{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,4]],"date-time":"2026-10-04T14:51:50Z","timestamp":1791125510888,"version":"4.1.0"},"reference-count":36,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,10,4]],"date-time":"2026-10-04T00:00:00Z","timestamp":1791072000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"},{"start":{"date-parts":[[2026,10,4]],"date-time":"2026-10-04T00:00:00Z","timestamp":1791072000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2024YFE0217500"],"award-info":[{"award-number":["2024YFE0217500"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62404105"],"award-info":[{"award-number":["62404105"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Small"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    Neuromorphic visual computing aims to fuse sensing, memory, and processing into a single hardware stack, enabling reliable analog weight updates. Defect engineering in two\u2010dimensional (2D) semiconductors is an effective strategy for achieving such synaptic functionality. However, in most 2D materials, the defects that confer plasticity also compromise lattice stability and degrade intrinsic performance. This work demonstrates that Bi\n                    <jats:sub>2<\/jats:sub>\n                    O\n                    <jats:sub>2<\/jats:sub>\n                    Se provides a robust, defect\u2010tolerant platform. The growth process introduces selenium vacancy (V\n                    <jats:sub>Se<\/jats:sub>\n                    ) without compromising covalent structure or the approximately 0.8 eV bandgap, yielding stable and programmable trap centers. Combined with a low\u2010trap hexagonal boron nitride (h\u2010BN) gate dielectric that suppresses extra interfacial states, the resulting Bi\n                    <jats:sub>2<\/jats:sub>\n                    O\n                    <jats:sub>2<\/jats:sub>\n                    Se\/h\u2010BN transistor exhibits analog conductance modulation, excitatory postsynaptic currents, double\u2010pulse facilitation, and long\u2010term potentiation\/inhibition, supporting hybrid electro\u2010optic learning via vacancy\u2010assisted charge trapping and persistent photoconductivity. Mapping measured device characteristics onto designed convolutional neural networks achieves 90.1% accuracy in complex image recognition, establishing an optoelectrical neuromorphic multifunctional platform for edge intelligence systems.\n                  <\/jats:p>","DOI":"10.1002\/smll.76058","type":"journal-article","created":{"date-parts":[[2026,10,4]],"date-time":"2026-10-04T13:56:42Z","timestamp":1791122202000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Selenium Vacancy\u2010Enabled 2D Bi\n                    <sub>2<\/sub>\n                    O\n                    <sub>2<\/sub>\n                    Se Optoelectronic Synapses for Neuromorphic Vision Processing"],"prefix":"10.1002","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-0400-5058","authenticated-orcid":false,"given":"Fang","family":"Yang","sequence":"first","affiliation":[{"name":"Key Laboratory of State Manipulation and Advanced Materials in Provincial Universities School of Physics and Technology Nanjing Normal University  Nanjing China"},{"name":"School of Electronic Science &amp; Engineering Southeast University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8392-2611","authenticated-orcid":false,"given":"Xin","family":"Ju","sequence":"additional","affiliation":[{"name":"Institute of Materials Research and Engineering (IMRE) Agency for Science, Technology and Research (A*STAR)  Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7609-6954","authenticated-orcid":false,"given":"Zhaofu","family":"Cheng","sequence":"additional","affiliation":[{"name":"Key Laboratory of State Manipulation and Advanced Materials in Provincial Universities School of Physics and Technology Nanjing Normal University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5016-4239","authenticated-orcid":false,"given":"Jiayi","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering Nanyang Technological University  Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6174-5466","authenticated-orcid":false,"given":"Weifan","family":"Cai","sequence":"additional","affiliation":[{"name":"Institute of Materials Research and Engineering (IMRE) Agency for Science, Technology and Research (A*STAR)  Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weiwei","family":"Zhao","sequence":"additional","affiliation":[{"name":"Key Laboratory of State Manipulation and Advanced Materials in Provincial Universities School of Physics and Technology Nanjing Normal University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6781-5827","authenticated-orcid":false,"given":"Hong Kuan","family":"Ng","sequence":"additional","affiliation":[{"name":"Institute of Materials Research and Engineering (IMRE) Agency for Science, Technology and Research (A*STAR)  Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mingxi","family":"Chen","sequence":"additional","affiliation":[{"name":"Institute of Materials Research and Engineering (IMRE) Agency for Science, Technology and Research (A*STAR)  Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xian Yi","family":"Tan","sequence":"additional","affiliation":[{"name":"Institute of Materials Research and Engineering (IMRE) Agency for Science, Technology and Research (A*STAR)  Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3513-1361","authenticated-orcid":false,"given":"Wenhui","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Physics Southeast University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9301-5559","authenticated-orcid":false,"given":"Shisheng","family":"Li","sequence":"additional","affiliation":[{"name":"School of Physics Southeast University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2757-5395","authenticated-orcid":false,"given":"Yue","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Electronic Science &amp; Engineering Southeast University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8729-0287","authenticated-orcid":false,"given":"Guoqiang","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Electronic Science &amp; Engineering Southeast University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6316-2256","authenticated-orcid":false,"given":"Zhenhua","family":"Ni","sequence":"additional","affiliation":[{"name":"School of Electronic Science &amp; Engineering Southeast University  Nanjing China"},{"name":"School of Physics Southeast University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7099-3162","authenticated-orcid":false,"given":"Junpeng","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Electronic Science &amp; Engineering Southeast University  Nanjing China"},{"name":"School of Physics Southeast University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9562-1595","authenticated-orcid":false,"given":"Dongzhi","family":"Chi","sequence":"additional","affiliation":[{"name":"Institute of Materials Research and Engineering (IMRE) Agency for Science, Technology and Research (A*STAR)  Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5451-6828","authenticated-orcid":false,"given":"Hongwei","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of State Manipulation and Advanced Materials in Provincial Universities School of Physics and Technology Nanjing Normal University  Nanjing China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8139-1984","authenticated-orcid":false,"given":"Diing Shenp","family":"Ang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering Nanyang Technological University  Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4182-6701","authenticated-orcid":false,"given":"Jing","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Electronic Science &amp; 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