{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,17]],"date-time":"2026-09-17T07:03:48Z","timestamp":1789628628010,"version":"build-2803163510"},"reference-count":53,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,9,16]],"date-time":"2026-09-16T00:00:00Z","timestamp":1789516800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,9,16]],"date-time":"2026-09-16T00:00:00Z","timestamp":1789516800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Small Methods"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    The chirality (\n                    <jats:italic>n<\/jats:italic>\n                    ,\n                    <jats:italic>m<\/jats:italic>\n                    ) of single\u2010walled carbon nanotubes (SWCNTs) critically governs their properties and growth behavior, yet reliable assignment from nanobeam electron diffraction (NBED) remains challenging because of analyst\u2010dependent procedures, manual measurement errors, and nanotube tilt relative to the incident electron beam. Here, a practical and interpretable chirality\u2010assignment protocol is developed by extending a calibration\u2010free diffraction\u2010analysis framework with local candidate search and self\u2010consistency\u2010based cross\u2010check correction. Feature extraction and candidate screening are semiautomated using an ImageJ script and an Excel VBA macro to improve efficiency and reproducibility. The protocol is evaluated using 2394 simulated NBED images spanning diameters of 0.48\u20132.3\u00a0nm, chiral angles of 0\u00b0\u201330\u00b0, and tilt angles of 0.5\u00b0\u201316.5\u00b0. The exact assignment accuracy increases from 71.6% with conventional TRUNC\u2010based analysis to 97.7% with the proposed protocol, while errors in the mean diameter, mean chiral angle, and metallic SWCNT fraction are substantially reduced. The improvement is mainly enabled by the newly introduced overlap ratio, which serves as the primary criterion for final candidate ranking. This error\u2010resilient workflow provides a reproducible route for extracting reliable structural information from experimentally imperfect diffraction patterns without requiring instrument calibration or data\u2010driven model training.\n                  <\/jats:p>","DOI":"10.1002\/smtd.71039","type":"journal-article","created":{"date-parts":[[2026,9,17]],"date-time":"2026-09-17T06:20:53Z","timestamp":1789626053000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Accurate (n,m) Assignment of Single\u2010Walled Carbon Nanotubes From Electron Diffraction Patterns Via Local Candidate Search and Self\u2010Consistency Correction"],"prefix":"10.1002","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3881-497X","authenticated-orcid":false,"given":"Hirotaka","family":"Inoue","sequence":"first","affiliation":[{"name":"Department of Applied Physics School of Science Aalto University  Espoo Finland"},{"name":"Sumitomo Electric Industries, Ltd.  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Osaka Japan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1324-5301","authenticated-orcid":false,"given":"Anastasios","family":"Karakassides","sequence":"additional","affiliation":[{"name":"Department of Applied Physics School of Science Aalto University  Espoo Finland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4728-0858","authenticated-orcid":false,"given":"Toshihiko","family":"Fujimori","sequence":"additional","affiliation":[{"name":"Sumitomo Electric Industries, Ltd.  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