{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T18:19:46Z","timestamp":1778955586545,"version":"3.51.4"},"reference-count":35,"publisher":"Wiley","issue":"9","license":[{"start":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T00:00:00Z","timestamp":1469577600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Adv Elect Materials"],"published-print":{"date-parts":[[2016,9]]},"abstract":"<jats:p>In this paper, the role of electrode architecture (conventional and interdigital), device structure (vertical or planar), and tungsten oxide (WO<jats:sub>3<\/jats:sub>) channel thickness on the electro\u2010optical performances of room temperature sputtered electrochromic transistors (EC\u2010Ts) is reported. A larger number of electro\u2010reducible tungsten sites in thicker WO<jats:sub>3<\/jats:sub> films provide improved optical density and coloration efficiency. However, overall transistor performance is found to suffer in planar EC\u2010Ts with the conventional electrode architecture, where the step to planar interdigital electrodes leaves the devices to be almost insensitive to WO<jats:sub>3<\/jats:sub> thickness. Vertical structures result in improved device properties and stability, given to the shorter distance between gate electrode and semiconductor and to the encapsulation effect provided by such structures. These devices show an On\u2013Off ratio of 5 \u00d7 10<jats:sup>6<\/jats:sup> and a transconductance (<jats:italic>g<\/jats:italic>\n<jats:sub>m<\/jats:sub>) of 3.59 mS, for gate voltages (<jats:italic>V<\/jats:italic>\n<jats:sub>G<\/jats:sub>) between \u22122 and 2 V, which to the authors' knowledge are the best values ever reported for electrochemical transistors. The simple and low\u2010cost processing together with the electrical\/optical performances well supported into a comprehensive analysis of device physics opens doors for a wide range of new applications in display technologies, biosensors, fuel cells, or electrochemical logic circuits.<\/jats:p>","DOI":"10.1002\/aelm.201500414","type":"journal-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T02:14:24Z","timestamp":1469585664000},"source":"Crossref","is-referenced-by-count":29,"title":["Solid State Electrochemical WO<sub>3<\/sub> Transistors with High Current Modulation"],"prefix":"10.1002","volume":"2","author":[{"given":"Paul","family":"Grey","sequence":"first","affiliation":[{"name":"CENIMAT\/I3N Departamento de Ci\u00eancia dos Materiais Faculdade de Ci\u00eancias e Tecnologia FCT Universidade Nova de Lisboa and CEMOP\u2010UNINOVA  Campus da Caparica 2829\u2010516 Caparica Portugal"}]},{"given":"Lu\u00eds","family":"Pereira","sequence":"additional","affiliation":[{"name":"CENIMAT\/I3N Departamento de Ci\u00eancia dos Materiais Faculdade de Ci\u00eancias e Tecnologia FCT Universidade Nova de Lisboa and CEMOP\u2010UNINOVA  Campus da Caparica 2829\u2010516 Caparica Portugal"}]},{"given":"S\u00f3nia","family":"Pereira","sequence":"additional","affiliation":[{"name":"CENIMAT\/I3N Departamento de Ci\u00eancia dos Materiais Faculdade de Ci\u00eancias e Tecnologia FCT Universidade Nova de Lisboa and CEMOP\u2010UNINOVA  Campus da Caparica 2829\u2010516 Caparica Portugal"}]},{"given":"Pedro","family":"Barquinha","sequence":"additional","affiliation":[{"name":"CENIMAT\/I3N Departamento de Ci\u00eancia dos Materiais Faculdade de Ci\u00eancias e Tecnologia FCT Universidade Nova de Lisboa and CEMOP\u2010UNINOVA  Campus da Caparica 2829\u2010516 Caparica Portugal"}]},{"given":"In\u00eas","family":"Cunha","sequence":"additional","affiliation":[{"name":"CENIMAT\/I3N Departamento de Ci\u00eancia dos Materiais Faculdade de Ci\u00eancias e Tecnologia FCT Universidade Nova de Lisboa and CEMOP\u2010UNINOVA  Campus da Caparica 2829\u2010516 Caparica Portugal"}]},{"given":"Rodrigo","family":"Martins","sequence":"additional","affiliation":[{"name":"CENIMAT\/I3N Departamento de Ci\u00eancia dos Materiais Faculdade de Ci\u00eancias e Tecnologia FCT Universidade Nova de Lisboa and CEMOP\u2010UNINOVA  Campus da Caparica 2829\u2010516 Caparica Portugal"}]},{"given":"Elvira","family":"Fortunato","sequence":"additional","affiliation":[{"name":"CENIMAT\/I3N Departamento de Ci\u00eancia dos Materiais Faculdade de Ci\u00eancias e Tecnologia FCT Universidade Nova de Lisboa and CEMOP\u2010UNINOVA  Campus da Caparica 2829\u2010516 Caparica Portugal"}]}],"member":"311","published-online":{"date-parts":[[2016,7,27]]},"reference":[{"key":"e_1_2_8_1_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201202790"},{"key":"e_1_2_8_2_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201300211"},{"key":"e_1_2_8_3_1","doi-asserted-by":"publisher","DOI":"10.1021\/jp064574n"},{"key":"e_1_2_8_3_2","doi-asserted-by":"publisher","DOI":"10.1021\/ja058091t"},{"key":"e_1_2_8_4_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3518075"},{"key":"e_1_2_8_5_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3058694"},{"key":"e_1_2_8_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200700419"},{"key":"e_1_2_8_6_2","doi-asserted-by":"publisher","DOI":"10.1007\/s00216-005-3390-2"},{"key":"e_1_2_8_6_3","doi-asserted-by":"publisher","DOI":"10.1039\/c2jm15716k"},{"key":"e_1_2_8_7_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201101757"},{"key":"e_1_2_8_8_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200802681"},{"key":"e_1_2_8_9_1","doi-asserted-by":"publisher","DOI":"10.1021\/cr60130a002"},{"key":"e_1_2_8_10_1","doi-asserted-by":"publisher","DOI":"10.1021\/ja0749845"},{"key":"e_1_2_8_11_1","doi-asserted-by":"publisher","DOI":"10.1039\/c2jm31217d"},{"key":"e_1_2_8_12_1","first-page":"7","volume":"1","author":"Barquinha P.","year":"2015","journal-title":"Adv. Elect. Mater."},{"key":"e_1_2_8_13_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0927-0248(99)00088-4"},{"key":"e_1_2_8_14_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0254-0584(01)00575-2"},{"key":"e_1_2_8_14_2","doi-asserted-by":"publisher","DOI":"10.1002\/9783527615377"},{"key":"e_1_2_8_15_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0013-4686(99)00016-X"},{"key":"e_1_2_8_16_1","doi-asserted-by":"publisher","DOI":"10.1364\/AO.8.S1.000192"},{"key":"e_1_2_8_16_2","doi-asserted-by":"publisher","DOI":"10.1080\/14786437308227562"},{"key":"e_1_2_8_17_1","doi-asserted-by":"publisher","DOI":"10.1039\/B612174H"},{"key":"e_1_2_8_17_2","doi-asserted-by":"publisher","DOI":"10.1039\/c0jm00604a"},{"key":"e_1_2_8_17_3","volume-title":"Oxide\u2010Based Materials and Devices Vi","author":"Rougier A.","year":"2015"},{"key":"e_1_2_8_18_1","doi-asserted-by":"publisher","DOI":"10.1021\/j100287a030"},{"key":"e_1_2_8_19_1","doi-asserted-by":"publisher","DOI":"10.1021\/ja070615x"},{"key":"e_1_2_8_19_2","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-008-5026-9"},{"key":"e_1_2_8_20_1","doi-asserted-by":"publisher","DOI":"10.1016\/0167-2738(96)00222-6"},{"key":"e_1_2_8_21_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.343507"},{"key":"e_1_2_8_22_1","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201002477"},{"key":"e_1_2_8_23_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat4368"},{"key":"e_1_2_8_24_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201103228"},{"key":"e_1_2_8_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2013.2278015"},{"key":"e_1_2_8_26_1","doi-asserted-by":"publisher","DOI":"10.1021\/am506814t"},{"key":"e_1_2_8_27_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.electacta.2010.10.018"}],"container-title":["Advanced Electronic Materials"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Faelm.201500414","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Faelm.201500414","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/aelm.201500414","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,6]],"date-time":"2025-10-06T13:00:59Z","timestamp":1759755659000},"score":1,"resource":{"primary":{"URL":"https:\/\/advanced.onlinelibrary.wiley.com\/doi\/10.1002\/aelm.201500414"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7,27]]},"references-count":35,"journal-issue":{"issue":"9","published-print":{"date-parts":[[2016,9]]}},"alternative-id":["10.1002\/aelm.201500414"],"URL":"https:\/\/doi.org\/10.1002\/aelm.201500414","archive":["Portico"],"relation":{},"ISSN":["2199-160X","2199-160X"],"issn-type":[{"value":"2199-160X","type":"print"},{"value":"2199-160X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,7,27]]},"article-number":"1500414"}}