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Samples were analysed by EDX, XRD, Raman, XPS and SEM. The analyses confirmed the deposition of niobium, even if no separated phase was formed; the morphological structure of the films was affected by the dopant presence. The thin films showed thermochromic behaviour, with a marked change in optical properties above and below the switching temperature. (\u00a9 Wiley\u2010VCH Verlag GmbH &amp; Co. 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