SCLs) at grain boundaries play a crucial role in modulating electric fields and thereby influence functional properties of materials. However, experimental analysis of these localized electric fields and the corresponding charge distribution remains challenging. Conventional center\u2010of\u2010mass (CoM) analysis in scanning transmission electron microscopy differential phase contrast (STEM\u2010DPC) is strongly affected by orientation\u2010dependent contrast and dynamical scattering. Here, we demonstrate that combining electron beam precession with advanced post\u2010processing, employing iterative edge detection and singular value decomposition (SVD), enables reliable, unbiased diffraction shift measurements with minimal crystallographic artefacts. The new method accurately refines the central disk position in nanobeam electron diffraction (NBED) patterns and thus significantly improves the extraction of the local electric field and corresponding charge distribution. Comparison with conventional CoM methods shows superior accuracy and robustness for random grain boundaries in BaTiO\n                    <jats:sub>3<\/jats:sub>\n                    and SrTiO\n                    <jats:sub>3<\/jats:sub>\n                    as exemplary case studies. The experimental work is complemented by atomistic simulations to separate the electric field of the SCL from the mean inner potential difference of the grain boundary and the elemental segregation around the grain boundary. The in\u2010depth analysis shows that our approach enables high\u2010fidelity mapping of electromagnetic fields and their charge distribution in complex polycrystalline specimens for improved quantitative analysis.\n                  <\/jats:p>","DOI":"10.1002\/smll.75940","type":"journal-article","created":{"date-parts":[[2026,9,26]],"date-time":"2026-09-26T07:56:13Z","timestamp":1790409373000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Precise Nanoscale Mapping of Electric Fields Across Random Grain Boundaries in Polycrystalline Oxides Using Precession\u2010Assisted 4D\u2010STEM"],"prefix":"10.1002","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5096-5965","authenticated-orcid":false,"given":"Sangjun","family":"Kang","sequence":"first","affiliation":[{"name":"In situ Electron Microscopy Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"},{"name":"Institute of Nanotechnology (INT) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"},{"name":"Karlsruhe Nano Micro Facility (KNMFi) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyeyoung","family":"Cho","sequence":"additional","affiliation":[{"name":"In situ Electron Microscopy Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"},{"name":"Institute of Nanotechnology (INT) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-2131-5497","authenticated-orcid":false,"given":"Maximilian","family":"T\u00f6llner","sequence":"additional","affiliation":[{"name":"In situ Electron Microscopy Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"},{"name":"Institute of Nanotechnology (INT) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-0909-649X","authenticated-orcid":false,"given":"Anna Rose","family":"Nelson","sequence":"additional","affiliation":[{"name":"In situ Electron Microscopy Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ziming","family":"Ding","sequence":"additional","affiliation":[{"name":"Institute of Nanotechnology (INT) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1314-038X","authenticated-orcid":false,"given":"Xiaoke","family":"Mu","sequence":"additional","affiliation":[{"name":"School of Materials and Energy and Electron Microscopy Centre Lanzhou University  Lanzhou China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9817-7047","authenticated-orcid":false,"given":"Di","family":"Wang","sequence":"additional","affiliation":[{"name":"Institute of Nanotechnology (INT) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"},{"name":"Karlsruhe Nano Micro Facility (KNMFi) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wolfgang","family":"Rheinheimer","sequence":"additional","affiliation":[{"name":"Institute For Ceramic Materials and Technologies University of Stuttgart  Stuttgart Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kai","family":"Wang","sequence":"additional","affiliation":[{"name":"Mechanics of Functional Materials Division Institute of Materials Science Technische Universit\u00e4t Darmstadt  Darmstadt Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5906-5341","authenticated-orcid":false,"given":"Bai\u2010Xiang","family":"Xu","sequence":"additional","affiliation":[{"name":"Mechanics of Functional Materials Division Institute of Materials Science Technische Universit\u00e4t Darmstadt  Darmstadt Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2404-1265","authenticated-orcid":false,"given":"Jakob Konstantin","family":"Laux","sequence":"additional","affiliation":[{"name":"Materials Modeling Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mahmoud","family":"Serour","sequence":"additional","affiliation":[{"name":"Materials Modeling Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4669-8056","authenticated-orcid":false,"given":"Karsten","family":"Albe","sequence":"additional","affiliation":[{"name":"Materials Modeling Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7463-1495","authenticated-orcid":false,"given":"Andreas","family":"Klein","sequence":"additional","affiliation":[{"name":"Electronic Structure of Materials Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5701-4006","authenticated-orcid":false,"given":"Christian","family":"K\u00fcbel","sequence":"additional","affiliation":[{"name":"In situ Electron Microscopy Department of Materials Science Technical University of Darmstadt (TUDa)  Darmstadt Germany"},{"name":"Institute of Nanotechnology (INT) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"},{"name":"Karlsruhe Nano Micro Facility (KNMFi) Karlsruhe Institute of Technology (KIT)  Eggenstein\u2010Leopoldshafen Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2026,9,26]]},"reference":[{"key":"e_1_2_10_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2014.10.063"},{"key":"e_1_2_10_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.pmatsci.2017.04.009"},{"key":"e_1_2_10_4_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.pmatsci.2005.07.001"},{"key":"e_1_2_10_5_1","doi-asserted-by":"publisher","DOI":"10.1146\/annurev.ms.17.080187.000421"},{"key":"e_1_2_10_6_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4866359"},{"key":"e_1_2_10_7_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1151\u20102916.1993.tb03964.x"},{"key":"e_1_2_10_8_1","doi-asserted-by":"publisher","DOI":"10.1039\/b904100a"},{"key":"e_1_2_10_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41565\u2010023\u201001349\u20108"},{"key":"e_1_2_10_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2017.07.013"},{"key":"e_1_2_10_11_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41578\u2010019\u20100165\u20105"},{"key":"e_1_2_10_12_1","doi-asserted-by":"publisher","DOI":"10.1016\/0079\u20106786(95)00004\u2010E"},{"key":"e_1_2_10_13_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2018.12.003"},{"key":"e_1_2_10_14_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5006837"},{"key":"e_1_2_10_15_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.129.137701"},{"key":"e_1_2_10_16_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep10040"},{"key":"e_1_2_10_17_1","doi-asserted-by":"publisher","DOI":"10.1002\/pssb.201552288"},{"key":"e_1_2_10_18_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2017.07.002"},{"key":"e_1_2_10_19_1","doi-asserted-by":"publisher","DOI":"10.1063\/5.0006969"},{"key":"e_1_2_10_20_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.122.106102"},{"key":"e_1_2_10_21_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2025.114218"},{"key":"e_1_2_10_22_1","doi-asserted-by":"publisher","DOI":"10.1038\/s44287\u2010024\u201000117\u20107"},{"key":"e_1_2_10_23_1","doi-asserted-by":"publisher","DOI":"10.1017\/S143192761800507X"},{"key":"e_1_2_10_24_1","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202311635"},{"key":"e_1_2_10_25_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2020.113097"},{"key":"e_1_2_10_26_1","doi-asserted-by":"publisher","DOI":"10.1111\/jmi.13271"},{"key":"e_1_2_10_27_1","doi-asserted-by":"publisher","DOI":"10.1093\/jmicro\/dfaa065"},{"key":"e_1_2_10_28_1","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927619000497"},{"key":"e_1_2_10_29_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2021.113321"},{"key":"e_1_2_10_30_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010025\u201056521\u20106"},{"key":"e_1_2_10_31_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467\u2010024\u201053014\u2010w"},{"key":"e_1_2_10_32_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2023.113745"},{"key":"e_1_2_10_33_1","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927617007723"},{"key":"e_1_2_10_34_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.0c04544"},{"key":"e_1_2_10_35_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2022.113503"},{"key":"e_1_2_10_36_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2016.03.006"},{"key":"e_1_2_10_37_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.97.043843"},{"key":"e_1_2_10_38_1","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927612001274"},{"key":"e_1_2_10_39_1","doi-asserted-by":"publisher","DOI":"10.1088\/1361-648X\/ae2727"},{"key":"e_1_2_10_40_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41524-021-00559-9"},{"key":"e_1_2_10_41_1","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2407.17650"},{"key":"e_1_2_10_42_1","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927620014701"},{"key":"e_1_2_10_43_1","doi-asserted-by":"publisher","DOI":"10.1039\/D3CP05870K"},{"key":"e_1_2_10_44_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.77.104102"},{"key":"e_1_2_10_45_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2020.112994"},{"key":"e_1_2_10_46_1","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2604.07545"}],"container-title":["Small"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/smll.75940","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/smll.75940","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/smll.75940","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,26]],"date-time":"2026-09-26T07:56:15Z","timestamp":1790409375000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/smll.75940"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9,26]]},"references-count":45,"alternative-id":["10.1002\/smll.75940"],"URL":"https:\/\/doi.org\/10.1002\/smll.75940","archive":["Portico"],"relation":{},"ISSN":["1613-6810","1613-6829"],"issn-type":[{"value":"1613-6810","type":"print"},{"value":"1613-6829","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,9,26]]},"assertion":[{"value":"2026-04-16","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-09-18","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-09-26","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"e75940"}}