{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T07:20:52Z","timestamp":1698823252349},"reference-count":24,"publisher":"Wiley","issue":"6","license":[{"start":{"date-parts":[[2007,5,18]],"date-time":"2007-05-18T00:00:00Z","timestamp":1179446400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Physica Status Solidi (a)"],"published-print":{"date-parts":[[2007,6]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Erbium\u2010doped low\u2010dimensional Si films with different microstructures were deposited by reactive magnetron sputtering on glass substrates by varying the hydrogen flow rate during deposition. Amorphous, micro\u2010 and nanocrystalline samples, consisting of Si nanocrystalls embedded in silicon\u2010based matrices with different structures, were achieved with optical properties in the visible and IR depending on nanocrystalline fraction and matrix structure and chemical composition. Structural characterization was performed by X\u2010ray diffraction in the grazing incidence geometry and Raman spectroscopy. The chemical composition was studied using RBS\/ERD techniques. Spectroscopic ellipsometry was combined with the previous techniques to further resolve the film microstructure and composition. In particular, the distribution along the film thickness of the volume fractions of nanocrystalline\/amorphous silicon and SiO<jats:italic><jats:sub>x<\/jats:sub><\/jats:italic> phases has been obtained.<\/jats:p><jats:p>In this contribution we discuss visible and infrared photoluminescence as a function of sample microstructure and of the oxygen\/hydrogen concentration ratio present in the matrix. (\u00a9 2007 WILEY\u2010VCH Verlag GmbH &amp; Co. KGaA, Weinheim)<\/jats:p>","DOI":"10.1002\/pssa.200675350","type":"journal-article","created":{"date-parts":[[2007,5,19]],"date-time":"2007-05-19T08:14:21Z","timestamp":1179562461000},"page":"1769-1774","source":"Crossref","is-referenced-by-count":0,"title":["Visible and infrared photoluminescence from erbium\u2010doped silicon nanocrystals produced by rf sputtering"],"prefix":"10.1002","volume":"204","author":[{"given":"M. F.","family":"Cerqueira","sequence":"first","affiliation":[]},{"given":"M.","family":"Losurdo","sequence":"additional","affiliation":[]},{"given":"T.","family":"Monteiro","sequence":"additional","affiliation":[]},{"given":"M.","family":"Stepikova","sequence":"additional","affiliation":[]},{"given":"M. J.","family":"Soares","sequence":"additional","affiliation":[]},{"given":"M.","family":"Peres","sequence":"additional","affiliation":[]},{"given":"P.","family":"Alpuim","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2007,5,31]]},"reference":[{"key":"e_1_2_1_2_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.119624"},{"key":"e_1_2_1_3_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.126334"},{"key":"e_1_2_1_4_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.125539"},{"key":"e_1_2_1_5_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.1305930"},{"key":"e_1_2_1_6_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.optmat.2005.09.035"},{"key":"e_1_2_1_7_2","doi-asserted-by":"publisher","DOI":"10.1016\/0042-207X(95)00158-1"},{"key":"e_1_2_1_8_2","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1098(86)90513-2"},{"key":"e_1_2_1_9_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.355808"},{"key":"e_1_2_1_10_2","first-page":"636","volume":"24","author":"Bruggeman D. 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