{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,26]],"date-time":"2023-10-26T05:40:42Z","timestamp":1698298842355},"reference-count":3,"publisher":"Wiley","issue":"11","license":[{"start":{"date-parts":[[2007,1,22]],"date-time":"2007-01-22T00:00:00Z","timestamp":1169424000000},"content-version":"vor","delay-in-days":4887,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Micro &amp; Optical Tech Letters"],"published-print":{"date-parts":[[1993,9,5]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Under the disturbing influence of photoelastic, piezoelectric, or electrooptic effects, anisotropic media have their natural behavior modified, the modification being described by a change in both the dimensions and orientation of the index ellipsoid. A first\u2010order perturbation method useful for determining the perturbed index ellipsoid based on the unperturbed one is developed. Results concerning the new principal axes and principal refractive indices of the perturbed optical medium are presented. \u00a9 1993 John Wiley &amp; Sons, Inc.<\/jats:p>","DOI":"10.1002\/mop.4650061114","type":"journal-article","created":{"date-parts":[[2007,7,10]],"date-time":"2007-07-10T00:03:25Z","timestamp":1184025805000},"page":"657-660","source":"Crossref","is-referenced-by-count":2,"title":["A perturbation approach to the analysis of index ellipsoid deformations in biaxial and uniaxial media"],"prefix":"10.1002","volume":"6","author":[{"given":"J. A. Brandao","family":"Faria","sequence":"first","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2007,1,22]]},"reference":[{"key":"e_1_2_1_2_2","volume-title":"Optical Waves in Crystals","author":"Yariv A.","year":"1984"},{"key":"e_1_2_1_3_2","volume-title":"Principles of Optics","author":"Born M.","year":"1987"},{"key":"e_1_2_1_4_2","volume-title":"Modern Optics","author":"Guenther R.","year":"1990"}],"container-title":["Microwave and Optical Technology Letters"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fmop.4650061114","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/mop.4650061114","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,25]],"date-time":"2023-10-25T14:47:21Z","timestamp":1698245241000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/mop.4650061114"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,9,5]]},"references-count":3,"journal-issue":{"issue":"11","published-print":{"date-parts":[[1993,9,5]]}},"alternative-id":["10.1002\/mop.4650061114"],"URL":"https:\/\/doi.org\/10.1002\/mop.4650061114","archive":["Portico"],"relation":{},"ISSN":["0895-2477","1098-2760"],"issn-type":[{"value":"0895-2477","type":"print"},{"value":"1098-2760","type":"electronic"}],"subject":[],"published":{"date-parts":[[1993,9,5]]}}}