{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,13]],"date-time":"2026-10-13T07:47:50Z","timestamp":1791877670639,"version":"4.3.4"},"reference-count":168,"publisher":"Wiley","license":[{"start":{"date-parts":[[2026,10,13]],"date-time":"2026-10-13T00:00:00Z","timestamp":1791849600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,10,13]],"date-time":"2026-10-13T00:00:00Z","timestamp":1791849600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/501100004359","name":"Vetenskapsr\u00e5det","doi-asserted-by":"publisher","award":["VR 2019\u201304690"],"award-info":[{"award-number":["VR 2019\u201304690"]}],"id":[{"id":"10.13039\/501100004359","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004359","name":"Vetenskapsr\u00e5det","doi-asserted-by":"publisher","award":["2024\u201305176"],"award-info":[{"award-number":["2024\u201305176"]}],"id":[{"id":"10.13039\/501100004359","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Small Methods"],"abstract":"<jats:title>ABSTRACT<\/jats:title>\n                  <jats:p>\n                    Electrolyte\u2010gated nanoscale silicon field\u2010effect transistors (Si FETs), including silicon nanoribbon FETs (SiNRFETs) and nanowire FETs (SiNWFETs), have emerged as highly promising platforms for chemical and biological sensing. As these sensors move from proof\u2010of\u2010concept demonstrations toward quantitative assays, practical performance is increasingly governed not only by nominal sensitivity, but also by their signal\u2010to\u2010noise ratio (SNR) and baseline stability. Low\u2010frequency noise (LFN), typically arising from carrier\u2010number and mobility fluctuations in the solid\u2010state device, as well as reversible ion adsorption\/desorption processes at the solid\u2013liquid interfaces, is generally characterized by an approximately 1\/\n                    <jats:italic>f<\/jats:italic>\n                    \u2010dependent power spectral density. It limits the minimum resolvable signal and thus determines the limit\u2010of\u2010detection (LoD). In parallel, slower nonstationary processes, including ion penetration and reference\u2010electrode drift, cause baseline instability that complicates quantitative sensing and array calibration. This review discusses LFN and instability in electrolyte\u2010gated nanoscale Si FET sensors as a coupled device\u2010interface\u2010readout problem. Mitigation strategies are also summarized. Representative examples illustrate how dominant noise sources can be identified and suppressed. Finally, we highlight the applications of low\u2010noise and low\u2010drift FET sensors. Next\u2010generation electrolyte\u2010gated nanoscale Si FET sensors require codesign of the transducer, sensing interface, electrolyte\/reference environment, and front\u2010end electronics to achieve a low LoD and high detection accuracy.\n                  <\/jats:p>","DOI":"10.1002\/smtd.71112","type":"journal-article","created":{"date-parts":[[2026,10,13]],"date-time":"2026-10-13T07:12:11Z","timestamp":1791875531000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Low\u2010Frequency Noise and Stability in Electrolyte\u2010Gated Nanoscale Silicon Field\u2010Effect Transistor Sensors"],"prefix":"10.1002","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5495-0253","authenticated-orcid":false,"given":"Yingtao","family":"Yu","sequence":"first","affiliation":[{"name":"\u00c5ngstr\u00f6m Laboratory, Division of Solid\u2010State Electronics, Department of Electrical Engineering Uppsala University  Uppsala Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5477-9019","authenticated-orcid":false,"given":"Zheqiang","family":"Xu","sequence":"additional","affiliation":[{"name":"\u00c5ngstr\u00f6m Laboratory, Division of Solid\u2010State Electronics, Department of Electrical Engineering Uppsala University  Uppsala Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yihan","family":"Wang","sequence":"additional","affiliation":[{"name":"\u00c5ngstr\u00f6m Laboratory, Division of Solid\u2010State Electronics, Department of Electrical Engineering Uppsala University  Uppsala Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5996-4611","authenticated-orcid":false,"given":"Qitao","family":"Hu","sequence":"additional","affiliation":[{"name":"\u00c5ngstr\u00f6m Laboratory, Division of Solid\u2010State Electronics, Department of Electrical Engineering Uppsala University  Uppsala Sweden"},{"name":"Department of Radiology Stanford University  Stanford California USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3279-2092","authenticated-orcid":false,"given":"Paul","family":"Solomon","sequence":"additional","affiliation":[{"name":"IBM Thomas J. Watson Research Center  Yorktown Heights New York USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4317-9701","authenticated-orcid":false,"given":"Zhen","family":"Zhang","sequence":"additional","affiliation":[{"name":"\u00c5ngstr\u00f6m Laboratory, Division of Solid\u2010State Electronics, Department of Electrical Engineering Uppsala University  Uppsala Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2026,10,13]]},"reference":[{"key":"e_1_2_11_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.1970.4502688"},{"key":"e_1_2_11_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.1972.324137"},{"key":"e_1_2_11_4_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0254\u20100584(99)00184\u20104"},{"key":"e_1_2_11_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mssp.2024.108387"},{"key":"e_1_2_11_6_1","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.9b00731"},{"key":"e_1_2_11_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3052772"},{"key":"e_1_2_11_8_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl080094r"},{"key":"e_1_2_11_9_1","doi-asserted-by":"publisher","DOI":"10.3390\/mi7080134"},{"key":"e_1_2_11_10_1","doi-asserted-by":"publisher","DOI":"10.3390\/bios6020021"},{"key":"e_1_2_11_11_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957\u20104484\/27\/28\/285501"},{"key":"e_1_2_11_12_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1062711"},{"key":"e_1_2_11_13_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl025875l"},{"key":"e_1_2_11_14_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2007.12.019"},{"key":"e_1_2_11_15_1","doi-asserted-by":"publisher","DOI":"10.1002\/smll.201302990"},{"key":"e_1_2_11_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2021.3056515"},{"key":"e_1_2_11_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2019.2947167"},{"key":"e_1_2_11_18_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3608155"},{"key":"e_1_2_11_19_1","doi-asserted-by":"publisher","DOI":"10.1149\/1.2123500"},{"key":"e_1_2_11_20_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl100892y"},{"key":"e_1_2_11_21_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2013.09.112"},{"key":"e_1_2_11_22_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4946857"},{"key":"e_1_2_11_23_1","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.8b01394"},{"key":"e_1_2_11_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3057285"},{"key":"e_1_2_11_25_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.abj6711"},{"key":"e_1_2_11_26_1","doi-asserted-by":"publisher","DOI":"10.1039\/D4TB00719K"},{"key":"e_1_2_11_27_1","doi-asserted-by":"publisher","DOI":"10.1002\/elsa.202100147"},{"key":"e_1_2_11_28_1","doi-asserted-by":"publisher","DOI":"10.1002\/elsa.202100207"},{"key":"e_1_2_11_29_1","doi-asserted-by":"publisher","DOI":"10.1016\/0925\u20104005(95)85043\u20100"},{"key":"e_1_2_11_30_1","doi-asserted-by":"publisher","DOI":"10.1109\/16.737468"},{"key":"e_1_2_11_31_1","doi-asserted-by":"publisher","DOI":"10.3390\/s91008336"},{"key":"e_1_2_11_32_1","doi-asserted-by":"publisher","DOI":"10.1039\/c1an15568g"},{"key":"e_1_2_11_33_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3535958"},{"key":"e_1_2_11_34_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.8b01339"},{"key":"e_1_2_11_35_1","doi-asserted-by":"crossref","unstructured":"K.Martens S.Santermans M.Gupta et\u00a0al. \u201cBioFET Technology: Aggressively Scaled pMOS FinFET as Biosensor \u201d In2019 IEEE International Electron Devices Meeting (IEDM) (IEEE 2019) 18.6.1\u201318.6.4 https:\/\/doi.org\/10.1109\/IEDM19573.2019.8993589.","DOI":"10.1109\/IEDM19573.2019.8993589"},{"key":"e_1_2_11_36_1","unstructured":"K.Martens W. V.Roy S.Severi andE.Simoen 1\/f Noise in Fully Integrated Electrolytically Gated FinFETs With Fin Width Down to 20\u00a0nm."},{"key":"e_1_2_11_37_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl0709017"},{"key":"e_1_2_11_38_1","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms1092"},{"key":"e_1_2_11_39_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3526382"},{"key":"e_1_2_11_40_1","doi-asserted-by":"publisher","DOI":"10.1109\/16.47770"},{"key":"e_1_2_11_41_1","doi-asserted-by":"publisher","DOI":"10.1109\/16.34242"},{"key":"e_1_2_11_42_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3536674"},{"key":"e_1_2_11_43_1","doi-asserted-by":"publisher","DOI":"10.1109\/16.108195"},{"key":"e_1_2_11_44_1","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.7b00285"},{"key":"e_1_2_11_45_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0925\u20104005(98)00040\u20109"},{"key":"e_1_2_11_46_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2930067"},{"key":"e_1_2_11_47_1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2929163"},{"key":"e_1_2_11_48_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3180983"},{"key":"e_1_2_11_49_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4894240"},{"key":"e_1_2_11_50_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2953362"},{"key":"e_1_2_11_51_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2024.3400926"},{"key":"e_1_2_11_52_1","doi-asserted-by":"crossref","unstructured":"Q.Hu X.Chen andH.Norstrom \u201cCurrent Gain and Low\u2010Frequency Noise of Symmetric Lateral Bipolar Junction Transistors on SOI \u201d in2018 48th European Solid\u2010State Device Research Conference (ESSDERC)(Dresden 2018) 258\u2013261 https:\/\/doi.org\/10.1109\/ESSDERC.2018.8486918.","DOI":"10.1109\/ESSDERC.2018.8486918"},{"key":"e_1_2_11_53_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.2985674"},{"key":"e_1_2_11_54_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2025.138000"},{"key":"e_1_2_11_55_1","doi-asserted-by":"publisher","DOI":"10.1088\/0034\u20104885\/44\/5\/001"},{"key":"e_1_2_11_56_1","doi-asserted-by":"publisher","DOI":"10.1016\/0038\u20101101(89)90113\u20105"},{"key":"e_1_2_11_57_1","doi-asserted-by":"publisher","DOI":"10.1109\/T\u2010ED.1984.21687"},{"key":"e_1_2_11_58_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2159723"},{"key":"e_1_2_11_59_1","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.2211240225"},{"key":"e_1_2_11_60_1","doi-asserted-by":"crossref","unstructured":"L. K. J.Vandamme X.Li andD.Rigaud \u201c1\/f Noise in MOS Transistors Due to Number or Mobility Fluctuations \u201d inAIP Conference Proceedings(AIP 1993) 345\u2013353 https:\/\/doi.org\/10.1063\/1.44663.","DOI":"10.1063\/1.44663"},{"key":"e_1_2_11_61_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.2968093"},{"key":"e_1_2_11_62_1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-60761-863-8","volume-title":"MicroRNA and Cancer","author":"Wu W.","year":"2011"},{"key":"e_1_2_11_63_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2008.12.035"},{"key":"e_1_2_11_64_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2020.128955"},{"key":"e_1_2_11_65_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0956\u20105663(01)00202\u20100"},{"key":"e_1_2_11_66_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0956\u20105663(01)00123\u20103"},{"key":"e_1_2_11_67_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.msec.2007.10.074"},{"key":"e_1_2_11_68_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2006.01.057"},{"key":"e_1_2_11_69_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2022.131458"},{"key":"e_1_2_11_70_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.9b05836"},{"key":"e_1_2_11_71_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2020.2973508"},{"key":"e_1_2_11_72_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2015.2419233"},{"key":"e_1_2_11_73_1","doi-asserted-by":"crossref","unstructured":"N.Moser C. L.Leong Y.Hu M.Boutelle andP.Georgiou \u201cAn Ion Imaging ISFET Array for Potassium and Sodium Detection \u201d in2016 IEEE International Symposium on Circuits and Systems (ISCAS)(IEEE 2016) 2847\u20132850 https:\/\/doi.org\/10.1109\/ISCAS.2016.7539186.","DOI":"10.1109\/ISCAS.2016.7539186"},{"key":"e_1_2_11_74_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2021.3105328"},{"key":"e_1_2_11_75_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2200249"},{"key":"e_1_2_11_76_1","unstructured":"D.Zhang On the Low Frequency Noise in Ion Sensing2017."},{"key":"e_1_2_11_77_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0370\u20101573(99)00123\u20104"},{"key":"e_1_2_11_78_1","unstructured":"S.Christensson I.Li\u2010Jndstrm andC.Svensson LOW FREQUENCY NOISE IN MOS TRANSISTORS."},{"key":"e_1_2_11_79_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1721637"},{"key":"e_1_2_11_80_1","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.53.497"},{"key":"e_1_2_11_81_1","unstructured":"J. G.WebsterandH. E.Eren Optical Radiation Chemical and Biomedical Measurement(No Title)."},{"key":"e_1_2_11_82_1","unstructured":"A. L.McWhorter 1\/f Noise and Related Surface Effects in Germanium 1955."},{"key":"e_1_2_11_83_1","doi-asserted-by":"crossref","unstructured":"M.Koyama M.Casse andR.Coquand \u201cStudy of Low\u2010Frequency Noise in SOI Tri\u2010Gate Silicon Nanowire MOSFETs \u201d in2013 22nd International Conference on Noise and Fluctuations (ICNF) (IEEE 2013) 1\u20134 https:\/\/doi.org\/10.1109\/ICNF.2013.6578950.","DOI":"10.1109\/ICNF.2013.6578950"},{"key":"e_1_2_11_84_1","doi-asserted-by":"crossref","unstructured":"M.Koyama M.Casse R.Coquand et\u00a0al. \u201cInfluence of Device Scaling on Low\u2010Frequency Noise in SOI Tri\u2010Gate N\u2010 and p\u2010Type Si Nanowire MOSFETs \u201d in2013 Proceedings of the European Solid\u2010State Device Research Conference (ESSDERC) (IEEE 2013) 300\u2013303 https:\/\/doi.org\/10.1109\/ESSDERC.2013.6818878.","DOI":"10.1109\/ESSDERC.2013.6818878"},{"key":"e_1_2_11_85_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2799617"},{"key":"e_1_2_11_86_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2894806"},{"key":"e_1_2_11_87_1","doi-asserted-by":"publisher","DOI":"10.1109\/16.333839"},{"key":"e_1_2_11_88_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2210993"},{"key":"e_1_2_11_89_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2176494"},{"key":"e_1_2_11_90_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2003.809526"},{"key":"e_1_2_11_91_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3047727"},{"key":"e_1_2_11_92_1","doi-asserted-by":"publisher","DOI":"10.1039\/D5NR03453A"},{"key":"e_1_2_11_93_1","doi-asserted-by":"publisher","DOI":"10.1109\/T\u2010ED.1980.19986"},{"key":"e_1_2_11_94_1","doi-asserted-by":"publisher","DOI":"10.1149\/1.3579509"},{"key":"e_1_2_11_95_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1755429"},{"key":"e_1_2_11_96_1","doi-asserted-by":"publisher","DOI":"10.1039\/f19747001807"},{"key":"e_1_2_11_97_1","doi-asserted-by":"publisher","DOI":"10.1021\/cr60130a002"},{"key":"e_1_2_11_98_1","doi-asserted-by":"publisher","DOI":"10.1088\/0034\u20104885\/29\/1\/306"},{"key":"e_1_2_11_99_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2017.10.019"},{"key":"e_1_2_11_100_1","doi-asserted-by":"publisher","DOI":"10.1149\/1.1392611"},{"key":"e_1_2_11_101_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2040708"},{"key":"e_1_2_11_102_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2355542"},{"key":"e_1_2_11_103_1","doi-asserted-by":"publisher","DOI":"10.1149\/1.3579509"},{"key":"e_1_2_11_104_1","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.0c02700"},{"key":"e_1_2_11_105_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2018.12.008"},{"key":"e_1_2_11_106_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.9b03946"},{"key":"e_1_2_11_107_1","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.9b02086"},{"key":"e_1_2_11_108_1","doi-asserted-by":"publisher","DOI":"10.1007\/s12274\u2010019\u20102292\u20100"},{"key":"e_1_2_11_109_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2009.12.016"},{"key":"e_1_2_11_110_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2007.10.003"},{"key":"e_1_2_11_111_1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2009.2020406"},{"key":"e_1_2_11_112_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.870287"},{"key":"e_1_2_11_113_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2014.04.034"},{"key":"e_1_2_11_114_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3075421"},{"key":"e_1_2_11_115_1","doi-asserted-by":"publisher","DOI":"10.1007\/s12633\u2010022\u201002189\u20102"},{"key":"e_1_2_11_116_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11664\u2010023\u201010558\u20109"},{"key":"e_1_2_11_117_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201101493"},{"key":"e_1_2_11_118_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957\u20104484\/22\/40\/405501"},{"key":"e_1_2_11_119_1","doi-asserted-by":"crossref","unstructured":"Q.Hu X.Chen andH.Norstrom \u201cCurrent Gain and Low\u2010Frequency Noise of Symmetric Lateral Bipolar Junction Transistors on SOI \u201d in2018 48th European Solid\u2010State Device Research Conference (ESSDERC) (IEEE 2018) 258\u2013261 https:\/\/doi.org\/10.1109\/ESSDERC.2018.8486918.","DOI":"10.1109\/ESSDERC.2018.8486918"},{"key":"e_1_2_11_120_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2274152"},{"key":"e_1_2_11_121_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598\u2010022\u201022575\u20105"},{"key":"e_1_2_11_122_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2233457"},{"key":"e_1_2_11_123_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2016.08.003"},{"key":"e_1_2_11_124_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2007.04.048"},{"key":"e_1_2_11_125_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep41430"},{"key":"e_1_2_11_126_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4907611"},{"key":"e_1_2_11_127_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0925\u20104005(00)00473\u20101"},{"key":"e_1_2_11_128_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1738946"},{"key":"e_1_2_11_129_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2011.03.099"},{"key":"e_1_2_11_130_1","doi-asserted-by":"crossref","unstructured":"S.ShahandJ. B.Christen \u201cPulse Width Modulation Circuit for ISFET Drift Reset \u201d (IEEE 2013) 1\u20134.","DOI":"10.1109\/ICSENS.2013.6688269"},{"key":"e_1_2_11_131_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3034200"},{"key":"e_1_2_11_132_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0925\u20104005(99)00499\u20102"},{"key":"e_1_2_11_133_1","doi-asserted-by":"publisher","DOI":"10.3390\/s100301679"},{"key":"e_1_2_11_134_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2016.08.065"},{"key":"e_1_2_11_135_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2008.2006471"},{"key":"e_1_2_11_136_1","unstructured":"P.Bergveld Thirty Years of ISFETOLOGY What Happened in the Past 30 Years and What May Happen in the next 30 Years."},{"key":"e_1_2_11_137_1","doi-asserted-by":"publisher","DOI":"10.1049\/el:20071118"},{"key":"e_1_2_11_138_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2022.3141553"},{"key":"e_1_2_11_139_1","unstructured":"Z.Xu \u201cA Lab\u2010on\u2010a\u2010silicon Chip Platform for Profiling Bacterial Metabolism \u201d (PhD dissertation Acta Universitatis Upsaliensis) 2025 https:\/\/urn.kb.se\/resolve?urn=urn:nbn:se:uu:diva\u2010565191."},{"key":"e_1_2_11_140_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.tibs.2020.04.005"},{"key":"e_1_2_11_141_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00604\u2010019\u20103850\u20106"},{"key":"e_1_2_11_142_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41378\u2010022\u201000387\u2010x"},{"key":"e_1_2_11_143_1","doi-asserted-by":"publisher","DOI":"10.1186\/s12951\u2010023\u201002153\u20101"},{"key":"e_1_2_11_144_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl071792z"},{"key":"e_1_2_11_145_1","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.4c03633"},{"key":"e_1_2_11_146_1","doi-asserted-by":"publisher","DOI":"10.3390\/s23156808"},{"key":"e_1_2_11_147_1","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.1c01227"},{"key":"e_1_2_11_148_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2021.113147"},{"key":"e_1_2_11_149_1","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1922172117"},{"key":"e_1_2_11_150_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0925\u20104005(01)00609\u20108"},{"key":"e_1_2_11_151_1","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2793861"},{"key":"e_1_2_11_152_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2022.131580"},{"key":"e_1_2_11_153_1","doi-asserted-by":"publisher","DOI":"10.1039\/C7AY00656J"},{"key":"e_1_2_11_154_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.aeb2880"},{"issue":"11","key":"e_1_2_11_155_1","doi-asserted-by":"crossref","first-page":"1445","DOI":"10.1039\/b605937f","article-title":"Dynamic Single Cell Culture Array","volume":"6","author":"Di Carlo D.","year":"2006","journal-title":"Lab on a Chip"},{"key":"e_1_2_11_156_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598\u2010020\u201060381\u2010z"},{"key":"e_1_2_11_157_1","doi-asserted-by":"publisher","DOI":"10.3390\/microorganisms9112277"},{"key":"e_1_2_11_158_1","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1708558114"},{"key":"e_1_2_11_159_1","doi-asserted-by":"publisher","DOI":"10.1039\/C7AY00656J"},{"key":"e_1_2_11_160_1","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.4c03633"},{"key":"e_1_2_11_161_1","doi-asserted-by":"publisher","DOI":"10.3390\/s19071582"},{"key":"e_1_2_11_162_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10544\u2010018\u20100290\u20108"},{"key":"e_1_2_11_163_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2017.04.107"},{"issue":"7356","key":"e_1_2_11_164_1","doi-asserted-by":"crossref","first-page":"348","DOI":"10.1038\/nature10242","article-title":"An Integrated Semiconductor Device Enabling Non\u2010Optical Genome Sequencing","volume":"475","author":"Rothberg J. M.","year":"2011","journal-title":"Nature"},{"key":"e_1_2_11_165_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2023.133551"},{"key":"e_1_2_11_166_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2024.136498"},{"key":"e_1_2_11_167_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41378\u2010026\u201001316\u2010y"},{"key":"e_1_2_11_168_1","doi-asserted-by":"publisher","DOI":"10.1002\/advs.202205725"},{"key":"e_1_2_11_169_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2025.138701"}],"container-title":["Small Methods"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/smtd.71112","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1002\/smtd.71112","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/smtd.71112","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,10,13]],"date-time":"2026-10-13T07:12:17Z","timestamp":1791875537000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/smtd.71112"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,10,13]]},"references-count":168,"alternative-id":["10.1002\/smtd.71112"],"URL":"https:\/\/doi.org\/10.1002\/smtd.71112","archive":["Portico"],"relation":{},"ISSN":["2366-9608","2366-9608"],"issn-type":[{"value":"2366-9608","type":"print"},{"value":"2366-9608","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,10,13]]},"assertion":[{"value":"2026-05-30","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-10-05","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-10-13","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"e71112"}}