{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,11]],"date-time":"2025-11-11T12:49:29Z","timestamp":1762865369685},"reference-count":14,"publisher":"Wiley","issue":"4","license":[{"start":{"date-parts":[[2008,3,18]],"date-time":"2008-03-18T00:00:00Z","timestamp":1205798400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Physica Status Solidi (a)"],"published-print":{"date-parts":[[2008,4]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Co\u2010doped TiO<jats:sub>2<\/jats:sub> films were characterized by spectroscopic ellipsometry to determine their thickness, deposition rate and optical properties as function of substrate temperature and background gas composition. To fit the data we used a combination of a single Tauc\u2013Lorentz oscillator with the Drude free electron model to take in account the free electrons present in the film. The Co doping and the addition of H<jats:sub>2<\/jats:sub> to the gas phase during film growth cause the formation of a titanium oxide which containsfree electrons that absorb the energy of the red part of the spectrum, causing <jats:italic>k<\/jats:italic> to increase. The <jats:italic>n<\/jats:italic> of the films at 1.5 eV is about 2.3 eV. The fittings also show that the <jats:italic>n<\/jats:italic> of films decreases and <jats:italic>k<\/jats:italic> increases at the surface. This can be related to a segregation of Co to the surface, which in some cases, of high substrate temperature and high H<jats:sub>2<\/jats:sub> flow during deposition, can lead to an even higher concentration of free electrons at the surface. (\u00a9 2008 WILEY\u2010VCH Verlag GmbH &amp; Co. KGaA, Weinheim)<\/jats:p>","DOI":"10.1002\/pssa.200777843","type":"journal-article","created":{"date-parts":[[2008,3,18]],"date-time":"2008-03-18T14:54:34Z","timestamp":1205852074000},"page":"880-883","source":"Crossref","is-referenced-by-count":8,"title":["Spectroscopic ellipsometry study of Co\u2010doped TiO<sub>2<\/sub> films"],"prefix":"10.1002","volume":"205","author":[{"given":"H.","family":"\u00c1guas","sequence":"first","affiliation":[]},{"given":"N.","family":"Popovici","sequence":"additional","affiliation":[]},{"given":"L.","family":"Pereira","sequence":"additional","affiliation":[]},{"given":"O.","family":"Conde","sequence":"additional","affiliation":[]},{"given":"W. R.","family":"Branford","sequence":"additional","affiliation":[]},{"given":"L. 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