{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T18:04:37Z","timestamp":1759341877154},"reference-count":9,"publisher":"Wiley","issue":"S1","license":[{"start":{"date-parts":[[2009,5,26]],"date-time":"2009-05-26T00:00:00Z","timestamp":1243296000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Plasma Processes &amp;amp; Polymers"],"published-print":{"date-parts":[[2009,6]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Coatings prepared by reactive magnetron sputtering of approximately equal thermal transport properties but differing coating thicknesses are analyzed by means of non\u2010contact non\u2010destructive <jats:italic>modulated IR radiometry<\/jats:italic>. For the quantitative interpretation, the measured thermal wave signals are calibrated, using the signals measured for a homogenous opaque solid of smooth surface. The <jats:italic>relative minima<\/jats:italic> of the inverse calibrated phase lag signals are interpreted with respect to the effective thermal transport properties and to the coating thickness using an inverse solution of the two\u2010layer thermal wave problem. Based on measurements of various coatings, the limitations of this thermal wave method and the errors of measurement for the coating thickness are discussed by comparing with microscopic measurements.<\/jats:p>","DOI":"10.1002\/ppap.200931503","type":"journal-article","created":{"date-parts":[[2009,5,26]],"date-time":"2009-05-26T15:41:43Z","timestamp":1243352503000},"source":"Crossref","is-referenced-by-count":9,"title":["Thickness Control of Coatings by Means of Modulated IR Radiometry"],"prefix":"10.1002","volume":"6","author":[{"given":"Francisco","family":"Macedo","sequence":"first","affiliation":[]},{"given":"Filipe","family":"Vaz","sequence":"additional","affiliation":[]},{"given":"Ana C.","family":"Fernandes","sequence":"additional","affiliation":[]},{"given":"Jean L. Nzodoum","family":"Fotsing","sequence":"additional","affiliation":[]},{"given":"Juergen","family":"Gibkes","sequence":"additional","affiliation":[]},{"given":"Josef","family":"Pelzl","sequence":"additional","affiliation":[]},{"given":"Bruno K.","family":"Bein","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2009,5,26]]},"reference":[{"doi-asserted-by":"publisher","key":"e_1_2_6_1_2","DOI":"10.1524\/teme.1998.65.11.396"},{"doi-asserted-by":"publisher","key":"e_1_2_6_2_2","DOI":"10.1063\/1.2058180"},{"doi-asserted-by":"crossref","unstructured":"F.Macedo P.Carvalho F.Vaz J.Gibkes B. K.Bein J.Pelzl The role of modulated IR radiometry measurements in the characterization of Zr\u2013O\u2013N thin films inProceedings of PSE2008.","key":"e_1_2_6_3_2","DOI":"10.1002\/ppap.200931802"},{"doi-asserted-by":"publisher","key":"e_1_2_6_4_2","DOI":"10.1016\/0017-9310(81)90157-5"},{"unstructured":"CALOTEST\u00ae of CSM Instruments.","key":"e_1_2_6_5_2"},{"doi-asserted-by":"publisher","key":"e_1_2_6_6_2","DOI":"10.1016\/j.vacuum.2008.03.066"},{"doi-asserted-by":"publisher","key":"e_1_2_6_7_2","DOI":"10.1016\/S0169-4332(02)00257-X"},{"doi-asserted-by":"publisher","key":"e_1_2_6_8_2","DOI":"10.1068\/htec49"},{"key":"e_1_2_6_9_2","doi-asserted-by":"crossref","first-page":"119","DOI":"10.13182\/FST87-A25056","volume":"12","author":"Nicolai A.","year":"1987","journal-title":"Fusion Technol."}],"container-title":["Plasma Processes and Polymers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fppap.200931503","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/ppap.200931503","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,5]],"date-time":"2024-08-05T11:06:57Z","timestamp":1722856017000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/ppap.200931503"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,5,26]]},"references-count":9,"journal-issue":{"issue":"S1","published-print":{"date-parts":[[2009,6]]}},"alternative-id":["10.1002\/ppap.200931503"],"URL":"https:\/\/doi.org\/10.1002\/ppap.200931503","archive":["Portico"],"relation":{},"ISSN":["1612-8850","1612-8869"],"issn-type":[{"type":"print","value":"1612-8850"},{"type":"electronic","value":"1612-8869"}],"subject":[],"published":{"date-parts":[[2009,5,26]]}}}