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However, some of the remaining limitations need to be surpassed without compromising the device electronic performance and operational stability. The printing of a highly stable ultra\u2010thin high\u2010\u03ba aluminum\u2010oxide dielectric with a high\u2010throughput (50 m min<jats:sup>\u22121<\/jats:sup>) flexographic printing is accomplished while simultaneously demonstrating low\u2010temperature processing (\u2264200 \u00b0C). Thermal annealing is combined with low\u2010wavelength far\u2010ultraviolet exposure and the electrical, chemical, and morphological properties of the printed dielectric films are studied. The high\u2010\u03ba dielectric exhibits a very low leakage\u2010current density (10<jats:sup>\u221210<\/jats:sup> A cm<jats:sup>\u22122<\/jats:sup>) at 1 MV cm<jats:sup>\u22121<\/jats:sup>, a breakdown field higher than 1.75 MV cm<jats:sup>\u22121<\/jats:sup>, and a dielectric constant of 8.2 (at 1 Hz frequency). Printed indium oxide transistors are fabricated using the optimized dielectric and they achieve a mobility up to 2.83 \u00b1 0.59 cm<jats:sup>2<\/jats:sup> V<jats:sup>\u22121<\/jats:sup> s<jats:sup>\u22121<\/jats:sup>, a subthreshold slope &lt;80 mV dec<jats:sup>\u22121<\/jats:sup>, and a current ON\/OFF ratio &gt;10<jats:sup>6<\/jats:sup>. The flexible devices reveal enhanced operational stability with a negligible shift in the electrical parameters after ageing, bias, and bending stresses. The present work lifts printed oxide thin film transistors a step closer to the flexible applications of future electronics.<\/jats:p>","DOI":"10.1002\/aelm.201901071","type":"journal-article","created":{"date-parts":[[2020,1,29]],"date-time":"2020-01-29T04:44:27Z","timestamp":1580273067000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":75,"title":["Printed, Highly Stable Metal Oxide Thin\u2010Film Transistors with Ultra\u2010Thin High\u2010\u03ba Oxide Dielectric"],"prefix":"10.1002","volume":"6","author":[{"given":"Emanuel","family":"Carlos","sequence":"first","affiliation":[{"name":"CENIMAT\/i3N Departamento de Ci\u00eancia dos Materiais Faculdade de Ci\u00eancias e Tecnologia (FCT) Universidade NOVA de Lisboa (UNL) and CEMOP\/UNINOVA  2829\u2010516 Caparica Portugal"},{"name":"VTT Technical Research Centre of Finland Ltd.  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